Systems and methods for pulse width modulated control of a semiconductor switch

Patent metadata

Field	Value
Publication number	US-2016285448-A1
Application number	US-201514670818-A
Country	US
Kind code	A1
Filing date	Mar 27, 2015
Priority date	Mar 27, 2015
Publication date	Sep 29, 2016
Grant date	—

Abstract

Pulse width modulated controller systems. Implementations may include: a microcontroller coupled with a memory, a switch controller coupled with the microcontroller, and a calibration unit. The calibration unit may include one or more comparators, one or more passive electrical components, and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller where the at least one comparator and the one or more passive electrical components are electrically coupled with a supply voltage to the semiconductor switch and with a load voltage (output voltage) from the semiconductor switch.

First claim

What is claimed is:

1 . A pulse width modulated controller system for a semiconductor switch, the system comprising:
a microcontroller coupled with a memory; a switch controller coupled with the microcontroller; and a calibration unit, the calibration unit comprising:
one or more comparators, one or more passive electrical components, and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller;
wherein the one or more comparators and the one or more passive electrical components are electrically coupled with a supply voltage to the semiconductor switch and with an output voltage from the semiconductor switch.

2 . The system of claim 1 , wherein the switch controller comprises a control logic and a memory operatively coupled together and operatively coupled with a semiconductor switch.

3 . The system of claim 1 , wherein the memory coupled to the microcontroller comprises a digitally stored model comprising one or more control parameters for generating a control signal for the semiconductor switch.

4 . The system of claim 1 , wherein the memory coupled to the microcontroller comprises a look-up table comprising one or more model parameters for use by the microcontroller to calculate one or more control parameters for generating a control signal for the semiconductor switch.

5 . The system of claim 3 , wherein the microcontroller is configured to receive one or more operating condition parameters, and, using one or more operating condition parameters and the digitally stored model, to generate control parameters for generating the control signal for the semiconductor switch.

6 . The system of claim 5 , further comprising at least two comparators wherein the microcontroller is configured to send a calibration trigger signal to the encoder logic of the calibration unit, and, in response, the calibration unit is configured to:
using a first one of the at least two comparators, generate a first comparator output for a switching-on operation of the semiconductor switch; using a second one of the at least two comparators, generate a second comparator output for a switching-off operation of the semiconductor switch; generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and send the status signal to the microcontroller.

7 . The system of claim 6 , wherein the microcontroller is further configured to, in response to receiving the status signal, adjust one or more of the one or more control parameters of the digital model stored in the memory coupled to the microcontroller.

8 . The system of claim 6 , wherein the microcontroller is configured to generate the calibration trigger signal on a predetermined time interval.

9 . The system of claim 6 , wherein the microcontroller is configured to generate the calibration trigger signal after analyzing one of a current value of one or more operating condition parameters and a development of values of one or more operating condition parameters over a period of time.

10 . The system of claim 6 , wherein the microcontroller is not configured to generate the calibration trigger signal after each switching operation of the semiconductor switch.

11 . The system of claim 1 , wherein the switch controller further comprises a serial peripheral interface (SPI), a gate driver, and a charge pump unit all operatively coupled together and operatively coupled with the semiconductor switch.

12 . A pulse width modulated controller system for a semiconductor switch, the system comprising:
a microcontroller coupled with a memory, the memory comprising a look-up table comprising one or more model parameters; a switch controller coupled with the microcontroller and with a semiconductor switch, the switch controller comprising a control logic; and a calibration unit, the calibration unit comprising:
one or more comparators, one or more passive electrical components, and an encoder logic all operatively coupled together and coupled with the microcontroller and with the switch controller;
wherein the one or more comparators and the one or more passive electrical components are electrically coupled with a supply voltage to the semiconductor switch and with a load voltage from the semiconductor switch; and wherein the microcontroller is configured to receive one or more operating condition parameters, and, using one or more operating condition parameters and the look-up table, to generate control parameters for generating the control signal for the semiconductor switch.

13 . The system of claim 12 , further comprising at two or more comparators and wherein the microcontroller is configured to send a calibration trigger signal to the encoder logic of the calibration unit, and, in response, the calibration unit is configured to:
using a first one of the two or more comparators, generate a first comparator output for a switching-on operation of the semiconductor switch; using a second one of the two or more comparators, generate a second comparator output for a switching-off operation of the semiconductor switch; generate a status signal using the encoder logic using one of the first comparator output, the second comparator output, and both the first comparator output and the second comparator output; and send the status signal to the microcontroller.

14 . The system of claim 13 , wherein the microcontroller is further configured to, in response to receiving the status signal, change one or more of the one or more model parameters comprised in the look-up table stored in the memory coupled to the microcontroller.

15 . The system of claim 13 , wherein the microcontroller is configured to generate the calibration trigger signal on a predetermined time interval.

16 . The system of claim 13 , wherein the microcontroller is configured to generate the calibration trigger signal after analyzing one of a current value of the one or more operating condition parameters and a development of values of the one or more operating condition parameters over a period of time.

17 . The system of claim 13 , wherein the microcontroller is not configured to generate the calibration trigger signal after each switching operation of the semiconductor switch.

18 . A method of controlling a semiconductor switch, the method comprising:
storing one or more model parameters in a look-up table comprised in memory coupled with a control logic and with a microcontroller; receiving one or more operating condition parameters using the microcontroller; in response to receiving one or more operating condition parameters, retrieving one or more of the one or more model parameters in the look-up table and generating one or more control parameters using the microcontroller and using the one or more operating condition parameters; generating a control signal for a semiconductor switch using the one or more control parameters and the control logic; providing a calibration trigger signal to a calibration unit using the microcontroller; in response to receiving the calibration trigger signal, evaluating a switching-on operation of the semiconductor switch using one or more comparators and one or more passive electrical components comprised in a calibration unit coupled with the microcontroller by generating a switching-on output through comparing a value of an output voltage from the semiconductor switch with a predetermined switching-on volt

Assignees

• Semiconductor Components Ind Llc
• Conti Temic Microelectronic Gmbh

Inventors

• Fugere Robert H
• Talan Andrew
• Connolly Daniel P
• Joos Uli
• Stuhler Norbert

Classifications

• H03K2217/0063

  High side switches, i.e. the higher potential [DC] or life wire [AC] being directly connected to the switch and not via the load · CPC title

• H03K17/14

  Modifications for compensating variations of physical values, e.g. of temperature · CPC title

• H03K17/165 Primary

  by feedback from the output circuit to the control circuit · CPC title

• H03K19/1733

  Controllable logic circuits (H03K19/177 takes precedence) · CPC title

• H03K17/166

  Soft switching · CPC title