3d refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereof

Patent metadata

Field	Value
Publication number	US-2017357084-A1
Application number	US-201615243265-A
Country	US
Kind code	A1
Filing date	Aug 22, 2016
Priority date	Jun 10, 2016
Publication date	Dec 14, 2017
Grant date	—

Abstract

An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.

First claim

What is claimed is:

1 . A method of using an ultra-high-speed 3-dimensional (3D) refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper, the method comprising:
adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper; measuring a 2-dimensional (2D) optical field, which passes through the sample, based on the irradiation angle of the plane wave; and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.

2 . The method of claim 1 , further comprising:
adjusting a phase and a pattern of a wavefront of the plane wave to obtain a 3D high resolution fluorescence image, wherein the 3D high resolution fluorescence image and the 3D refractive index image of the sample are simultaneously measured by using the wavefront shaper.

3 . The method of claim 1 , wherein the adjusting of the irradiation angle comprises:
forming plane waves of various progression angles by changing a pattern displayed on a digital micromirror device, such that a progression angle of the plane wave incident on the sample is adjusted.

4 . The method of claim 1 , wherein the adjusting of the irradiation angle comprises:
adjusting a progression direction of one plane wave by adjusting the irradiation angle of the plane wave such that a diffraction light is incident on the sample and the rest thereof is shielded; and adjusting a pattern of a digital micromirror device to obtain phase information.

5 . The method of claim 4 , wherein the adjusting of the progression direction comprises:
using only one of diffraction lights generated by the digital micromirror device by using a spatial filter.

6 . The method of claim 1 , wherein the measuring of the 2D optical field comprises:
creating an interference pattern between the 2D optical field, which passes through the sample, and a reference beam and measuring the 2D optical field while variously changing the irradiation angle of the plane wave.

7 . The method of claim 2 , wherein the adjusting of the phase and the pattern comprises:
making the plane wave incident on the sample with a pattern and adjusting a phase between plane waves of the pattern; obtaining a plurality of fluorescence images by using patterns controlled by adjusting the phase; and obtaining a 3D high resolution fluorescence image by reconstructing a 2D fluorescence image of a high resolution from the plurality of fluorescence images by using an algorithm.

8 . The method of claim 2 , wherein the adjusting of the phase and the pattern comprises:
forming ‘N*M’ patterns by using ‘N’ patterns for distinguishing an optical field, of which an angle and a phase are adjustable through a pattern of a digital micromirror device, and ‘M’ patterns for azimuthal angle scanning.

9 . The method of claim 1 , further comprising:
selectively measuring a z-axis portion by using a low coherent light as a light source generating a plane wave after only the z-axis portion is distinguished.

10 . The method of claim 2 , wherein the adjusting of the phase and the pattern comprises:
obtaining the 3D high resolution fluorescence image by measuring each z-axis portion of the sample after translating a stage or a condenser lens in a z-axis direction.

11 . An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper, the system comprising:
a modulation unit configured to adjust an irradiation angle of a plane wave incident on a sample by using the wavefront shaper; an interferometer configured to measure a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave; and a refractive index image unit configured to obtain a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.

12 . The system of claim 11 , further comprising:
a fluorescence image unit configured to adjust a phase and a pattern of a wavefront of the plane wave to obtain a 3D high resolution fluorescence image, wherein the 3D high resolution fluorescence image and the 3D refractive index image of the sample are simultaneously measured by using the wavefront shaper.

13 . The system of claim 11 , wherein the modulation unit adjusts a progression direction of one plane wave by adjusting the irradiation angle of the plane wave such that a diffraction light is incident on the sample and the rest thereof is shielded, and adjusts a pattern of a digital micromirror device to obtain phase information.

14 . The system of claim 13 , wherein the modulation unit uses only one of diffraction lights generated by the digital micromirror device by using a spatial filter.

15 . The system of claim 11 , wherein the interferometer creates an interference pattern between the 2D optical field, which passes through the sample, and a reference beam and measures the 2D optical field while variously changing the irradiation angle of the plane wave.

16 . The system of claim 12 , wherein the fluorescence image unit makes the plane wave incident on the sample with a pattern, obtains a plurality of fluorescence images by using patterns controlled by adjusting a phase between plane waves of the pattern, and obtains a 3D high resolution fluorescence image by reconstructing a 2D fluorescence image of a high resolution from the plurality of fluorescence images by using an algorithm.

Assignees

• Korea Advanced Inst Sci & Tech
• Tomocube Inc

Inventors

• Park Yongkeun
• Shin Seungwoo
• Park Gwang Sik

Classifications

• G01N2201/0635

  Structured illumination, e.g. with grating · CPC title

• G01N21/6456

  Spatial resolved fluorescence measurements; Imaging · CPC title

• G03H2001/005

  in microscopy, e.g. digital holographic microscope [DHM] · CPC title

• G01N2021/6495

  Miscellaneous methods · CPC title

• G02B6/3516

  the reflective optical element moving along the beam path, e.g. controllable diffractive effects using multiple micromirrors within the beam · CPC title