Semiconductor device and method of forming the same

US2017263608A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2017263608-A1
Application numberUS-201715604638-A
CountryUS
Kind codeA1
Filing dateMay 24, 2017
Priority dateMar 19, 2015
Publication dateSep 14, 2017
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The present invention provides a semiconductor device and a method of forming the same. The semiconductor device includes a substrate, a first transistor and a second transistor. The first transistor and the second transistor are disposed on the substrate. The first transistor includes a first channel and a first work function layer. The second transistor includes a second channel and a second work function layer, where the first channel and the second channel include different dopants, and the second work function layer and the first work function layer have a same conductive type and different thicknesses.

First claim

Opening claim text (preview).

What is claimed is: 1 . A semiconductor device, comprising: a substrate; a first gate structure disposed on the substrate, the first gate structure comprising: a first channel; and a first work function layer; and a second gate structure disposed on the substrate, the second gate structure comprising: a second channel, wherein the second channel comprises different dopants from that of the first channel; and a second work function layer, wherein the second work function layer and the first work function layer have a same conductive type and different thicknesses. 2 . The semiconductor device according to claim 1 , wherein the first work function layer and the second work function layer comprise different materials. 3 . The semiconductor device according to claim 1 , further comprising: a third gate structure disposed on the substrate, wherein the third gate structure comprises: a third channel, wherein the third channel comprises different dopants from that of the first channel and the second channel; and a third work function layer, having a conductive type different from that of the first work function layer and the second work function layer. 4 . The semiconductor device according to claim 1 , wherein the second channel layer and the first channel layer comprise different dopant dosages. 5 . The semiconductor device according to claim 1 , wherein the second channel layer and the first channel layer comprise different dopant materials.

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What does patent US2017263608A1 cover?
The present invention provides a semiconductor device and a method of forming the same. The semiconductor device includes a substrate, a first transistor and a second transistor. The first transistor and the second transistor are disposed on the substrate. The first transistor includes a first channel and a first work function layer. The second transistor includes a second channel and a second …
Who is the assignee on this patent?
United Microelectronics Corp
What technology area does this patent fall under?
Primary CPC classification H01L27/0922. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Sep 14 2017 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).