Substrate table assembly, an immersion lithographic apparatus and a device manufacturing method
US-9280063-B2 · Mar 8, 2016 · US
US2017162833A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2017162833-A1 |
| Application number | US-201615196055-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 29, 2016 |
| Priority date | Dec 4, 2015 |
| Publication date | Jun 8, 2017 |
| Grant date | — |
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A method of manufacturing a mask assembly includes forming, via an electroforming process, a base material including at least one opening on an electrode plate; and reprocessing the at least one opening using a laser to form at least one reprocessed opening.
Opening claim text (preview).
What is claimed is: 1 . A method of manufacturing a mask assembly, the method comprising: forming, via an electroforming process, a base material comprising at least one opening on an electrode plate; and reprocessing the at least one opening using a laser to form at least one reprocessed opening. 2 . The method of claim 1 , wherein edges of the at least one reprocessed opening are sloped with respect to a surface of the electrode plate. 3 . The method of claim 1 , wherein forming the base material on the electrode plate comprises: forming, on the electrode plate, a photoresist pattern comprising the at least one opening; and forming, using the electroforming process, the base material on the electrode plate in the least one opening. 4 . The method of claim 3 , wherein the photoresist pattern is formed using a positive photoresist process. 5 . The method of claim 3 , wherein the photoresist pattern is formed using a negative photoresist process. 6 . The method of claim 3 , wherein the forming of the base material on the electrode plate further comprises removing the photoresist pattern. 7 . The method of claim 1 , wherein the base material comprises nanoscale particles. 8 . The method of claim 1 , further comprising: separating the base material from the electrode plate; and supporting the base material across an opening in a mask frame. 9 . The method of claim 8 , wherein the base material is supported, under tension, across the opening in the mask frame. 10 . The method of claim 8 , wherein: the mask frame comprises a support frame extending across the opening in the mask frame; and the base material is supported on the support frame. 11 . A method of manufacturing a display apparatus, the method comprising: manufacturing a mask assembly; arranging a substrate of the display apparatus to face the mask assembly; and depositing, on the substrate, a deposition material according to at least one first opening in the mask assembly, wherein manufacturing the mask assembly comprises: forming, via an electroforming process, a base material comprising at least one second opening on an electrode plate; and reprocessing the at least one second opening using a laser to form the at least one first opening. 12 . The method of claim 11 , wherein edges of the at least one first opening are sloped with respect to a surface of the electrode plate. 13 . The method of claim 11 , wherein forming of the base material on the electrode plate comprises: forming, on the electrode plate, a photoresist pattern comprising the at least one second opening; and forming, using the electroforming process, the base material on the electrode plate in the at least one second opening. 14 . The method of claim 13 , wherein the photoresist pattern is formed using a negative photoresist process. 15 . The method of claim 13 , wherein the photoresist pattern is formed using a positive photoresist process. 16 . The method of claim 13 , wherein forming the base material on the electrode plate further comprises removing the photoresist pattern. 17 . The method of claim 11 , wherein the base material comprises nanoscale particles. 18 . The method of claim 11 , wherein manufacturing the mask assembly further comprises: separating the base material from the electrode plate; and supporting the base material across an opening in a mask frame. 19 . The method of claim 18 , wherein the base material is supported, under tension, across the opening in the mask frame. 20 . The method of claim 18 , wherein: the mask frame comprises a support frame extending across the opening in the mask frame; and the base material is supported on the support frame.
Manufacture or treatment specially adapted for the organic devices covered by this subclass · CPC title
Perforated or foraminous objects, e.g. sieves (C25D1/10 takes precedence) · CPC title
Moulds; Masks; Masterforms · CPC title
Exposure; Apparatus therefor (photographic printing apparatus for making copies G03B27/00) · CPC title
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