Voltage regulation of device functional properties

Patent metadata

Field	Value
Publication number	US-2017084824-A1
Application number	US-201515126143-A
Country	US
Kind code	A1
Filing date	Mar 16, 2015
Priority date	Mar 14, 2014
Publication date	Mar 23, 2017
Grant date	—

Abstract

Systems, methods, and apparatus are provided for tuning a functional property of a device. The device ( 210 ) includes a layer of a dielectric material ( 214 ) disposed over and forming an interface (216) with a layer of an electrically conductive target material ( 222 ). The dielectric material layer includes at least one ionic species having a high ion mobility. The target material is configured such that a potential difference applied to the device can cause the at least one ionic species to migrate reversibly across the interface into or out of the target material layer. The mobility of the at least one ionic species can be tuned by exposing the device to electromagnetic radiation and/or a temperature change.

First claim

1 . An apparatus for tuning a functional property of a device, the apparatus comprising:
a device comprising:
a dielectric material layer disposed in an x-y plane, the dielectric material layer comprising at least one ionic species having a high ion mobility, the dielectric material being configured such that exposure to electromagnetic radiation and/or temperature changes cause changes in the mobility of the least one ionic species; and
a target layer disposed over and forming an interface with the dielectric material layer, the target layer comprising a metal material configured to reversibly uptake an amount of the at least one ionic species; and at least one regulating element coupled to a spatial region of the device, the at least one regulating element comprising:
a voltage applying element to apply a potential difference in a direction across the interface; and
at least one of:
a temperature regulating element to regulate a temperature of the spatial region of the device; and
a source of electromagnetic radiation to irradiate at least a portion of the spatial region of the device;

wherein the at least one regulating element is configured to irradiate and/or regulate the temperature of the spatial region of the device, and to regulate the applied potential difference for a duration of time sufficient to modify a proportionate amount of the at least one ionic species in a portion of the target layer proximate to the interface, thereby causing a change of the functional property of the device; and wherein the device is configured to retain the change of the functional property after discontinuance of applying the potential difference, the irradiating, and/or the temperature regulation, of the first portion of the device.

2 - 3 . (canceled)

4 . The apparatus of claim 1 , wherein the target layer comprises a ferromagnetic material layer, and wherein the modification of the proportionate amount of the at least one ionic species in the portion of the target layer causes a change in magnetic anisotropy of the device proximate to the spatial region.

5 . The apparatus of claim 1 , wherein the at least one ionic species comprises at least one of an anion of oxygen, an anion of hydrogen, an oxide, an oxynitride, or a silicate.

6 . The apparatus of claim 1 , wherein the dielectric material layer comprises an oxide of at least one of gadolinium, hafnium, terbium, zirconium, yttrium, tantalum, titanium, aluminum, silicon, germanium, gallium, indium, tin, antimony, tellurium, barium, bismuth, titanium, vanadium, chromium, manganese, cobalt, nickel, copper, zinc, niobium, molybdenum, palladium, cadmium, strontium, tantalum, niobium, cerium, praesydium, or tungsten, or any combination thereof.

7 - 8 . (canceled)

9 . The apparatus of claim 1 , wherein the target layer comprises at least one electrically conductive nanostrip.

10 . The apparatus of claim 1 , wherein the target layer comprises aluminum, a transition metal, a rare earth metal, or an alloy comprising at least one of a transition metal and a rare earth metal.

11 . The apparatus of claim 1 , wherein the target layer comprises a ferromagnetic material.

12 . The apparatus of claim 11 , wherein the ferromagnetic material is selected from a group consisting of iron, nickel, cobalt, samarium, dysprosium, yttrium, chromium, or an alloy of at least one of iron, nickel, cobalt, and samarium alloyed with at least one of boron, carbon, copper, hafnium, palladium, platinum, rhenium, rhodium, and ruthenium.

13 . The apparatus of claim 11 , wherein the modification of the proportionate amount of the at least one ionic species in the portion of the target layer causes a change in magnetic anisotropy of the device proximate to the spatial region.

14 . The apparatus of claim 13 , wherein the change of proportionate amount of the at least one ionic species in a portion of the target layer causes a change between two or more selected from a group consisting of a perpendicular magnetic anisotropy, an in-plane magnetic anisotropy, and approximately zero magnetic anisotropy.

15 - 20 . (canceled)

21 . An apparatus comprising:
an active element comprising:
a ferromagnetic material layer disposed in an x-y plane, the ferromagnetic material being a metal material configured to reversibly uptake an amount of an ionic species;
a gate oxide dielectric layer disposed over and forming an interface with the ferromagnetic material layer, wherein the gate oxide dielectric layer comprises the ionic species, wherein the ionic species have a high ion mobility, and wherein the dielectric material of the gate oxide dielectric layer is configured such that exposure to electromagnetic radiation and/or temperature changes cause changes in the mobility of the ionic species; and
a gate electrode layer disposed over, and in electrical communication with, the gate oxide dielectric material layer; and
at least one regulating element coupled to a spatial region of the active element, the at least one regulating element comprising:
a voltage applying element to apply a potential difference in a direction across the ferromagnetic material layer and the gate electrode layer of the device; and
at least one of:
a temperature regulating element to regulate a temperature of the spatial region of the active element; and
a source of electromagnetic radiation to irradiate at least a portion of the spatial region of the active element;

wherein the regulating element is configured to irradiate and/or regulate the temperature of the spatial region of the active element, and to regulate the applied potential difference for a duration of time sufficient to modify a proportionate amount of the ionic species in a portion of the ferromagnetic material layer proximate to the interface, thereby causing a change of a functional property of the device; and wherein the device retains the change of the functional property after discontinuance of the irradiating, and/or the temperature regulation, of the active element.

22 . The apparatus of claim 21 , wherein the gate oxide dielectric layer has a lateral dimension in the x-y plane that approximates the lateral dimension of the gate electrode layer in the x-y plane.

23 . The apparatus of claim 22 , further comprising a second oxide dielectric material layer disposed between the ferromagnetic material layer and the gate oxide dielectric layer, wherein the second oxide dielectric material layer has a lateral dimension in the x-y plane that is greater than the lateral dimension of the gate oxide layer, and wherein the gate oxide dielectric layer has a greater thickness in a z-direction than the second oxide dielectric material layer.

24 . The apparatus of claim 23 , wherein the second oxide dielectric material layer and the gate oxide dielectric layer are formed from different dielectric materials.

25 - 27 . (canceled)

28 . An apparatus comprising:
ferromagnetic material layer a gate dielectric layer forming an interface with the ferromagnetic material layer, the gate dielectric layer comprising at least one ionic species; and a gate electrode layer disposed in electrical communication with the gate dielectric layer.

29 - 47 . (canceled)

48 . The device of claim 28 , wherein the gate dielectric layer is disposed in contact with the ferromagnetic layer along a first direction, and wherein the gate dielectric layer is wider than the gate electrode layer with respect to a direction perpendicular to the first direction.

Assignees

• Massachusetts Inst Technology

Inventors

• Bauer Uwe
• Beach Geoffrey S D

Classifications

• G05D23/1951

  with control of the working time of a temperature controlling device · CPC title

• H01L43/08 Primary

  Electricity · mapped topic

• H01L43/02

  Electricity · mapped topic

• H10N70/24 Primary

  based on migration or redistribution of ionic species, e.g. anions, vacancies · CPC title

• H10N70/8833

  Binary metal oxides, e.g. TaOx · CPC title