Method of achieving robustness of the device in short circuit condition by adjusting the current limit threshold based repetitive fault condition

Patent metadata

Field	Value
Publication number	US-2019199341-A1
Application number	US-201916291747-A
Country	US
Kind code	A1
Filing date	Mar 4, 2019
Priority date	Jul 31, 2015
Publication date	Jun 27, 2019
Grant date	—

Abstract

A circuit protective system. The system includes an output controlling enablement of a transistor and an input sensing an operational parameter associated with the transistor. The system also includes detection circuitry providing an event fault indicator if the operational parameter violates a condition. The system also includes protective circuitry disabling the transistor in response to the event fault indicator and subsequently selectively applying an enabling bias to the transistor; the enabling bias is selected from at least two different bias levels and in response to a number of event fault indications from the detection circuitry.

First claim

We claim:

1 . A process of operating a state machine controlling a power transistor, the power transistor providing current on a source and drain path to a load, and the power transistor having a gate, comprising:
(a) entering a first state upon receiving an active reset signal, including de-asserting the transistor gate; (b) moving from the first state to a second state upon receiving an inactive reset signal, including enabling fault detection circuity; (c) moving from the second state to a third state upon receiving an active enable signal, including enabling digital core circuitry coupled to the transistor, starting a charge pump, and starting a first timer; (d) moving from the third state to a fourth state upon the first timer elapsing, including asserting the transistor gate to turn on the transistor in a nominal mode to supply specified current to the load, and starting a second timer; (e) moving from the fourth state to a fifth state in response to receiving an active fault signal from the fault detection circuitry, including de-asserting the transistor gate, and starting a third timer; (f) moving from the fifth state to a sixth state in response to the third timer elapsing and receiving an inactive fault signal from the fault detection circuitry, including maintaining de-asserting the transistor gate and starting a fourth timer; (g) moving from the sixth state to the fourth state in response to the fourth timer elapsing, including asserting the transistor gate to turn on the transistor in a nominal mode to supply specified current to the load, and starting the second timer.

2 . The process of claim 1 including moving from the fourth state to a seventh state in response to the second timer elapsing and in response to receiving an inactive fault signal from the fault detection circuitry, including maintaining asserting the transistor gate.

3 . The process of claim 2 including moving to the second state from any one of the third state, the fourth state, or the seventh state in response to receiving an inactive enable signal.

4 . The process of claim 1 including moving from the fourth state to an eighth state in response to receiving an active temperature fault signal from the fault detection circuitry, including starting a fifth timer and maintaining asserting the transistor gate.

5 . The process of claim 3 including moving from the eighth state to the fourth state in response to the fifth timer elapsing and receiving an inactive temperature fault signal.

6 . The process of claim 3 including moving from the eighth state to the fifth state in response to the fifth timer elapsing and receiving an active temperature fault signal.

7 . The process of claim 1 including moving from the sixth state to the fifth state in response to receiving an active fault signal.

8 . The process of claim 1 including running the first timer for a period of 10 microseconds.

9 . The process of claim 1 including running the second timer for a period of 100 microseconds.

10 . The process of claim 1 including running the third timer for a period of 2 milliseconds.

11 . The process of claim 1 including running the fourth timer for a period of 4 microseconds.

12 . The process of claim 4 including running the fifth timer for a period of 4 microseconds.

13 . The process of claim 1 including asserting the transistor gate to turn on the transistor in a foldback mode to supply reduced current to the load upon receiving plural active fault signals.

14 . The process of claim 1 including asserting the transistor gate to turn on the transistor in a foldback mode to supply reduced current to the load upon receiving three active fault signals.

15 . A process of controlling a power transistor with states of a state machine, the power transistor having a source, a drain, and a gate and providing current through the source and drain to a load, comprising:
(a) entering first states to enable fault detection circuity, to enable core circuitry coupled to the transistor, to reset a counter, and to assert the transistor gate to turn on the transistor in a nominal mode suppling a specified current to the load; (b) moving to a second state to de-assert the transistor gate upon receiving an active fault signal from the fault detection circuitry including incrementing the counter; (c) moving to a third state to re-assert the transistor gate in the normal mode upon the counter having a number less than a certain number; and (D) moving to a fourth state to assert the transistor gate in a foldback mode suppling current to the load at a level less than in the normal mode upon the counter having a number equal to the certain number.

16 . The process of claim 15 in which moving to a fourth state includes moving to the fourth state upon the counter having a number equal to the number three.

17 . The process of claim 15 in which moving to a fourth state includes moving to the fourth state upon the counter having a number equal to the certain number and upon a timer elapsing.

18 . The process of claim 15 in which moving to a fourth state includes moving to a fourth state to assert the transistor gate in a foldback mode suppling current to the load at a level half of the current supplied in the normal mode.

Assignees

• Texas Instruments Inc

Inventors

• Rahman Md Abidur
• Quirk Adam
• Nortman Stephen
• Aras Sualp

Classifications

• H02H3/00

  Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection (specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems H02H7/00; systems for change-over to standby supply H02J9/00 ){; integrated protection (for motors H02H7/0822)} · CPC title

• H03K2017/0806

  against excessive temperature · CPC title

• H02H3/06

  with automatic reconnection · CPC title

• H02H5/041

  additionally responsive to excess current (H02H5/048 takes precedence) · CPC title

• H03K17/0822 Primary

  in field-effect transistor switches · CPC title