Method for calibrating an over-the-air (ota) test system for testing multiple radio frequency (rf) data packet signal transceivers

Patent metadata

Field	Value
Publication number	US-2016359718-A1
Application number	US-201514732236-A
Country	US
Kind code	A1
Filing date	Jun 5, 2015
Priority date	Jun 5, 2015
Publication date	Dec 8, 2016
Grant date	—

Abstract

Method for calibrating an over-the air (OTA) test system for testing multiple radio frequency (RF) data packet signal transceiver devices under test (DUTs), as well as using such a calibrated OTA test system for performing such tests. Calibration is achieved by placing a known good device (KGD) in multiple defined locations within the OTA test system, radiating the KGD with RF test signals at each location, and collecting from the KGD at each location channel quality information identifying optimal RF test signal sub-band channels for ensuring reliable communications within the test system. Use of such system includes placing multiple DUTs at the defined locations within the OTA test system and communicating with them wirelessly via the identified optimal RF test signal sub-band channels.

First claim

What is claimed is:

1 . A method for calibrating an over-the air (OTA) test system for testing a plurality of radio frequency (RF) data packet signal transceiver devices under test (DUTs), comprising:
providing an OTA test environment including a structure defining interior and exterior regions and one or more RF antennas disposed to transmit and receive radiated RF signals into and from said interior region, respectively, and configured to enable placement of a plurality of DUTs at locations within said interior region substantially isolated from electromagnetic radiation originating from said exterior region; placing a known good device (KGD) in a defined location within said interior region; transmitting, into said interior region via said one or more RF antennas, a RF test signal having a RF test signal band including a plurality of RF test signal sub-band channels to convey a plurality of encoded data symbols, wherein
each one of said plurality of RF test signal sub-band channels includes a plurality of serial time slots each of which contains one or more RF data signals, and
respective portions of said plurality of RF test signal sub-band channels include mutually distinct combinations of data bit modulation and quantity of data bits;
receiving, with said KGD, said RF test signal and in response thereto transmitting, with said KGD, a RF DUT signal including a plurality of channel quality information (CQI) data related to said defined location for at least a portion of said plurality of RF test signal sub-band channels, wherein respective portions of said plurality of CQI data are related to respective signal-to-interference-plus-noise ratios (SINRs) for corresponding portions of said plurality of RF test signal sub-band channels; and placing said known good device (KGD) in another defined location within said interior region, followed by repeating said
transmitting, into said interior region via said one or more RF antennas, a RF test signal, and
receiving, with said KGD, said RF test signal and in response thereto transmitting, with said KGD, a RF DUT signal.

2 . The method of claim 1 , wherein said CQI data is related to decoding by said KGD of said plurality of encoded data symbols.

3 . The method of claim 1 , wherein said one or more RF data signals comprises a plurality of RF signal frequency subcarriers to convey said encoded data symbols.

4 . The method of claim 1 , wherein said KGD includes a number of antennas for receiving said RF test signal and transmitting said RF DUT signal, and said CQI data is related to said number of antennas.

5 . The method of claim 1 , wherein at least one of said SINRs is higher than one or more of other ones of said SINRs.

6 . A method of using a calibrated over-the air (OTA) test system for testing a plurality of radio frequency (RF) data packet signal transceiver devices under test (DUTs), comprising:
providing an OTA test environment including a structure defining interior and exterior regions and one or more RF antennas disposed to transmit and receive radiated RF signals into and from said interior region, respectively, and configured for placement of a plurality of DUTs at corresponding defined locations within said interior region substantially isolated from electromagnetic radiation originating from said exterior region; placing said plurality of DUTs at said corresponding defined locations; transmitting, into said interior region via said one or more RF antennas, a RF test signal having a RF test signal band including a plurality of RF test signal sub-band channels to convey a plurality of encoded data symbols, wherein
each one of said plurality of RF test signal sub-band channels includes a plurality of serial time slots each of which contains one or more RF data signals, and
respective portions of said plurality of RF test signal sub-band channels include mutually distinct combinations of data bit modulation and number of data bits; and
receiving, with each one of said plurality of DUTs, at least a respective portion of said RF test signal including one or more combinations of data bit modulation and number of data bits associated with said corresponding defined location, and in response thereto transmitting, with said each one of said plurality of DUTs, a RF DUT signal.

7 . The method of claim 6 , wherein said one or more combinations of data bit modulation and number of data bits associated with said corresponding defined location are associated with said corresponding defined location in accordance with channel quality information (CQI) data related to said at least a respective portion of said RF test signal received at said defined location.

8 . The method of claim 6 , wherein said one or more combinations of data bit modulation and number of data bits associated with said corresponding defined location are associated with said corresponding defined location in accordance with one or more signal-to-interference-plus-noise ratios (SINRs) for said at least a respective portion of said RF test signal received by said DUT.

9 . The method of claim 6 , wherein said at least a respective portion of said RF test signal comprises a portion of said plurality of RF test signal sub-band channels.

10 . The method of claim 6 , wherein said at least a respective portion of said RF test signal including one or more combinations of data bit modulation and number of data bits associated with said corresponding defined location has a higher signal-to-interference-plus-noise ratio (SINR) when received by said DUT than another portion of said RF test signal including another one or more combinations of data bit modulation and number of data bits.

Assignees

• Litepoint Corp

Inventors

• Banerjee Soumyadeep
• Sheya Steve Lawrence
• Yellapantula Ramakrishna

Classifications

• H04B17/309

  Measuring or estimating channel quality parameters · CPC title

• H04L43/50 Primary

  Testing arrangements · CPC title

• H04B17/11

  for calibration · CPC title

• H04B17/0085

  using test signal generators · CPC title