Temperature sensor

Patent metadata

Field	Value
Publication number	US-2018328792-A1
Application number	US-201715591591-A
Country	US
Kind code	A1
Filing date	May 10, 2017
Priority date	May 10, 2017
Publication date	Nov 15, 2018
Grant date	—

Abstract

Methods and devices are provided where a first current and a second current are provided selectively to a semiconductor component, and times for charging a capacitor to a voltage at the semiconductor component are provided.

First claim

What is claimed is:

1 . A device, comprising:
a capacitor, a semiconductor component, a current generator, wherein the current generator is configured to supply a charging current to the capacitor and to selectively supply at least a first current or a second current different from the first current to the semiconductor component, and a time evaluation circuit coupled to the capacitor and to the semiconductor component and configured to measure a first charging time for charging the capacitor to a first voltage at the semiconductor component while the first current is supplied to the semiconductor component and a second time for charging the capacitor to a second voltage at the semiconductor component while the second current is supplied to the semiconductor component.

2 . The device of claim 1 , wherein the semiconductor component comprises at least one of a diode or a bipolar transistor.

3 . The device of claim 1 , wherein the time evaluation circuit comprises a comparator, wherein a first input of the comparator is coupled to a node between the current generator and the capacitor, and wherein a second input of the comparator is coupled to a node between the current generator and the semiconductor component.

4 . The device of claim 3 , further comprising a counter coupled to an output of the comparator.

5 . The device of claim 4 , wherein the counter is configured to be reset based on an output of the comparator.

6 . The device of claim 1 , wherein the time evaluation circuit further comprises a calculation circuit configured to calculate a temperature based on the first time and the second time.

7 . The device of claim 1 , further comprising an interface to output the first time and the second time.

8 . The device of claim 1 , wherein the current source comprises a proportional to absolute temperature current source.

9 . The device of claim 1 , wherein the first current is equal to the charging current, and the second current is an integer multiple of the first current.

10 . The device of claim 1 , wherein the device comprises a self-calibration circuit to calibrate the charging current to approximate a predetermined charging time.

11 . The device of claim 10 , wherein the current generator comprises a plurality of current sources, and wherein the self-calibration circuit is configured to determine a subset of current sources for generating the charging current.

12 . A method, comprising:
providing a first current to a semiconductor device, measuring a first charging time for a capacitor to reach a first voltage at the semiconductor device while the first current is supplied, providing a second current to the semiconductor device different from the first current, and measuring a second charging time for the capacitor to reach a second voltage at the semiconductor device while the second current is supplied to the semiconductor device.

13 . The method of claim 12 , further comprising determining a temperature based on the first charging time and the second charging time.

14 . The method of claim 12 , further comprising calibrating a charging current for charging the capacitor.

15 . The method of claim 14 , wherein calibrating comprises performing a binary search to select current sources for providing the charging current.

16 . The method of claim 12 , wherein providing the first and second currents comprises providing a current proportional to absolute temperature.

17 . A temperature sensor device, comprising:
a current generator, a capacitor coupled to the current generator, a switch coupled in parallel to the capacitor, a semiconductor component coupled to the current generator, a comparator, wherein a first input of the comparator is coupled to a node between the current generator and the capacitor and wherein a second input of the current generator is coupled to a node between the current generator and the semiconductor component, a counter coupled to an output of the comparator, wherein the current generator is switchable between supplying a first current to the semiconductor component and supplying a second current different from the first current to the semiconductor component.

18 . The device of claim 17 , further comprising a first register coupled to the counter to store a count value while the first current is supplied to the semiconductor component and a second register coupled to the counter to store a second count value while the second current is supplied to the semiconductor component.

19 . The device of claim 17 , further comprising at least one chopper provided at at least one of an output of the current generator, in the current generator, at an input of the comparator or at an output of the comparator.

Assignees

• Infineon Technologies Ag

Inventors

• Zhu Di
• Koh Chin Yeong

Classifications

• G01K7/34 Primary

  using capacitative elements (capacitors per se H01G) · CPC title

• G01K7/01 Primary

  using semiconducting elements having PN junctions (G01K7/02, G01K7/16, G01K7/30 take precedence) · CPC title

• G01K2219/00

  Thermometers with dedicated analog to digital converters · CPC title