Method and a measuring device for investigating signal parameters

Patent metadata

Field	Value
Publication number	US-2017059617-A1
Application number	US-201615166627-A
Country	US
Kind code	A1
Filing date	May 27, 2016
Priority date	Sep 2, 2015
Publication date	Mar 2, 2017
Grant date	—

Abstract

The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

First claim

1 . A method for automatic determining of signal parameters in an electrical measuring device with a display element, with the method steps comprising:
displaying of a detected signal on the display element, manual masking of at least one signal component of the signal by means of a masking element of the measuring device, and determining of signal parameters from the masked signal component of the signal or from an unmasked signal component of the signal by the measuring device.

2 . The method according to claim 1 ,
wherein a user masks the signal component by means of a finger touch on a touch-sensitive screen as the masking element of the measuring device.

3 . The method according to claim 1 ,
wherein at least one further signal parameter is determined alongside the time duration and the bandwidth of the masked signal component.

4 . The method according to claim 1 ,
wherein the detected signal is analysed by means of the determined signal parameters wherein signal components of the detected signal with similar or identical determined signal parameters are determined by means of the measuring device.

5 . The method according to claim 4 ,
wherein the determined, analysed signal components are recognisably marked on the display element of the measuring device.

6 . The method according to claim 1 ,
wherein the determined signal parameters are output on the display element.

7 . The method according to claim 1 ,
wherein the masked signal component or the unmasked signal component is approximated by a polynomial.

8 . The method according to claim 7 ,
wherein phase coefficients with which the polynomial is described are approximated from the signal data of the masked signal component or of the unmasked signal component.

9 . The method according to claim 1 ,
wherein a window function is applied to the masked signal component or to the unmasked signal component in order to determine the signal parameters.

10 . The method according to claim 9 ,
wherein grid points of the polynomial are determined by means of the window function, wherein, in particular, a local minimum value of the signal within the masked signal component and/or a local maximum value of the signal within the masked signal component is/are determined.

11 . The method according to claim 9 ,
wherein grid points of the polynomial are determined by means of the window function, wherein, in particular, the smallest errors squared are determined.

12 . The method according to claim 5 ,
wherein the window function is aligned with the gradient of the power or amplitude of the signal in the masked signal component or in the unmasked signal component.

13 . The method according to claim 1 ,
wherein the masked signal component defines a time duration and a bandwidth as signal parameters, which are obtained from the signal data of the detected signal.

14 . The method according to claim 1 ,
wherein signal components which are rejected for the determining of the signal parameters are determined by the masking.

15 . The method according to claim 1 ,
wherein a threshold-value filter is applied to the masked signal components or the unmasked signal components.

16 . A measuring device, comprising
a signal input, for the connection of an analog signal to be detected; an analog-digital converter, for the conversion of the analog signal into a digital signal to be detected; a display element for the display of the detected digital signal; a masking element for the manual masking of at least one signal component of the signal; and a computer unit for the determining of signal parameters from the masked signal component of the signal or from the unmasked signal component of the signal, wherein at least one further signal parameter is also determined alongside the time duration and the bandwidth of the masked signal component.

17 . The measuring device according to claim 16 ,
wherein the masking element is a touch-sensitive screen of the display element or an input device of the measuring device.

18 . The measuring device according to claim 16 ,
wherein a marking unit is provided in the measuring device, and wherein the determined signal parameters are supplied to the marking unit, wherein the marking unit marks signal components of the detected signal with similar or identical signal parameters.

Assignees

• Rohde & Schwarz

Inventors

• Cirillo Luke
• Lagler Andreas
• Lohmer Clemens

Classifications

• G01R13/0218 Primary

  Circuits therefor · CPC title

• G01R13/0245

  for inserting reference markers · CPC title

• G01R29/0892

  Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value · CPC title