Radiation inspecting apparatus

US2016363544A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016363544-A1
Application numberUS-201514735112-A
CountryUS
Kind codeA1
Filing dateJun 9, 2015
Priority dateJun 9, 2015
Publication dateDec 15, 2016
Grant date

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Abstract

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In an X-ray inspecting apparatus, a rotational fluctuation amount of a stage is calculated around a power transmission part of the stage and a stage drive unit as a base point, i.e., the X-axis and Y-axis sliding parts, in accordance with detected positional information from a position detecting sensor. Then, a stage shift amount is calculated in accordance with the rotational fluctuation amount and a distance between the base point and an imaging position on the stage. Here, the stage shift amount corresponds to a positional deviation of the stage at the imaging position caused by an attitude variation of the stage in a yawing direction, and thus is an error in repeated positioning. Accordingly, a tomographic image with high resolution can be generated in consideration of the error in repeated positioning.

First claim

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1 . A radiation inspecting apparatus having a radiation source emitting radiation to an inspection object, a radiation detector detecting radiation passing through the inspection object to capture projection images, and a stage disposed between the radiation source and the radiation detector for supporting the inspection object placed thereon, the radiation inspecting apparatus comprising: a stage drive unit moving the stage; a position detecting sensor detecting a position of the stage; a rotational fluctuation amount calculating unit calculating a rotational fluctuation amount of the stage around a power transmission part of the stage and the stage drive unit as a base point in accordance with detected positional information from the position detecting sensor upon imaging of the inspection object; a stage shift amount calculating unit calculating a stage shift amount in accordance with the rotational fluctuation amount and a distance between the base point and an imaging position on the stage, the stage shift amount representing a stage shift amount at the imaging position; and an image reconstructing unit correcting a positional deviation of the stage in accordance with the stage shift amount and reconstructing the projection images of the inspection object captured from various directions to generate a tomographic image. 2 . The radiation inspecting apparatus according to claim 1 , wherein the rotational fluctuation amount calculating unit calculates the rotational fluctuation amount of the stage in accordance with the detected positional information from the position detecting sensor upon calibration of the stage drive unit with a calibration phantom and the detected positional information from the position detecting sensor upon the imaging of the inspection image. 3 . The radiation inspecting apparatus according to claim 1 , wherein the stage drive unit is disposed adjacent to a first edge of the stage, and the position detecting sensor is disposed adjacent to a second edge of the stage opposite to the first edge. 4 . The radiation inspecting apparatus according to claim 2 , wherein the stage drive unit is disposed adjacent to a first edge of the stage, and the position detecting sensor is disposed adjacent to a second edge of the stage opposite to the first edge. 5 . The radiation inspecting apparatus according to claim 1 , wherein the stage is moved in at least two directions along an X-axis and a Y-axis, the stage drive unit is provided along each of the X-axis and the Y-axis, and guiding units are disposed on both edges of the stage in a direction orthogonal to a moving direction thereof, the guiding units guiding the stage in the moving direction, and an additional guiding unit is disposed on one of the X-axis and the Y-axis in the direction orthogonal to the moving direction, and the position detecting sensor is provided on the other of the X-axis and the Y-axis. 6 . The radiation inspecting apparatus according to claim 2 , wherein the stage is moved in at least two directions along an X-axis and a Y-axis, the stage drive unit is provided along each of the X-axis and the Y-axis, and guiding units are disposed on both edges of the stage in a direction orthogonal to a moving direction thereof, the guiding units guiding the stage in the moving direction, and an additional guiding unit is disposed on one of the X-axis and the Y-axis in the direction orthogonal to the moving direction, and the position detecting sensor is provided on the other of the X-axis and the Y-axis. 7 . The radiation inspecting apparatus according to claim 3 , wherein the stage is moved in at least two directions along an X-axis and a Y-axis, the stage drive unit is provided along each of the X-axis and the Y-axis, and guiding units are disposed on both edges of the stage in a direction orthogonal to a moving direction thereof, the guiding units guiding the stage in the moving direction, and an additional guiding unit is disposed on one of the X-axis and the Y-axis in the direction orthogonal to the moving direction, and the position detecting sensor is provided on the other of the X-axis and the Y-axis. 8 . The radiation inspecting apparatus according to claim 5 , wherein the position detecting sensor is disposed on either the X-axis or the Y-axis in the moving direction in which a gap between the guiding unit on one of the edges of the stage and the stage drive unit on the other of the edges of the stage is larger. 9 . The radiation inspecting apparatus according to claim 1 , wherein the stage is moved in at least two moving directions along the X-axis and the Y-axis, and the stage drive unit and the position detecting sensor are provided in each of the moving directions. 10 . The radiation inspecting apparatus according to claim 2 , wherein the stage is moved in at least two moving directions along the X-axis and the Y-axis, and the stage drive unit and the position detecting sensor are provided in each of the moving directions. 11 . The radiation inspecting apparatus according to claim 3 , wherein the stage is moved in at least two moving directions along the X-axis and the Y-axis, and the stage drive unit and the position detecting sensor are provided in each of the moving directions. 12 . The radiation inspecting apparatus according to claim 1 , further comprising: an imaging system drive unit driving at least either the radiation source or the radiation detector. 13 . A radiation inspecting apparatus having a radiation source emitting radiation to an inspection object, a radiation detector detecting radiation passing through the inspection object to capture a projection image, and a stage disposed between the radiation source and the radiation detector for supporting the inspection object placed thereon, the radiation inspecting apparatus comprising: a stage drive unit moving the stage; a position detecting sensor detecting a position of the stage; a rotational fluctuation amount calculating unit calculating a rotational fluctuation amount of the stage around a power transmission part of the stage and the stage drive unit as a base point in accordance with detected positional information from the position detecting sensor upon imaging of the inspection object; a stage shift amount calculating unit calculating a stage shift amount in accordance with the rotational fluctuation amount and a distance between the base point and an imaging position, the stage shift amount representing a fluctuation amount of the stage at the imaging position; a pixel shift amount converting unit converting the stage shift amount into a pixel shift amount on the projection image; and a positional deviation correcting unit moving the projection image in accordance with the pixel shift amount in a direction in which a positional deviation is eliminated.

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Classifications

  • Means for conveying samples received · CPC title

  • G01N23/046Primary

    using tomography, e.g. computed tomography [CT] · CPC title

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What does patent US2016363544A1 cover?
In an X-ray inspecting apparatus, a rotational fluctuation amount of a stage is calculated around a power transmission part of the stage and a stage drive unit as a base point, i.e., the X-axis and Y-axis sliding parts, in accordance with detected positional information from a position detecting sensor. Then, a stage shift amount is calculated in accordance with the rotational fluctuation amoun…
Who is the assignee on this patent?
Shimadzu Corp
What technology area does this patent fall under?
Primary CPC classification G01N23/046. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Dec 15 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).