Impactor Spray Atmospheric Pressure Ion Source with Target Paddle

Patent metadata

Field	Value
Publication number	US-2016365232-A1
Application number	US-201515121508-A
Country	US
Kind code	A1
Filing date	Feb 26, 2015
Priority date	Feb 26, 2014
Publication date	Dec 15, 2016
Grant date	—

Abstract

An ion source is provided comprising one or more nebulisers and one or more targets, wherein the one or more nebulisers are arranged and adapted to emit, in use, a stream predominantly of droplets which are caused to impact upon the one or more targets and to ionise the droplets to form a plurality of ions. The ion source further comprises one or more electrodes arranged adjacent to and/or attached to the one or more targets wherein the one or more electrodes comprise one or more apertures, notches or cut-outs wherein at least some of the plurality of ions pass, in use, through the one or more apertures, notches or cut-outs.

First claim

1 . An ion source comprising:
one or more nebulisers and one or more targets, wherein said one or more nebulisers are arranged and adapted to emit, in use, a stream predominantly of droplets which are caused to impact upon said one or more targets and to ionise said droplets to form a plurality of ions; and wherein said ion source further comprises: one or more electrodes arranged adjacent to and/or attached to said one or more targets wherein said one or more electrodes comprise one or more apertures, notches or cut-outs wherein at least some of said plurality of ions pass, in use, through said one or more apertures, notches or cut-outs.

2 . An ion source as claimed in claim 1 , wherein said stream predominantly of droplets are caused to impact upon said one or more targets so as to ionise said droplets to form said plurality of ions.

3 . An ion source as claimed in claim 1 , wherein said one or more targets are shaped or have an aerodynamic profile so that gas flowing past said one or more targets is directed or deflected towards and/or through said one or more apertures, notches or cut-outs.

4 . An ion source as claimed in claim 1 , wherein said one or more targets are arranged or otherwise positioned so as to deflect said stream of droplets and/or said plurality of ions towards and/or through said one or more apertures, notches or cut-outs.

5 . An ion source as claimed in claim 1 , wherein said one or more apertures, notches or cut-outs are located at or are otherwise arranged in the vicinity of or immediately downstream of the impact point of said droplet stream upon said one or more targets.

6 . An ion source as claimed in any claim 1 , wherein said one or more electrodes are attached to and/or contact said one or more targets.

7 . An ion source as claimed in claim 1 , wherein said one or more electrodes are positioned in a plane which is substantially perpendicular to a primary or predominant direction of gas flow through said one or more apertures, notches or cut-outs.

8 . An ion source as claimed in claim 1 , wherein said one or more electrodes are arranged to have substantially smooth or deburred edges.

9 . An ion source as claimed in claim 1 , wherein said ion source comprises an Atmospheric Pressure Ionisation (“API”) ion source.

10 . A mass spectrometer comprising an ion source as claimed in claim 1 .

11 . A mass spectrometer as claimed in claim 10 , further comprising an ion inlet device which leads to a first vacuum stage of said mass spectrometer.

12 . A mass spectrometer as claimed in claim 11 , wherein in a mode of operation said ion inlet device and/or said one or more targets and/or said one or more electrodes are maintained at different potentials.

13 . A mass spectrometer as claimed in claim 12 , wherein in a mode of operation said ion inlet device and/or said one or more targets and/or said one or more electrodes are maintained at different potentials such that an electric field is created therebetween that substantially assists or opposes the flow of ions.

14 . A mass spectrometer as claimed in claim 11 , further comprising an insulating tube or housing which is attached to or arranged adjacent to said ion inlet device and wherein said one or more electrodes are attached to or arranged adjacent to said insulating tube or housing.

15 . A mass spectrometer as claimed in claim 14 , further comprising an ion mobility spectrometer or separator attached to or arranged adjacent to said ion inlet device and/or arranged within said insulating tube or housing.

16 . A mass spectrometer as claimed in claim 15 , wherein said ion mobility spectrometer or separator comprises a plurality of further electrodes having apertures through which ions are transmitted in use.

17 . A mass spectrometer as claimed in claim 15 , wherein said one or more electrodes are attached to or arranged adjacent to said ion mobility spectrometer or separator.

18 . A mass spectrometer as claimed in claim 15 , wherein said ion mobility spectrometer or separator further comprises one or more ion gating or ion injection devices.

19 . A mass spectrometer as claimed in claim 18 , wherein said one or more ion gating or ion injection devices is arranged and adapted to pulse ions into an ion mobility drift region arranged between said one more ion gating or injection devices and said ion inlet device, whereupon said ions are separated temporally according to their ion mobility as the ions are urged towards said ion inlet device.

20 . An ion mobility spectrometer or separator comprising an ion source as claimed in claim 1 .

21 . A method of ionising a sample comprising:
providing one or more nebulisers and one or more targets; causing said one or more nebulisers to emit a stream predominantly of droplets which are caused to impact upon said one or more targets and to ionise said droplets to form a plurality of ions; positioning one or more electrodes adjacent to and/or attached to said one or more targets wherein said one or more electrodes comprise one or more apertures, notches or cut-outs; and causing at least some of said plurality of ions to pass through said one or more apertures, notches or cut-outs.

22 . A method of mass spectrometry comprising a method of ionising a sample as claimed in claim 21 .

Assignees

• Micromass Ltd

Inventors

• Bajic Stevan

Classifications

• H01J49/0445 Primary

  with means for introducing as a spray, a jet or an aerosol (electrospray ion sources H01J49/165) · CPC title

• H01J49/142

  using a solid target which is not previously vapourised · CPC title

• H01J49/045 Primary

  with means for using a nebulising gas, i.e. pneumatically assisted · CPC title

• H01J49/0031

  Step by step routines describing the use of the apparatus (H01J49/0081 takes precedence) · CPC title

• H01J49/16

  using surface ionisation, e.g. field-, thermionic- or photo-emission · CPC title