Device and method for determining a parameter of a transformer

Patent metadata

Field	Value
Publication number	US-2018024180-A1
Application number	US-201615548950-A
Country	US
Kind code	A1
Filing date	Jan 26, 2016
Priority date	Feb 6, 2015
Publication date	Jan 25, 2018
Grant date	—

Abstract

To ascertain a parameter of a transformer ( 40 ) that has a high voltage side ( 41 ) and a low voltage side ( 43 ), a test signal generated by a source ( 13 ) is impressed on the low voltage side ( 43 ). A test response of the transformer ( 40 ) is recorded. A leakage reactance and/or a leakage inductance of the transformer ( 40 ) is determined by an evaluation device ( 18 ) of an apparatus ( 10 ) on the basis of the test response of the transformer ( 40 ).

First claim

1 - 15 .

16 . An apparatus for ascertaining a parameter of a transformer that has a high voltage side and a low voltage side, wherein the apparatus comprises:
terminals for detachably connecting the apparatus to the low voltage side of the transformer, further terminals for detachably connecting the apparatus to the high voltage side of the transformer, a controllable switching device, connected to the further terminals, for shorting the high voltage side of the transformer, a source for generating a test signal, which source is connected to the terminals in order to impress the test signal on the low voltage side of the transformer, and an evaluation device that is set up to determine a leakage reactance or a leakage inductance of the transformer on the basis of a test response of the transformer.

17 . The apparatus as claimed in claim 16 , comprising
a measuring device, coupled to the further terminals, for recording the test response.

18 . The apparatus as claimed in claim 16 ,
wherein the apparatus is set up to control the controllable switching device such that the high voltage side is shorted while the test signal is impressed on the low voltage side.

19 . The apparatus as claimed in claim 16 ,
wherein the evaluation device is set up to determine the leakage reactance and/or the leakage inductance of the transformer on the basis of the test response and on the basis of a reactance or an inductance of at least one line, that connects the further terminals to the high voltage side.

20 . The apparatus as claimed in claim 19 ,
wherein the evaluation device is set up to determine the reactance or the inductance of the at least one line automatically.

21 . The apparatus as claimed in claim 19 ,
wherein the apparatus is set up to determine the reactance or the inductance of the at least one line without rewiring between the apparatus and the transformer.

22 . The apparatus as claimed in claim 16 ,
wherein the evaluation device is additionally set up to determine a short-circuit impedance of the transformer on the basis of the test response of the transformer.

23 . The apparatus as claimed in claim 22 ,
wherein the evaluation device is set up to determine the short-circuit impedance of the transformer on the basis of the test response and on the basis of an impedance of at least one line that connects the further terminals to the high voltage side.

24 . The apparatus as claimed in claim 16 , comprising
a user interface, wherein the evaluation device is set up to ascertain the leakage reactance or the leakage inductance of the transformer as a response to an input on the user interface.

25 . The apparatus as claimed in claim 16 ,
wherein the evaluation device is set up to take the leakage reactance or the leakage inductance of the transformer as a basis for automatically identifying deviation from nominal data of the transformer.

26 . A system, comprising
a transformer that has a high voltage side and a low voltage side, and an apparatus as claimed in claim 16 that is connected to the transformer.

27 . A method for ascertaining a parameter of a transformer that has a high voltage side and a low voltage side, comprising
shorting the high voltage side of the transformer using a controllable switching device, impressing a test signal on the low voltage side, recording a test response of the transformer, and determining a leakage reactance or a leakage inductance of the transformer on the basis of the test response of the transformer.

28 . The method of claim 27 ,
further comprising controlling the controllable switching device such that the high voltage side is shorted while the test signal is impressed on the low voltage side.

29 . The method as claimed in claim 27 ,
which is carried out using the apparatus as claimed in claim 16 .

Assignees

• Omicron Electronics Gmbh

Inventors

• Pütter Markus

Classifications

• G01R31/62 Primary

  Testing of transformers · CPC title

• G01R27/2611 Primary

  Measuring inductance · CPC title

• G01R29/20

  Measuring number of turns; Measuring transformation ratio or coupling factor of windings · CPC title

• G01R31/027 Primary

  Physics · mapped topic

• H02H7/04

  for transformers · CPC title