Transmission channel for ultrasound applications

US2016332196A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016332196-A1
Application numberUS-201615220208-A
CountryUS
Kind codeA1
Filing dateJul 26, 2016
Priority dateDec 17, 2014
Publication dateNov 17, 2016
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A transmission channel transmits high-voltage pulses in a transmission phase and receives echoes of the high-voltage pulses in a receiving phase. The transmission channel includes a buffer with anti-memory circuitry to couple drain conduction terminals of buffer transistors of a high-side of a buffer of the transmission channel to a low-side reference voltage of a low-side of the buffer and couple drain conduction terminals of buffer transistors of the low-side of the buffer to a high-side reference voltage of the high-side of the buffer during the clamping phase.

First claim

Opening claim text (preview).

1 . A method, comprising: transmitting high-voltage pulses through a transmission channel in a transmission phase; coupling drain conduction terminals of buffer transistors of a high-side of a buffer of the transmission channel to a low-side reference voltage of a low-side of the buffer during a clamping phase; and coupling drain conduction terminals of buffer transistors of the low-side of the buffer to a high-side reference voltage of the high-side of the buffer during the clamping phase. 2 . The method of claim 1 , comprising: coupling the drain conduction terminals of the buffer transistors of the high-side of the buffer to the low-side reference voltage during a receiving phase; and coupling the drain conduction terminals of the buffer transistors of the low-side of the buffer to the high-side reference voltage during the receiving phase. 3 . The method of claim 2 , comprising: coupling the drain conduction terminals of the buffer transistors of the high-side of the buffer to the low-side reference voltage when a low-side buffer transistor is on; and coupling the drain conduction terminals of the buffer transistors of the low-side of the buffer to the high-side reference voltage when a high-side buffer transistor is on. 4 . The method of claim 1 , comprising: coupling the drain conduction terminals of the buffer transistors of the high-side of the buffer to the low-side reference voltage when a low-side buffer transistor is on; and coupling the drain conduction terminals of the buffer transistors of the low-side of the buffer to the high-side reference voltage when a high-side buffer transistor is on. 5 . The method of claim 3 wherein the buffer comprises: a first half-bridge including: a first high-side buffer transistor having a source terminal coupled to a first high-side voltage reference terminal; a first high-side buffer diode coupled between a drain terminal of the first high-side buffer transistor and a central buffer node; a first low-side buffer transistor having a source terminal coupled to a first low-side voltage reference terminal; and a first low-side buffer diode coupled between a drain terminal of the first low-side buffer transistor and the central buffer node; a second half-bridge including: a second high-side buffer transistor having a source terminal coupled to a second high-side voltage reference terminal; a second high-side buffer diode coupled between a drain terminal of the second high-side buffer transistor and the central buffer node; a second low-side buffer transistor having a source terminal coupled to a second low-side voltage reference terminal; and a second low-side buffer diode coupled between a drain terminal of the second low-side buffer transistor and the central buffer node; and anti-memory circuitry configured to: couple the drain terminal of the first high-side buffer transistor to at least one of the first low-side voltage reference terminal and the second low-side voltage reference terminal; couple the drain terminal of the first low-side buffer transistor to at least one of the first high-side voltage reference terminal and the second high-side voltage reference terminal; couple the drain terminal of the second high-side buffer transistor to at least one of the first low-side voltage reference terminal and the second low-side voltage reference terminal; and couple the drain terminal of the second low-side buffer transistor to at least one of the first high-side voltage reference terminal and the second high-side voltage reference terminal. 6 . A system, comprising: means for transmitting high-voltage pulses in a transmission phase; and means for coupling a high-side of the means for transmitting to a low-side reference voltage and coupling a low-side of the means for transmitting to a high-side reference voltage during a clamping phase. 7 . The system of claim 6 wherein the means for coupling is configured to: couple drain conduction terminals of buffer transistors of the high-side of the means for transmitting to the low-side reference voltage during a receiving phase; and couple drain conduction terminals of the buffer transistors of the low-side of the means for transmitting to the high-side reference voltage during the receiving phase. 8 . The system of claim 6 wherein the means for transmitting comprises: a first half-bridge including: a first buffer transistor having a first conduction terminal coupled to a first voltage reference terminal; a first buffer diode coupled between a second conduction terminal of the first buffer transistor and a central buffer node; a second buffer transistor having a first conduction terminal coupled to a second voltage reference terminal; and a second buffer diode coupled between a second conduction terminal of the second buffer transistor and the central buffer node; and a second half-bridge including: a third buffer transistor having a first conduction terminal coupled to a third voltage reference terminal; a third buffer diode coupled between a second conduction terminal of the third buffer transistor and the central buffer node; a fourth buffer transistor having a first conduction terminal coupled to a fourth voltage reference terminal; and a fourth buffer diode coupled between a second conduction terminal of the fourth buffer transistor and the central buffer node. 9 . The system of claim 8 wherein the means for coupling comprises: a first switch coupled between the second conduction terminal of the first buffer transistor and the second voltage reference terminal; a second switch coupled between the second conduction terminal of the third buffer transistor and the second voltage reference terminal; a third switch coupled between the second conduction terminal of the second buffer transistor and the first voltage reference terminal; and a fourth switch coupled between the second conduction terminal of the fourth buffer transistor and the first voltage reference terminal. 10 . The system of claim 9 wherein, the first buffer transistor is a P-MOS transistor and the second conduction terminal of the first buffer transistor is a drain of the first buffer transistor; the second buffer transistor is an N-MOS transistor and the second conduction terminal of the second buffer transistor is a drain of the second buffer transistor; the third buffer transistor is a P-MOS transistor and the second conduction terminal of the third buffer transistor is a drain of the third buffer transistor; and the fourth buffer transistor is an N-MOS transistor and the second conduction terminal of the fourth buffer transistor is a drain of the fourth buffer transistor. 11 . The system of claim 9 wherein the means for coupling comprises: a controller, which, in operation, generates control signals to: close the first, second, third and fourth switches during a clamping phase of operation; and close the first, second, third and fourth switches during a receiving phase of operation. 12 . The system of claim 11 wherein the controller, in operation, generates control signals to: close the first, second and fourth switches when the second buffer transistor is closed; close the first, second and third switches when the fourth buffer transistor is closed; close the second, third and fourth switches when the first buffer transistor is closed; and close the first, third and fourth switches when the third buffer transistor is closed. 13 . The system of claim 8 wherein the means for coupling comprises: a first switch having a first conduction terminal coupled to the second voltage reference termina

Assignees

Inventors

Classifications

  • B06B1/0215Primary

    for generating pulses, e.g. bursts of oscillations, envelopes · CPC title

  • High side switches, i.e. the higher potential [DC] or life wire [AC] being directly connected to the switch and not via the load · CPC title

  • in field-effect transistor switches · CPC title

  • with additional means for controlling the main nodes · CPC title

  • characterised by features of the ultrasound transducer · CPC title

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What does patent US2016332196A1 cover?
A transmission channel transmits high-voltage pulses in a transmission phase and receives echoes of the high-voltage pulses in a receiving phase. The transmission channel includes a buffer with anti-memory circuitry to couple drain conduction terminals of buffer transistors of a high-side of a buffer of the transmission channel to a low-side reference voltage of a low-side of the buffer and cou…
Who is the assignee on this patent?
St Microelectronics Srl
What technology area does this patent fall under?
Primary CPC classification B06B1/0215. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Thu Nov 17 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).