Temperature Dependent Voltage To Unselected Drain Side Select Transistor During Program Of 3D NAND

Patent metadata

Field	Value
Publication number	US-2016293266-A1
Application number	US-201514964884-A
Country	US
Kind code	A1
Filing date	Dec 10, 2015
Priority date	Mar 30, 2015
Publication date	Oct 6, 2016
Grant date	—

Abstract

Techniques are provided for reducing program disturb in a 3D memory device. The techniques include compensating for a temperature dependence of program disturb. The techniques may include compensating for how program disturb depends on the location of the word line that is selected for programming. In one aspect, the voltage that is applied to the control gates drain side select transistors of unselected NAND strings is adjusted during programming based on temperature. Greater temperature compensation may be applied when the selected word line is closer to the drain side select transistors.

First claim

1 . A non-volatile storage device, comprising:
a plurality of word lines; a plurality of bit lines; a plurality of NAND strings in a three dimensional memory array, each of the NAND strings comprising a drain side select transistor coupled to a bit line of the plurality of bit lines, each of the NAND strings being associated with a group of the plurality of word lines; and managing circuitry in communication with the plurality of word lines, the plurality of bit lines, and the drain side select transistors of the plurality of NAND strings, wherein the managing circuitry is configured to generate an unselect voltage that has a magnitude that depends on temperature and location of a selected word line along an unselected NAND string, wherein the managing circuitry is configured to apply the unselect voltage to a control gate of the drain side select transistor of the unselected NAND string while a programming voltage is applied to the selected word line, while a boosting voltage is applied to unselected word lines associated with the unselected NAND string, and while a voltage is applied to a bit line associated with the unselected NAND string.

2 . The non-volatile storage device of claim 1 , wherein the managing circuitry is configured to generate a first unselect voltage when the selected word line is the closest data word line to the drain side select transistor and a second unselect voltage when the selected word line is several data word lines away from the drain side select transistor, wherein the first unselect voltage provides greater temperature compensation than the second unselect voltage.

3 . The non-volatile storage device of claim 1 , wherein the managing circuitry is configured to generate the unselect voltage using a first temperature coefficient when the selected word line is in a first zone and to generate the unselect voltage using a second temperature coefficient when the selected word line is in a second zone, wherein the first temperature coefficient provides greater temperature compensation than the second temperature coefficient, wherein the first zone is closer to the drain side select transistor than the second zone.

4 . The non-volatile storage device of claim 1 , wherein the managing circuitry being configured to generate the unselect voltage comprises the managing circuitry being configured to generate the unselect voltage having a magnitude that provides a linear temperature compensation to the drain side select transistor of the unselected NAND string, wherein the linear temperature compensation varies linearly with respect to temperature across all operating temperatures.

5 . The non-volatile storage device of claim 1 , wherein the managing circuitry is configured to generate the unselect voltage that has a first temperature coefficient below a breakpoint temperature and to generate the unselect voltage that has a second temperature coefficient above the breakpoint temperature, wherein the first temperature coefficient provides greater temperature compensation to the drain side select transistor of the unselected NAND string than the second temperature coefficient.

6 . The non-volatile storage device of claim 1 , wherein the managing circuitry is configured to apply a program inhibit voltage to the bit line associated with the unselected NAND string while the managing circuitry applies the unselect voltage to the control gate of the drain side select transistor of the unselected NAND string, wherein the unselect voltage applied to the gate of the drain side select transistor keeps the drain side select transistor off.

7 . The non-volatile storage device of claim 1 , wherein the bit line associated with the unselected NAND string is a selected bit line, wherein the unselect voltage applied to the gate of the drain side select transistor keeps the drain side select transistor off.

8 . The non-volatile storage device of claim 1 , wherein the managing circuitry is configured to apply a program enable voltage to the bit line associated with the unselected NAND string while the managing circuitry applies the unselect voltage to the control gate of the drain side select transistor of the unselected NAND string.

9 . The non-volatile storage device of claim 1 , wherein the managing circuitry configured to generate an unselect voltage that has a magnitude that depends on temperature comprises the managing circuitry configured to increase the magnitude of the unselect voltage as temperature decreases.

10 . A method comprising:
generating an unselect voltage that has a magnitude that depends on temperature and location of a selected word line along an unselected NAND string in a three-dimensional memory array, wherein the magnitude of the unselect voltage is based on temperature and on location of the selected word line relative to a drain side select transistor of the unselected NAND; and applying the unselect voltage to a control gate of the drain side select transistor of the unselected NAND string while a programming voltage is applied to the selected word line, while a boosting voltage is applied to unselected word lines associated with the unselected NAND string, and while a voltage is applied to a bit line associated with the unselected NAND string, wherein the unselect voltage cuts off the unselected NAND string from a bit line associated with the unselected NAND string.

11 . The method of claim 10 , wherein the magnitude of the unselect voltage provides a greatest amount of temperature compensation to the drain side select transistor of the unselected NAND string when the selected word line is the closest data word line to the drain side select transistor.

12 . The method of claim 10 , wherein the unselect voltage is linear with respect to temperature, wherein temperature compensation varies linearly with respect to temperature across all operating temperatures.

13 . The method of claim 10 , wherein applying the unselect voltage to the control gate of the drain side select transistor of the unselected NAND string comprises:
applying a first temperature compensation scheme below a breakpoint temperature; and applying a second temperature compensation scheme above the breakpoint temperature.

14 . The method of claim 13 , wherein applying the first temperature compensation scheme increases the magnitude of the unselect voltage as temperature decreases, wherein applying the second temperature compensation scheme keeps the unselect voltage greater than or equal to zero volts.

15 . The method of claim 10 , wherein applying the unselect voltage to the control gate of the drain side select transistor of the unselected NAND string comprises:
applying a first temperature compensation scheme when the selected word line is a data word line closest to the drain side select transistor; and applying a second temperature compensation scheme when the selected word line is several word lines away from the drain side select transistor, wherein the first temperature compensation scheme provides greater temperature compensation than the second temperature compensation scheme.

16 . The method of claim 10 , further comprising:
applying a program enable voltage to the bit line associated with the unselected NAND string while applying the unselect voltage to the control gate of the drain side select transistor of the unselected NAND string, wherein the bit line associated with the unselected NAND string is also associated with a selected NAND string.

17 . The method of claim 10 , further comprising:
applying a program inhibit voltage to the bit line associate

Assignees

• Sandisk Technologies Inc

Inventors

• Chen Jian
• Dong Yingda
• Yuan Jiahui

Classifications

• G11C16/10

  Programming or data input circuits · CPC title

• G11C16/3418

  Disturbance prevention or evaluation; Refreshing of disturbed memory data · CPC title

• G11C16/0483

  comprising cells having several storage transistors connected in series · CPC title

• G11C16/3427 Primary

  Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written · CPC title

• G11C11/5628

  Programming or writing circuits; Data input circuits · CPC title