Method for determining a position of an object in a beam apparatus, computer program product and beam apparatus for carrying out the method
US-2024258068-A1 · Aug 1, 2024 · US
US2016307731A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016307731-A1 |
| Application number | US-201615190899-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 23, 2016 |
| Priority date | Jan 21, 2015 |
| Publication date | Oct 20, 2016 |
| Grant date | — |
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A method is provided for forming a three-dimensional article through successive fusion of parts of a powder bed. The method includes the steps of: applying a first powder layer on a work table; directing an electron beam from an electron beam source over the work table, the directing of the electron beam causing the first powder layer to fuse in first selected locations according to a pre-determined model, so as to form a first part of a cross section of the three dimensional article, and intensity modulating X-rays from the powder layer or from a clean work table with a patterned aperture modulator and a patterned aperture resolver, wherein a verification of at least one of a size, position, scan speed, or shape of the electron beam is achieved by comparing detected intensity modulated X-ray signals with saved reference values.
Opening claim text (preview).
1 . A method for forming a three-dimensional article through successive fusion of parts of a powder bed, which parts correspond to successive cross sections of the 3-dimensional article, said method comprising the steps of: providing a model of said 3-dimensional article; applying a first powder layer on a work table; directing an electron beam from an electron beam source over said work table, said directing of said electron beam causing said first powder layer to fuse in first selected locations according to said model, so as to form a first part of a cross section of said three dimensional article, and intensity modulating X-rays from said powder layer or from a clean work table with a patterned aperture modulator and a patterned aperture resolver, wherein a verification of at least one of a size, position, scan speed, or shape of the electron beam is achieved by comparing detected intensity modulated X-ray signals with saved reference values. 2 . The method according to claim 1 , wherein: said step of providing said model comprises storing said model within one or more memory storage areas; and one or more of said applying, directing, and intensity modulating steps are performed via at least one computer processor. 3 . The method according to claim 1 , wherein said X-rays are detected while fusing said three-dimensional article. 4 . The method according to claim 1 , wherein said X-rays are detected during application of powder material. 5 . The method according to claim 1 , wherein said X-rays are detected from a start plate before starting to manufacture said three-dimensional article. 6 . The method according to claim 1 , wherein said X-rays are detected during a preheating step for elevating said powder layer to a predetermined temperature interval. 7 . The method according to claim 1 , wherein said X-rays are detected at least once for each layer in the three-dimensional article. 8 . The method according to claim 1 , further comprising the steps of: adjusting at least one setting for controlling said electron beam in case of said deviation from a detected x-ray signal from a reference value being larger than a predetermined value; and repeating the intensity modulation and adjusting steps until said deviation is smaller than said predetermined value. 9 . The method according to claim 8 , wherein said reference value is achieved before starting the manufacture of the three-dimensional article from a reference pattern provided on a reference plate.
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