Scan driving circuit

Patent metadata

Field	Value
Publication number	US-2016358568-A1
Application number	US-201514783095-A
Country	US
Kind code	A1
Filing date	Aug 10, 2015
Priority date	Jun 4, 2015
Publication date	Dec 8, 2016
Grant date	—

Abstract

A scan driving circuit is disclosed for executing a driving operation for cascaded scan lines and includes a pull-down control module, a pull-down module, a reset control module, a reset module, a down-stream module, a first bootstrap capacitor, a constant low-level voltage source utilized, and a constant high-level voltage source. The whole structure of the disclosed scan driving circuit is simple, and power consumption is low.

First claim

What is claimed is:

1 . A scan driving circuit, utilized for executing a driving operation for cascaded scan lines, comprising:
a pull-down control module utilized for receiving a previous-stage scan signal and generating a low-level scan signal corresponding one of the scan lines according to the previous-stage scan signal; a pull-down module utilized for pulling down a scan signal of the corresponding scan line according to the low-level scan signal; a reset control module utilized for receiving a next-stage clock signal and generating a reset signal of the corresponding scan line according to the next-stage clock signal; a reset module utilized for pulling up the scan signal of the corresponding scan line according to the reset signal; a down-stream module utilized for generating and transmitting a present-stage clock signal and a present-stage pull-down control signal according to the scan signal of the scan line; a first bootstrap capacitor utilized for generating a high level or a low level of the scan signal of the scan line; a constant low-level voltage source utilized for providing a low-level signal; and a constant high-level voltage source utilized for providing a high-level signal; wherein the scan driving circuit utilizes P-type metal-oxide-semiconductor field-effect transistors or N-type metal-oxide-semiconductor field-effect transistors to control the pull-down control module, the pull-down module, the reset control module, and the reset module; the pull-down control module further receives a next-stage scan signal and generates the low-level scan signal of the corresponding scan signal according to the next-stage scan signal; the reset control module further receives a previous-stage clock signal and generates the reset signal of the corresponding scan signal according to the previous-stage scan signal.

2 . The scan driving circuit of claim 1 , wherein the pull-down control module comprises a first switch transistor, the low-level scan signal is inputted to a control end of the first switch transistor, the previous-stage scan signal is inputted to an input end of the first switch transistor, and an output end of the first switch transistor is coupled to the pull-down module.

3 . The scan driving circuit of claim 2 , wherein the pull-down module comprises a second switch transistor, a control end of the second switch transistor is coupled to the output end of the first switch transistor of the pull-down control module, an input end of the second switch transistor is coupled to the output end of the first switch transistor of the pull-down control module, and an output end of the second switch transistor outputs the low-level scan signal of the scan line.

4 . The scan driving circuit of claim 3 , wherein the reset control module comprises a third switch transistor, the low-level scan signal is inputted to a control end of the third switch transistor, the next-stage clock signal is inputted to an input of the third switch transistor, and an output end of the third switch transistor outputs the reset signal of the scan line.

5 . The scan driving circuit of claim 4 , wherein the reset module comprises a fourth switch transistor, a fifth switch transistor, a sixth switch transistor, and a seventh switch transistor;
a control end of the fourth switch transistor is coupled to the output end of the third switch transistor, an input end of the fourth switch transistor is coupled to the constant low-level voltage source, and an output end of the fourth switch transistor is coupled to a control end of the fifth switch transistor, a control end of the seventh switch transistor, and a control end of the sixth switch transistor; an input end of the fifth switch transistor is coupled to the constant high-level voltage source, and an output end of the fifth switch transistor is coupled to the output end of the second switch transistor; a control end of the sixth switch transistor is coupled to the output end of the second switch transistor, and an input end of the sixth switch transistor is coupled to the constant high-level voltage source; an input end of the seventh switch transistor is coupled to the constant high-level voltage source, and an output end of the seventh switch transistor outputs the present-stage scan signal of the scan line.

6 . The scan driving circuit of claim 5 , wherein the down-stream module comprises an eighth switch transistor, a control end of the eighth switch transistor is coupled to the output end of the second switch transistor, an input end of the eighth switch transistor is coupled to the output end of the seventh switch transistor, and an output end of the eighth switch transistor outputs the present-stage clock signal.

7 . The scan driving circuit of claim 5 , wherein the reset module comprises a tenth switch transistor, a control end of the tenth switch transistor is coupled to a next-two-stage clock signal, an input end of the tenth switch transistor is coupled to the constant high-level voltage source, and an output end of the tenth switch transistor is coupled to the output end of the fourth switch transistor.

8 . The scan driving circuit of claim 5 , wherein the reset module comprises a tenth switch transistor, a control end of the tenth switch transistor is coupled to the output end of first switch transistor, an input end of the tenth switch transistor is coupled to the constant high-level voltage source, and an output end of the tenth switch transistor is coupled to the output end of the fourth switch transistor.

9 . The scan driving circuit of claim 5 , wherein the reset module comprises a tenth switch transistor, a control end of the tenth switch transistor is coupled to the control end of the second switch transistor and a previous-stage pull-down control signal, an input end of the tenth switch transistor is coupled to the constant high-level voltage source, and an output end of the tenth switch transistor is coupled to the output end of the fourth switch transistor;
the down-stream module comprises an eighth switch transistor and an eleventh switch transistor, a control end of the eighth switch transistor is coupled to the output end of the second switch transistor, an input end of the eighth switch transistor is coupled to the output end of the seventh switch transistor, and an output end of the eighth switch transistor outputs the present-stage clock signal; a control end of the eleventh switch transistor is coupled to the output end of the second switch transistor, an input end of the eleventh switch transistor is coupled to the output end of the eighth switch transistor, and an output end of the eleventh switch transistor outputs the present-stage pull-down control signal.

10 . The display panel of claim 9 , wherein the reset module further comprises a twelfth switch transistor, a control end of the twelfth switch transistor is coupled to the output end of the fourth switch transistor, an input end of the twelfth switch transistor is coupled to the constant high-level voltage source, and an output end of the twelfth switch transistor is coupled to the output end of the eleventh switch transistor.

11 . A scan driving circuit, utilized for executing a driving operation for cascaded scan lines, comprising:
a pull-down control module utilized for receiving a previous-stage scan signal and generating a low-level scan signal corresponding one of the scan lines according to the previous-stage scan signal; a pull-down module utilized for pulling down a scan signal of the corresponding scan line according to the low-level scan signal; a reset control module utilized for receiving a next-stage clock signal and generating a res

Assignees

• Wuhan China Star Optoelectronics Technology Co Ltd

Inventors

• Xiao Juncheng
• Zhao Mang
• Tian Yong

Classifications

• G11C19/28

  using semiconductor elements (G11C19/14, G11C19/36 take precedence) · CPC title

• G09G2330/021

  Power management, e.g. power saving · CPC title

• G09G2310/0286

  Details of a shift registers arranged for use in a driving circuit · CPC title

• G09G2320/0223

  Compensation for problems related to R-C delay and attenuation in electrodes of matrix panels, e.g. in gate electrodes or on-substrate video signal electrodes · CPC title

• G09G2320/041

  Temperature compensation · CPC title