Semiconductor device and semiconductor die
US-2024387542-A1 · Nov 21, 2024 · US
US2017263608A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2017263608-A1 |
| Application number | US-201715604638-A |
| Country | US |
| Kind code | A1 |
| Filing date | May 24, 2017 |
| Priority date | Mar 19, 2015 |
| Publication date | Sep 14, 2017 |
| Grant date | — |
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The present invention provides a semiconductor device and a method of forming the same. The semiconductor device includes a substrate, a first transistor and a second transistor. The first transistor and the second transistor are disposed on the substrate. The first transistor includes a first channel and a first work function layer. The second transistor includes a second channel and a second work function layer, where the first channel and the second channel include different dopants, and the second work function layer and the first work function layer have a same conductive type and different thicknesses.
Opening claim text (preview).
What is claimed is: 1 . A semiconductor device, comprising: a substrate; a first gate structure disposed on the substrate, the first gate structure comprising: a first channel; and a first work function layer; and a second gate structure disposed on the substrate, the second gate structure comprising: a second channel, wherein the second channel comprises different dopants from that of the first channel; and a second work function layer, wherein the second work function layer and the first work function layer have a same conductive type and different thicknesses. 2 . The semiconductor device according to claim 1 , wherein the first work function layer and the second work function layer comprise different materials. 3 . The semiconductor device according to claim 1 , further comprising: a third gate structure disposed on the substrate, wherein the third gate structure comprises: a third channel, wherein the third channel comprises different dopants from that of the first channel and the second channel; and a third work function layer, having a conductive type different from that of the first work function layer and the second work function layer. 4 . The semiconductor device according to claim 1 , wherein the second channel layer and the first channel layer comprise different dopant dosages. 5 . The semiconductor device according to claim 1 , wherein the second channel layer and the first channel layer comprise different dopant materials.
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