Solid-state imaging device and imaging system

Patent metadata

Field	Value
Publication number	US-2019104264-A1
Application number	US-201816142815-A
Country	US
Kind code	A1
Filing date	Sep 26, 2018
Priority date	Oct 3, 2017
Publication date	Apr 4, 2019
Grant date	—

Abstract

A solid-state imaging device includes a pixel array unit in which pixels each including a photoelectric converter are arranged over rows and columns, output lines each connected to the pixels arranged on a corresponding column, and column circuits each connected to a corresponding output line. Each column circuit is configured to operate in a first mode and a second mode, in the first mode, the common circuit amplifies a single signal based on charges generated in the photoelectric converter of one pixel connected to the corresponding output line at a common gain to output a first pixel signal and a second pixel signal, and in the second mode, the column circuit amplifies the single signal at a first gain to output a first pixel signal and amplifies the single signal at a second gain lower than the first gain to output a second pixel signal.

First claim

What is claimed is:

1 . A solid-state imaging device comprising:
a pixel array unit in which a plurality of pixels each including a photoelectric converter are arranged over a plurality of rows and a plurality of columns; a plurality of output lines each connected to the pixels arranged on a corresponding column of the plurality of columns; and a plurality of column circuits each connected to a corresponding output line of the plurality of output lines, wherein each of the plurality of column circuits is configured to operate in a first mode and a second mode, in the first mode, the column circuit amplifies a single signal based on charges generated in the photoelectric converter of at least one pixel connected to the corresponding output line at a common gain to output a first pixel signal and a second pixel signal, and in the second mode, the column circuit amplifies the single signal at a first gain to output a first pixel signal and amplifies the single signal at a second gain that is lower than the first gain to output a second pixel signal.

2 . The solid-state imaging device according to claim 1 ,
wherein each of the column circuits includes a variable amplifier circuit whose amplification factor is variable, and wherein each of the column circuits amplifies the signal at the first gain or the second gain by switching the amplification factor of the variable amplifier circuit.

3 . The solid-state imaging device according to claim 2 ,
wherein each of the column circuits further includes a comparator unit that compares a level of an output signal of the variable amplifier circuit with a predetermined threshold level, and wherein each of the column circuits,
when a level of the signal amplified at the first gain by the variable amplifier circuit is lower than the threshold level, amplifies the signal to be output as the second pixel signal at the first gain, and
when a level of the signal amplified at the first gain by the variable amplifier circuit is higher than the threshold level, amplifies the signal to be output as the second pixel signal at the second gain.

4 . The solid-state imaging device according to claim 2 ,
wherein each of the column circuits further includes
an AD converter circuit that converts an analog signal to a digital signal; and
a comparator unit that compares a digital value of the signal output from the AD converter circuit with a predetermined threshold value, and
wherein each of the column circuits,
when a digital value of the signal amplified at the first gain by the variable amplifier circuit is lower than the threshold value, amplifies the signal to be output as the second pixel signal at the first gain by the variable amplifier circuit, and
when a digital value of the signal amplified at the first gain by the variable amplifier circuit is higher than the threshold value, amplifies the signal to be output as the second pixel signal at the second gain by the variable amplifier circuit.

5 . The solid-state imaging device according to claim 4 , wherein the comparator unit compares a value of a part of a plurality of bits of a digital value of the signal with a value of the part of a plurality of bits of the threshold value.

6 . The solid-state imaging device according to claim 1 ,
wherein each of the plurality of column circuits includes an AD converter circuit that converts an analog signal to a digital signal, and wherein each of the column circuits amplifies the signal at the first gain or the second gain by switching an AD conversion gain of the AD converter circuit.

7 . The solid-state imaging device according to claim 6 ,
wherein each of the column circuits further includes a comparator unit that compares a level of the signal with a predetermined threshold level, and wherein each of the column circuits,
when a level of the signal is lower than the threshold level, sets the AD conversion gain to the first gain, and
when a level of the signal is higher than the threshold level, sets the AD conversion gain to the second gain.

8 . The solid-state imaging device according to claim 1 , wherein each of the column circuits includes
a first readout circuit that amplifies the signal to be output as the first pixel signal at the first gain in the first mode and the second mode; and a second readout circuit that amplifies the signal to be output as the second pixel signal at the first gain in the first mode and amplifies the signal at the second gain in the second mode.

9 . The solid-state imaging device according to claim 1 , wherein each of the column circuits outputs the first pixel signal and the second pixel signal in a time division manner.

10 . The solid-state imaging device according to claim 9 , wherein each of the column circuits outputs the second pixel signal after outputting the first pixel signal when operating in the second mode.

11 . The solid-state imaging device according to claim 1 , wherein each of the column circuits outputs a mode identification signal indicating which of the first mode and the second mode has been applied to operation.

12 . The solid-state imaging device according to claim 1 , wherein each of the column circuits switches the first mode and the second mode in response to an external control signal.

13 . The solid-state imaging device according to claim 1 , wherein each of the column circuits is further configured such that a signal based on a reset voltage of the pixel is amplified at the first gain to output a first reset signal and is amplified at the second gain to output a second reset signal.

14 . The solid-state imaging device according to claim 13 , further comprising a signal processing unit that processes a signal output from each of the column circuits,
wherein the signal processing unit is configured to,
when each of the column circuits operates in the first mode, output a difference between the first pixel signal and the first reset signal as a first output signal and a difference between the second pixel signal and the first reset signal as a second output signal, and
when each of the column circuits operates in the second mode, output a difference between the first pixel signal and the first reset signal as a first output signal and output a second output signal obtained by multiplying a difference between the second pixel signal and the first reset signal by a ratio of the second gain to the first gain.

15 . The solid-state imaging device according to claim 14 ,
wherein the signal processing unit,
when each of the column circuits operates in the first mode, generates an image signal by applying an averaging process to the first output signal and the second output signal, and
when each of the column circuits operates in the second mode, sets the second output signal as an image signal.

16 . The solid-state imaging device according to claim 15 , wherein, when each of the column circuits operates in the first mode, the signal processing unit generates the image signal by weighting and averaging the first output signal and the second output signal such that weighting to the second output signal is larger as signal levels of the first output signal and the second output signal are closer to a predetermined threshold level at which the first mode and the second mode are switched.

17 . An imaging system comprising:
the solid-state imaging device according to claim 1 ; and a signal processing unit that processes a signal output from the solid-state imaging device, wherein the signal processing unit is configured to,
wh

Assignees

• Canon Kk

Inventors

• Totsuka Hirofumi

Classifications

• G06T7/55 Primary

  from multiple images · CPC title

• H04N25/40

  Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled · CPC title

• H04N5/378

  Electricity · mapped topic

• G06T5/50

  using two or more images, e.g. averaging or subtraction · CPC title

• G06T2207/30252

  Vehicle exterior; Vicinity of vehicle · CPC title