Image sensor and manufacturing process thereof
US-2024347559-A1 · Oct 17, 2024 · US
US2016343753A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016343753-A1 |
| Application number | US-201414900242-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 25, 2014 |
| Priority date | Jul 3, 2013 |
| Publication date | Nov 24, 2016 |
| Grant date | — |
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A high degree of phase difference detection accuracy can be obtained using a phase difference pixel ( 2 B) with a simpler configuration. A solid-state image-capturing device includes a pixel array unit in FIG. 2 which a plurality of pixels including a phase difference pixel ( 2 B) which is a pixel for focal point detection and an image-capturing pixel ( 2 A) which is a pixel for image generation are arranged in a two-dimensional array. In this case, a predetermined layer ( 50 ) between a light shielding layer ( 47 ) and a micro lens ( 52 ) formed in the image-capturing pixel has a higher refraction index than a refraction index of the predetermined layer ( 51 ) formed in the phase difference pixel. The technique of the present disclosure can be applied to, for example, a back-illuminated-type solid-state image-capturing device and the like.
Opening claim text (preview).
What is claimed is: 1 . A solid-state image-capturing device, comprising: a pixel array unit having a plurality of pixels arranged in a two-dimensional array, the plurality of pixels including a phase difference pixel and an image-capturing pixel; and a layer between a light shielding layer and a micro lens formed in the image-capturing pixel, wherein the layer between the light shielding layer and the micro lens formed in the image-capturing pixel has a higher refraction index than a refraction index of a layer formed in the phase difference pixel. 2 . The solid-state image-capturing device according to claim 1 , wherein a difference between the refraction index of the layer between the light shielding layer and the micro lens of the image-capturing pixel and the refraction index of the layer of the phase difference pixel is greater than or equal to 0.2. 3 . The solid-state image-capturing device according to claim 1 , wherein the phase difference pixel includes a light shielding layer and a micro lens, and wherein at least one of the layer between the light shielding layer and the micro lens of the image-capturing pixel and the layer between the light shielding layer and the micro lens of the phase difference pixel is provided between the micro lens and a color filter at an upper side of the light shielding layer. 4 . The solid-state image-capturing device according to claim 1 , wherein a second layer having a refraction index less than the refraction index of the layer between the light shielding layer and the micro lens of the image-capturing pixel is provided between the micro lens and the layer of the image-capturing pixel. 5 . The solid-state image-capturing device according to claim 1 , wherein the phase difference pixel includes a light shielding layer and a micro lens and wherein at least one of the layer between the light shielding layer and the micro lens of the image-capturing pixel and the layer between the light shielding layer and the micro lens of the phase difference pixel is provided between the light shielding layer and a color filter layer at a lower side of the micro lens. 6 . The solid-state image-capturing device according to claim 1 , wherein at least one of the layer between the light shielding layer and the micro lens of the image-capturing pixel and the layer between the light shielding layer and the micro lens of the phase difference pixel is a color filter layer. 7 . The solid-state image-capturing device according to claim 6 , wherein the layer between the light shielding layer and the micro lens of the phase difference pixel is a transparent color filter layer. 8 . The solid-state image-capturing device according to claim 1 , wherein the layer between the light shielding layer and the micro lens of the image-capturing pixel is a color filter layer, and the layer between the light shielding layer and the micro lens of the phase difference pixel is made of a same material as the micro lens. 9 . The solid-state image-capturing device according to claim 1 , wherein the layer between the light shielding layer and the micro lens of the phase difference pixel is made of a same material as a planarization film for planarizing an upper portion of the light shielding layer. 10 . The solid-state image-capturing device according to claim 1 , wherein light incident upon a light shielding layer of the phase difference pixel forms at least two corner areas, and wherein an aperture shape of the light shielding layer of the phase difference pixel is a shape having at least two edges inset from the at least two corner areas. 11 . The solid-state image-capturing device according to claim 10 , wherein the aperture shape of the light shielding layer of the phase difference pixel is a polygonal shape. 12 . The solid-state image-capturing device according to claim 1 , wherein an aperture shape of a light shielding layer of the phase difference pixel is a semicircular shape. 13 . The solid-state image-capturing device according to claim 1 , wherein the plurality of pixels include a plurality of phase difference pixels having light shielding layers of different aperture widths. 14 . The solid-state image-capturing device according to claim 1 , wherein the plurality of pixels include a plurality of phase difference pixels having light shielding layers of different aperture directions. 15 . The solid-state image-capturing device according to claim 1 , wherein the phase difference pixel is a pixel for focal point detection and the image-capturing pixel which is a pixel for image generation. 16 . The solid-state image-capturing device according to claim 1 , wherein the layer formed in the phase difference pixel is a layer formed between a light shielding layer and a micro lens of the phase difference pixel. 17 . A production method for producing a solid-state image-capturing device having a plurality of pixels including a phase difference pixel and an image-capturing pixel, the method comprising: forming a light shielding layer in at least the image-capturing pixel; forming a first layer in the image-capturing pixel with a material having a higher refraction index than a refraction index of a first in the phase difference pixel; and forming a micro lens above the first layer. 18 . An electronic appliance comprising a solid-state image-capturing device including a pixel array unit having a plurality of pixels including a phase difference pixel and an image-capturing pixel arranged in a two-dimensional array; and a layer between a light shielding layer and a micro lens formed in the image-capturing pixel, wherein the layer between the light shielding layer and the micro lens formed in the image-capturing pixel has a higher refraction index than a refraction index of a layer formed in the phase difference pixel. 19 . An electronic appliance comprising a solid-state image-capturing device including a pixel array unit having a plurality of pixels including a phase difference pixel and an image-capturing pixel arranged in a two-dimensional array, wherein an aperture shape of a light shielding layer of the phase difference pixel is a shape for shielding light in areas in proximity to the four corners of a rectangular pixel area.
of coatings or optical elements · CPC title
Back-illuminated image sensors · CPC title
Colour filters · CPC title
Microlenses · CPC title
Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes · CPC title
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