Hardmask composition, hardmask layer, and method of forming patterns
US-2024377746-A1 · Nov 14, 2024 · US
US2017329228A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2017329228-A1 |
| Application number | US-201715592373-A |
| Country | US |
| Kind code | A1 |
| Filing date | May 11, 2017 |
| Priority date | May 12, 2016 |
| Publication date | Nov 16, 2017 |
| Grant date | — |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A resist pattern-forming method includes applying a photoresist composition directly or indirectly on a front face of a substrate to form a photoresist film. A topcoat layer is laminated directly or indirectly on a front face of the photoresist film. The photoresist film is subjected to liquid immersion lithography in a presence of a liquid immersion liquid on a front face of the topcoat layer. Part of the topcoat layer is removed after subjecting the photoresist film to the liquid immersion lithography. The photoresist film is developed after the part of the topcoat layer is removed.
Opening claim text (preview).
What is claimed is: 1 . A resist pattern-forming method comprising: applying a photoresist composition directly or indirectly on a front face of a substrate to form a photoresist film; laminating a topcoat layer directly or indirectly on a front face of the photoresist film; subjecting the photoresist film to liquid immersion lithography in a presence of a liquid immersion liquid on a front face of the topcoat layer; removing part of the topcoat layer after subjecting the photoresist film to the liquid immersion lithography; and developing the photoresist film after the part of the topcoat layer is removed. 2 . The resist-pattern-forming method according to claim 1 , wherein the part of the topcoat layer is removed by a removing liquid. 3 . The resist-pattern-forming method according to claim 2 , wherein the removing liquid provides a feature that: the topcoat layer is dissolved to remain so as to have a thickness of no less than 2 nm and no greater than 28 nm, provided that the photoresist film is formed on the front face of the substrate, the topcoat layer having a thickness of 30 nm is laminated on the front face of the photoresist film, and the removing liquid is brought into contact with the topcoat layer for 60 seconds. 4 . The resist-pattern-forming method according to claim 1 , wherein the topcoat layer comprises two or more kinds of polymers having different characteristics from one another, and in removal of the part of the topcoat layer, a polymer among the two or more kinds of polymers that is localized on a front face side of the topcoat is at least partially removed. 5 . The resist-pattern-forming method according to claim 4 , wherein the two or more kinds of polymers comprise a water-repellent resin and an acidic resin, and in the removal of the part of the topcoat layer, at least part of the water-repellent resin is removed. 6 . The resist-pattern-forming method according to claim 2 , wherein the removing liquid comprises an organic solvent as a principal component. 7 . The resist-pattern-forming method according to claim 6 , wherein the topcoat layer is laminated by applying a composition for forming the topcoat layer which comprises a solvent directly or indirectly on the front face of the photoresist film. 8 . The resist-pattern-forming method according to claim 7 , wherein a solubility parameter value of the removing liquid is smaller than a solubility parameter value of the solvent in the composition for forming the topcoat layer. 9 . The resist-pattern-forming method according to claim 6 , wherein the organic solvent comprises an ether solvent as a principal component.
in the presence of a fluid, e.g. immersion; using fluid cooling means · CPC title
having cover layers or intermediate layers, e.g. subbing layers {(G03F7/091 - G03F7/093, B41N3/03 take precedence)} · CPC title
Aqueous alkaline compositions · CPC title
Treatment after imagewise removal, e.g. baking · CPC title
Treatment before imagewise removal, e.g. prebaking {(G03F7/265 takes precedence)} · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.