Treatment methods for silicon nanosheet surfaces
US-2024055265-A1 · Feb 15, 2024 · US
US2016300714A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016300714-A1 |
| Application number | US-201615095805-A |
| Country | US |
| Kind code | A1 |
| Filing date | Apr 11, 2016 |
| Priority date | Jan 15, 2008 |
| Publication date | Oct 13, 2016 |
| Grant date | — |
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A method and apparatus for depositing a film on a substrate includes a plasma source positioned proximate to a distributor configured to provide a semiconductor coating on a substrate.
Opening claim text (preview).
1 - 28 . (canceled) 29 . A method of depositing a material on a substrate comprising: providing a first power source configured to heat a distributor, the distributor configured to deposit a semiconductor coating on a substrate; providing a plasma source including an electrode that is electrically independent from the first power source; and exciting a plasma within a volume proximate to the distributor. 30 . The method of claim 29 , wherein the plasma source further comprises an additional electrode configured to bias the plasma with respect to the substrate. 31 . The method of claim 29 , wherein the electrode includes a non-metallic material. 32 . The method of claim 29 , wherein the electrode includes carbon. 33 . The method of claim 29 , wherein the electrode is a backcap over the distributor. 34 . The method of claim 33 , wherein the backcap is a graphite backcap. 35 . The method of claim 29 , wherein the distributor includes a pair of sheath tubes including a first sheath tube and a second sheath tube. 36 . The method of claim 35 , wherein the electrode is a spacer between the first sheath tube and the second sheath tube. 37 . The method of claim 36 , wherein the spacer is a graphite spacer. 38 . The method of claim 35 , wherein the electrode is a backcap over the first sheath tube and the second sheath tube. 39 . The method of claim 29 , wherein the distributor includes a pair of sheath tubes including a first sheath tube and a second sheath tube, and the plasma source includes three graphite components electrically isolated from one another. 40 . The method of claim 39 , wherein the first graphite component is a first spacer separating the first sheath tube from the second sheath tube, the second graphite component is a second spacer separating the first sheath tube from the second sheath tube, and the third graphite component is a backcap over the first sheath tube and the second sheath tube. 41 . The method of claim 40 , further comprising an insulator between the backcap and each of the spacers. 42 . The method of claim 29 , wherein the distributor includes at least one distribution hole configured to provide a semiconductor coating on a substrate. 43 . The method of claim 29 , wherein the plasma source is driven by direct current. 44 . The method of claim 29 , wherein the plasma source is driven by alternating current. 45 . The method of claim 29 , wherein the plasma source is driven by pulsed direct current. 46 . The method of claim 29 , wherein the plasma source is driven by radiofrequency electrical excitation. 47 . The method of claim 29 , further comprising a conveyor configured to transport the substrate past the distributor. 48 . The method of claim 29 , wherein the distributor is positioned within a deposition chamber, the deposition chamber including an entry through which the substrates to be coated are introduced into the deposition chamber; and the deposition chamber including an exit through which the coated substrates leave the deposition chamber. 49 . The method of claim 29 , wherein the distributor includes a ceramic tube. 50 . The method of claim 29 , wherein the distributor includes mullite tube. 51 . The method of claim 29 , wherein the distributor includes a ceramic sheath tube. 52 . The method of claim 29 , further comprising a heater positioned within the distributor. 53 . The method of claim 29 , wherein the plasma source is configured to generate plasma in a region less than 10 centimeters from a substrate. 54 . The method of claim 29 , wherein the plasma source is configured to generate plasma in a region less than 7 centimeters from a substrate. 55 . The method of claim 29 , wherein the plasma source is configured to generate plasma in a region less than 5 centimeters from a substrate. 56 . The method of claim 29 , wherein the plasma source is configured to generate plasma in a region less than 2 centimeters from a substrate.
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