Io and pvt calibration using bulk input technique
US-2015333753-A1 · Nov 19, 2015 · US
US2018366458A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2018366458-A1 |
| Application number | US-201816115243-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 28, 2018 |
| Priority date | Sep 4, 2015 |
| Publication date | Dec 20, 2018 |
| Grant date | — |
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A semiconductor system includes a first semiconductor device suitable for outputting an external command and a termination control signal and being inputted with a data signal; and a second semiconductor device suitable for generating a termination enable signal in response to the external command and the termination control signal, generating a pull-up signal in response to the termination enable signal, and generating a pull-down signal in response to the termination enable signal and a test mode signal.
Opening claim text (preview).
What is claimed is: 1 . A semiconductor device comprising: a pull-up signal generation unit suitable for generating a pull-up signal in response to a termination enable signal and a pre-pull-up signal; and a pull-down signal generation unit suitable for generating a pull-down signal in response to a test mode signal, the termination enable signal, and a pre-pull-down signal. 2 . The semiconductor device according to claim 1 , wherein the termination enable signal is enabled if a termination operation is performed. 3 . The semiconductor device according to claim 1 , wherein the pull-up signal generation unit generates an enabled pull-up signal if the termination enable signal is enabled. 4 . The semiconductor device according to claim 1 , wherein the signal levels of the pre-pull-up signal and the pre-pull-down signal are determined according to internal data outputted from a memory cell array in a read operation. 5 . The semiconductor device according to claim 1 , further comprising: a pull-up driver suitable for driving a data signal with a first power supply voltage in response to the pull-up signal; and a pull-down driver suitable for driving the data signal with a second power supply voltage in response to the pull-down signal. 6 . The semiconductor device according to claim 5 , wherein the pull-up driver comprises: a MOS transistor coupled between the first power supply voltage and a first node, the MOS transistor being suitable for being turned on in response to the pull-up signal; and a resistor element coupled between the first node and a second node through which the data signal is outputted.
Analysis of signal quality (G01R31/31901 takes precedence; measuring frequencies or analysing frequency spectra per se G01R23/00; measuring non-linear distortion per se G01R23/20) · CPC title
Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer · CPC title
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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