Matrix device, method for measuring characteristics thereof, and driving method thereof

Patent metadata

Field	Value
Publication number	US-2018203046-A1
Application number	US-201515510809-A
Country	US
Kind code	A1
Filing date	Sep 15, 2015
Priority date	Sep 26, 2014
Publication date	Jul 19, 2018
Grant date	—

Abstract

Provided is a method for measuring a current that a component of a matrix device can supply. A device including components (pixels) arranged in a matrix, first wirings, and second wirings and third wirings which cross the first wirings is used. Each component includes a potential supply circuit, a transistor, and a capacitor. The device is designed as follows: at a point in time, one electrode of the capacitor has a potential equal to that of a gate of the transistor, the other electrode of the capacitor has a potential equal to that of the second wiring, one of a source and a drain of the transistor has a potential equal to that of the first wiring, and the other of the source and the drain of the transistor has a potential equal to that of the third wiring; and the potential of the second wiring and the potential of the third wiring in the case where each component supplies the first wiring with a current in a given direction are different from the potential of the second wiring and the potential of the third wiring in the case where each component supplies the first wiring with a current in the opposite direction.

First claim

1 - 12 . (canceled)

13 . A measurement method for a device comprising:
N components; a first wiring; and second wirings which cross the first wiring, wherein each component can supply the first wiring with a current whose direction can be changed, wherein each component comprises a potential supply circuit, a transistor, and a capacitor, wherein the device is designed so that, at a point in time, one of a source and a drain of the transistor has a potential equal to that of the first wiring and the other of the source and the drain of the transistor has a potential equal to that of a third wiring, and wherein the device is designed so that the potential of the second wiring in the case where each component supplies the first wiring with a current in a first direction is different from the potential of the second wiring in the case where each component supplies the first wiring with a current in a second direction opposite to the first direction, wherein the method comprises: a process in which the current directions of the N components are individually set and a current flowing through the first wiring is measured N times; and a process in which the magnitude of a current flowing through each electrical element is calculated on the basis of currents I[ 1 ] to I[N] obtained by the N measurements and combinations of the current directions of the components in the N measurements, whereby the magnitude of the current supplied from the component to the wiring is determined, wherein: the N measurements differ from each other in combination of the current directions of the N components, and the magnitude of the current flowing through each electrical element is calculated using a polynomial of the currents I[ 1 ] to I[N].

14 . A measurement method for a device comprising:
components arranged in a matrix with N rows and M columns (N and M are each an integer of two or more); M first wirings; and N second wirings which cross the first wirings, wherein each component can supply one of the M first wirings with a current whose direction can be changed, wherein each component comprises a potential supply circuit, a transistor, and a capacitor, wherein the device is designed so that, at a point in time, one of a source and a drain of the transistor of each component has a potential equal to that of the first wiring and the other of the source and the drain of the transistor has a potential equal to that of the second wiring, and wherein the device is designed so that the potential of the second wiring in the case where each component supplies the first wiring with a current in a first direction is different from the potential of the second wiring in the case where each component supplies the first wiring with a current in a second direction opposite to the first direction, wherein the method comprises: a process in which the potentials of the N second wirings are individually set and currents flowing through the M first wirings are each measured N times, and a process in which the magnitude of a current flowing through each electrical element in an m-th column (m is an integer of 1 or more and M or less) is calculated on the basis of currents I[ 1 ,m] to I[N,m] of the first wiring in the m-th column, which are obtained by the N measurements, and combinations of the potentials of the N second wirings in the N measurements, whereby the magnitude of the current supplied from each component to the corresponding first wiring is determined, wherein: the N measurements differ from each other in combination of the potentials of the N second wirings, and the magnitude of the current flowing through each electrical element in the m-th column is calculated using a polynomial of the currents I[ 1 ,m] to I[N,m].

15 . The measurement method according to claim 14 , wherein:
the polynomial of the currents I[ 1 ,m] to I[N,m] can be expressed as a product of an inverse matrix of a square matrix A with N rows and a matrix with N rows and M columns whose elements are the currents I[ 1 ,m] to I[N,m], and no element of the inverse matrix of the square matrix A with N rows is 0.

16 . The measurement method according to claim 15 , wherein all the elements of the inverse matrix of the square matrix A with N rows have the same magnitude.

17 . The measurement method according to claim 15 , wherein the square matrix A with N rows is a Hadamard matrix.

18 . The measurement method according to claim 15 , wherein the square matrix A with N rows is a circulant matrix.

19 . The measurement method according to claim 15 , wherein:
N is a multiple of 4, and the sum of elements of a given row of the square matrix A with N rows is 2 or −2.

20 . The measurement method according to claim 13 , wherein the device further comprises N third wirings,
wherein the device is designed so that each third wiring has a potential equal to that of the other electrode of the capacitor of the corresponding component, and wherein the device is designed so that the potential of the third wiring in the case where each component supplies the first wiring with the current in the first direction is different from the potential of the third wiring in the case where each component supplies the first wiring with the current in the second direction.

21 . The measurement method according to claim 13 , wherein the device is designed so that the potential of a gate of the transistor of each component in the case where each component supplies the first wiring with the current in the first direction is different from that in the case where each component supplies the first wiring with the current in the second direction.

22 . A matrix device configured to execute the measurement method according to claim 13 .

23 . The matrix device according to claim 22 , wherein the matrix device is a display device or a photodetector device.

24 . A method for driving a matrix device, wherein input or output data is corrected on the basis of the current values of components measured by the measurement method according to claim 13 .

Assignees

• Semiconductor Energy Lab

Inventors

• Takemura Yasuhiko

Classifications

• H04N25/60

  Noise processing, e.g. detecting, correcting, reducing or removing noise · CPC title

• H04N25/77

  Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components · CPC title

• H04N5/357

  Electricity · mapped topic

• G09G2300/0819

  used for counteracting undesired variations, e.g. feedback or autozeroing · CPC title

• G09G2320/0693

  Calibration of display systems · CPC title