Control Systems for Three-Dimensional Printing

Patent metadata

Field	Value
Publication number	US-2017355147-A1
Application number	US-201715615004-A
Country	US
Kind code	A1
Filing date	Jun 6, 2017
Priority date	Dec 12, 2014
Publication date	Dec 14, 2017
Grant date	—

Abstract

Provided herein are systems, apparatuses and methods for monitoring a three-dimensional printing process. The three-dimensional printing process can be monitored in-situ and/or in real time. Monitoring of the three-dimensional printing process can be non-invasive. A computer control system can be coupled to one or more detectors and signal processing units to adjust the generation of a three-dimensional object that is formed by the three-dimensional printing.

First claim

1 . An apparatus for printing one or more three-dimensional objects comprising a controller that is programmed to: (a) direct a first energy source to generate a first energy beam that interacts with an optical window disposed in an enclosure in which the one or more three-dimensional objects are generated by three-dimensional printing, wherein the controller is operatively coupled to the first energy source; (b) direct at least one processing unit to process a signal indicative of an alteration in the first energy beam, wherein the alteration in the first energy beam is prognostic of a change in a cleanliness of the optical window, wherein the controller is operatively coupled to the at least one processing unit; and (c) evaluate a result to determine an adjustment to the three-dimensional printing considering the alteration in the first energy beam.

2 . The apparatus of claim 1 , wherein the controller may further direct a mechanism used in the three-dimensional printing to alter at least one function based on the result, wherein the controller is operatively coupled to the mechanism.

3 . The apparatus of claim 1 , wherein the alteration in the first energy beam comprises intensity or direction alteration.

4 . The apparatus of claim 1 , wherein the signal is detected in real time during the printing of the one or more three-dimensional objects.

5 . The apparatus of claim 4 , wherein the cleanliness of the optical window is monitored continuously during the three-dimensional printing of the one or more three-dimensional objects.

6 . The apparatus of claim 4 , wherein the cleanliness of the optical window is monitored in discrete intervals.

7 . The apparatus of claim 1 , wherein the signal comprises a reflection of the first energy beam from the optical window.

8 . The apparatus of claim 7 , wherein the first energy beam is reflected from multiple locations of the optical window.

9 . The apparatus of claim 1 , wherein the apparatus further comprises a second energy source that generates a second energy beam that transforms at least a portion of a material bed to form the one or more three-dimensional objects, which material bed is disposed in the enclosure, and which second energy source is disposed adjacent to the enclosure.

10 . The apparatus of claim 9 , wherein the second energy beam is the same as the first energy beam.

11 . The apparatus of claim 1 , wherein the signal comprises one or more signals, and wherein the controller generates a map of the optical window using the one or more signals.

12 . An apparatus for printing one or more three-dimensional objects comprising:
an enclosure comprising an optical window, the enclosure configured to enclose the one or more three-dimensional object during a three-dimensional printing; a first energy source that is configured to generate a first energy beam that interacts with the optical window; and an energy beam detector configured to detect one or more signals comprising an alteration in the first energy beam that is indicative of a change in a cleanliness of the optical window, wherein the first energy source and the energy beam detector are disposed adjacent to the enclosure.

13 . The apparatus of claim 12 , wherein alteration in the first energy beam comprises intensity or direction alteration of the first energy beam.

14 . The apparatus of claim 12 , wherein the energy beam detector comprises an optical sensor.

15 . The apparatus of claim 12 , wherein the energy beam detector comprises a temperature sensor.

16 . The apparatus of claim 12 , wherein the energy beam detector comprises a spectrum analyzer.

17 . The apparatus of claim 12 , wherein the apparatus further comprises a second energy source that is configured to generate a second energy beam that transforms at least a portion of a material bed to form the one or more three-dimensional objects, which material bed is disposed in the enclosure, and which second energy source is disposed adjacent to the enclosure.

18 . The apparatus of claim 17 , wherein the change in the cleanliness of the optical window is used to adjust at least one characteristic of a second energy beam.

19 . The apparatus of claim 18 , wherein the at least one characteristic comprises a power delivered by the second energy beam, a cross section of the second energy beam, a focus parameter of the second energy beam, a pulsing sequence of the second energy beam, or a rate of movement of the second energy beam.

20 . The apparatus of claim 17 , wherein the second energy beam is the same as the first energy beam.

21 . The apparatus of claim 12 , wherein the change in the cleanliness of the optical window is used to determine an initiation of a cleaning procedure of the optical window.

22 . The apparatus of claim 21 , wherein the cleaning procedure comprises a physical or a chemical removal of debris.

23 . The apparatus of claim 22 , wherein the cleaning procedure comprises ablation of the debris.

Assignees

• Velo3D Inc

Inventors

• Buller Benyamin
• Milshtein Erel

Classifications

• B33Y30/00

  Apparatus for additive manufacturing; Details thereof or accessories therefor · CPC title

• B22F2202/11

  Use of irradiation · CPC title

• B33Y50/02

  for controlling or regulating additive manufacturing processes · CPC title

• B23K26/342

  Build-up welding · CPC title

• B29C64/268

  using laser beams; using electron beams [EB] · CPC title