Systems and Methods for Producing Carbon Solids
US-2024417566-A1 · Dec 19, 2024 · US
US2016293668A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016293668-A1 |
| Application number | US-201514744132-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jun 19, 2015 |
| Priority date | Mar 31, 2015 |
| Publication date | Oct 6, 2016 |
| Grant date | — |
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A transistor device includes an array of fin structures arranged on a substrate, each of the fin structures being vertically alternating stacks of a first isoelectric point material having a first isoelectric point and a second isoelectric point material having a second isoelectric point that is different than the first isoelectric point; one or more carbon nanotubes (CNTs) suspended between the fin structures and contacting a side surface of the second isoelectric point material in the fin structures; a gate wrapped around the array of CNTs; and source and drain contacts arranged over the fin structures; wherein each of the fin structures have a trapezoid shape or parallel sides that are oriented about 90° with respect to the substrate.
Opening claim text (preview).
1 . A method of making a transistor device, the method comprising: forming an array of fin structures, the array of fin structures being arranged on a substrate and each having a pair of layers, the pair of layers comprising a first isoelectric point material having a first isoelectric point and a second isoelectric point material having a second isoelectric point that is different than the first isoelectric point; wrapping a gate around carbon nanotubes (CNTs) between the fin structures to suspend the CNTs in the gate, the CNTs contacting a side surface of the second isoelectric point material in the fin structures; and forming source and drain contacts over the fin structures; wherein the CNTs are arranged in a substantially vertical array or a non-vertical tapered array within the gate, and the gate comprises a metal gate material separated from the source and drain contacts by a gate spacer and a gate dielectric material. 2 . The method of claim 1 , wherein a gate dielectric material surrounds the CNTs and is hafnium oxide, aluminum oxide, or a combination thereof. 3 . The method of claim 1 , wherein the CNTs are anchored in the source and drain contacts. 4 . (canceled) 5 . The method of claim 1 , wherein each of the fin structures have a width that is less than a length of the fin structure. 6 . The method of claim 1 , wherein the CNTs contact the second isoelectric point material by an electrostatic interaction. 7 . The method of claim 1 , further comprising a positively charged surface monolayer selectively assembled on the second dielectric point material. 8 .- 12 . (canceled)
Carbon nanotubes, CNTs · CPC title
Field effect transistors, FETS, with nanowire- or nanotube-channel region · CPC title
Manufacture or treatment of nanostructures · CPC title
Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic · CPC title
for carbon nanotubes or fullerenes · CPC title
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