Quality Control Device and Quality Control Method

Patent metadata

Field	Value
Publication number	US-2019317476-A1
Application number	US-201716466871-A
Country	US
Kind code	A1
Filing date	Nov 8, 2017
Priority date	Dec 7, 2016
Publication date	Oct 17, 2019
Grant date	—

Abstract

In order to realize stable quality control, provided is a quality control device ( 1 ) having an input device which receives data such as an operation condition of each device ( 21 ) to ( 26 ) in a production system ( 20 ) for producing a product; a calculation unit which assigns a value of the operation condition to a correlation formula calculated in advance and calculates a value derived from the correlation formula; and a determination unit which performs good or bad determination on a quality of a workpiece in each process, on the basis of a result calculated by the calculation unit. Further, when “bad” is determined as a result of the good or bad determination, the quality control device ( 1 ) calculates an appropriate value of the operation condition and sets the value to each device ( 21 ) to ( 26 ).

First claim

1 . A quality control device, comprising:
an input unit which receives an operation condition of each device for producing a product; a calculation unit which assigns a value of the operation condition to a correlation formula set in advance and calculates a value derived from the correlation formula; and an output unit which outputs a result of performing good or bad determination on a quality of a process in the device for producing the product, on the basis of a result calculated by the calculation unit.

2 . The quality control device according to claim 1 , further comprising:
a condition change unit which changes the value of the operation condition so that a value of the quality determined as a defect becomes an appropriate quality value, when the defect of the quality is determined as the result of the good or bad determination.

3 . The quality control device according to claim 2 , wherein
the condition change unit, when the value of the operation condition is changed in each correlation formula, searches for a value having the least influence in the other correlation formulas.

4 . The quality control device according to claim 2 , wherein
a list of conditions not included in the operation condition is stored in a storage device, and the quality control device further comprises a display processing unit which displays the list on a display unit, when the defect of the quality is determined as the result of the good or bad determination even though the value of the operation condition is changed.

5 . The quality control device according to claim 2 , further comprising:
a cause identification unit which identifies the operation condition to be a cause of the determination of the defect, when the defect of the quality is determined as the result of the good or bad determination even though the value of the operation condition is changed; and a display processing unit which displays the cause identified by the cause identification unit on a display unit.

6 . The quality control device according to claim 1 , wherein
the value of the operation condition includes a value acquired from each device.

7 . The quality control device according to claim 1 , wherein
the value of the operation condition is information obtained in a test operation of each device.

8 . The quality control device according to claim 1 , further comprising:
a correlation formula update unit which updates the correlation formula, on the basis of a newly acquired value.

9 . The quality control device according to claim 1 , wherein
the input unit inputs the value of the operation condition used in the correlation formula.

10 . The quality control device according to claim 1 , further comprising:
a condition change unit which changes the value of the operation condition so that a value determined as a defect as the result of the good or bad determination becomes an appropriate value, during a non-operation of each device for producing the product.

11 . The quality control device according to claim 1 , wherein
the correlation formula predicts a quality of a process corresponding to the correlation formula by using the value of the operation condition in a process before the process corresponding to the correlation formula.

12 . A quality control method, comprising
causing a quality control device which controls a quality of a production in a process of producing the product to: receive an operation condition of each device for producing the product via an input unit; assign a value of the operation condition to a correlation formula set in advance; calculate a value derived from the correlation formula; and output a result of performing good or bad determination on a quality of a process in the device for producing the product, on the basis of a result of the calculation.

Assignees

• Hitachi Ltd

Inventors

• Miyagi Masanori
• Takamori Yoshiyuki
• Park Seunghwan

Classifications

• G05B2219/32194

  Quality prediction · CPC title

• G05B2219/32179

  Quality control, monitor production tool with multiple sensors · CPC title

• H05K1/0269

  for visual or optical inspection · CPC title

• H05K2203/163

  Monitoring a manufacturing process · CPC title

• G05B19/418 Primary

  Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] · CPC title