Temperature Probe and Method for Producing a Temperature Probe

Patent metadata

Field	Value
Publication number	US-2016299011-A1
Application number	US-201314442346-A
Country	US
Kind code	A1
Filing date	Sep 27, 2013
Priority date	Nov 12, 2012
Publication date	Oct 13, 2016
Grant date	—

Abstract

The invention relates to a temperature probe comprising two first ceramic plates, a second ceramic plate arranged between the first ceramic plates, and two third ceramic plates. Each of the two first ceramic plates comprises an opening in each in which an NTC sensor element is arranged. An electrode is arranged between the second ceramic plate and each of the first ceramic plates. The first and the second ceramic plates are arranged between the two third ceramic plates. An electrode is arranged between each third ceramic plate and a first ceramic plate. Each electrode electrically contacts an NTC sensor element. Each NTC sensor element is enclosed by ceramic plates. The first, the second and the third ceramic plates and the NTC sensor elements are sintered to form a ceramic body. The invention further relates to a method for producing a temperature probe.

First claim

1 - 15 . (canceled)

16 . A temperature probe, comprising:
two first ceramic plates each having an opening in which an NTC sensor element is arranged; a second ceramic plate arranged between the first ceramic plates wherein an electrode is arranged between the second ceramic plate and each of the two first ceramic plates, and wherein the electrodes each electrically contact an NTC sensor element of a first ceramic plate; and two third ceramic plates, wherein the first and the second ceramic plates are arranged between the two third ceramic plates, and wherein an electrode is arranged between each of the third ceramic plates and a first ceramic plate, the electrodes each electrically contacting an NTC sensor element of a first ceramic plate; wherein the NTC sensor elements are each completely enclosed by ceramic plates and wherein the first, the second, and the third ceramic plates and the NTC sensor elements are formed into a ceramic body by sintering ceramic films and ceramic sensor elements.

17 . The temperature probe according to claim 16 , comprising:
a plurality of at least three first ceramic plates each having an opening in which an NTC sensor element is arranged; and a plurality of second ceramic plates, wherein each second ceramic plate is arranged directly between two first ceramic plates and an electrode for contacting the NTC sensor elements is arranged between each second ceramic plate and each of the two first ceramic plates between which the second ceramic plate is arranged, and wherein the first and second ceramic plates are arranged between the third ceramic plates.

18 . The temperature probe according to claim 16 , further comprising two fourth ceramic plates, wherein the first, second, and third ceramic plates are arranged between the two fourth ceramic plates, and wherein the two fourth ceramic plates are formed jointly with the first, second, and third ceramic plates and the NTC sensor elements by sintering ceramic films and ceramic sensor materials to form a ceramic body.

19 . The temperature probe according claim 16 , wherein the NTC sensor elements have one of the following structures: a perovskite structure comprising the elements Y, Ca, Cr, Al, and O, or a spinel structure comprising the elements Ni, Co, Mn, and O.

20 . The temperature probe according to claim 19 , wherein the NTC sensor elements have a perovskite structure having the formula (Y 1-x Ca x ) (Cr 1-y Al y )O 3 with x=0.03 to 0.05 and y=0.85.

21 . The temperature probe according to claim 19 , wherein the NTC sensor elements have a spinel structure having the formula Co 3-(x+y) Ni x Mn y O 4 with x=1.32 and y=1.32.

22 . The temperature probe according to claim 16 , wherein the first, second, and third ceramic plates comprise aluminum oxide or a glass ceramic.

23 . The temperature probe according claim 16 , further comprising two terminal caps applied to the ceramic body, wherein each terminal cap is electrically connected to at least two electrodes.

24 . The temperature probe according to claim 16 , wherein the first, second and third ceramic plates have a thickness between 10 μm and 100 μm.

25 . A method for producing a temperature probe, comprising:
arranging ceramic sensor materials in an opening in each of two first ceramic films; arranging a second ceramic film between the two first ceramic films; arranging an electrode between the second ceramic film and each of the two first ceramic films between which the second ceramic film is arranged, wherein the electrodes each electrically contact ceramic sensor material arranged in a first ceramic film; arranging the first and the second ceramic films between two third ceramic films; arranging an electrode between each of the third ceramic films and a first ceramic film, the electrodes each electrically contacting ceramic sensor material arranged in a first ceramic film, wherein the ceramic sensor materials are each completely enclosed by ceramic films; and sintering the first, the second, and the third ceramic films and the ceramic sensor material to form a ceramic body comprising first, second and third ceramic films and NTC sensor elements.

26 . The method according to claim 25 , further comprising applying at least two terminal caps to the ceramic body and connecting the NTC sensor elements in parallel using the terminal caps.

27 . The method according to claim 25 , wherein the two terminal caps are applied using one of the following methods: partially immersing the ceramic body in a metallization paste, sputtering, flame spraying, or plasma spraying.

28 . The method according to claim 26 , wherein the resistance of the temperature probe is set by mechanical machining of one of the terminal caps.

29 . The method according to claim 28 , wherein the mechanical machining of the terminal cap is performed by grinding or trimming.

30 . The method according to claim 25 , wherein the ceramic plates are produced by a film casting process or a film drawing process.

31 . A method for producing a temperature probe, comprising:
arranging ceramic sensor materials in an opening in each of two first ceramic films; arranging a second ceramic film between the two first ceramic films; arranging an electrode between the second ceramic film and each of the two first ceramic films between which the second ceramic film is arranged, wherein the electrodes each electrically contact ceramic sensor material arranged in a first ceramic film; arranging the first and the second ceramic films between two third ceramic films; arranging an electrode between each of the third ceramic films and a first ceramic film, the electrodes each electrically contacting ceramic sensor material arranged in a first ceramic film, wherein the ceramic sensor materials are each completely enclosed by ceramic films; arranging the first, second and third ceramic films between two fourth ceramic films; and sintering the first, the second, third and the fourth ceramic films and the ceramic sensor material to form a ceramic body comprising first, second, third and fourth ceramic films and NTC sensor elements.

32 . The method according to claim 31 , wherein the NTC sensor elements have one of the following structures: a perovskite structure comprising the elements Y, Ca, Cr, Al, and O, or a spinel structure comprising the elements Ni, Co, Mn, and O.

33 . The method according to claim 31 , wherein the NTC sensor elements have a perovskite structure having the formula (Y 1-x Ca x ) (Cr 1-y Al y )O 3 with x=0.03 to 0.05 and y=0.85.

34 . The method according to claim 31 , wherein the NTC sensor elements have a spinel structure having the formula Co 3-(x+y) Ni x Mn y O 4 with x=1.32 and y=1.32.

Assignees

• Epcos Ag

Inventors

• Ihle Jan
• Kloiber Gerald

Classifications

• G01K1/08 Primary

  Protective devices, e.g. casings · CPC title

• G01K7/22

  the element being a non-linear resistance, e.g. thermistor (G01K7/26 takes precedence) · CPC title