Iii-v compound and germanium compound nanowire suspension with germanium-containing release layer

US2016284805A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016284805-A1
Application numberUS-201615181680-A
CountryUS
Kind codeA1
Filing dateJun 14, 2016
Priority dateMar 24, 2015
Publication dateSep 29, 2016
Grant date

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A device that includes: a substrate layer; a first set of source/drain component(s) defining an nFET (n-type field-effect transistor) region; a second set of source/drain component(s) defining a pFET (p-type field-effect transistor) region; a first suspended nanowire, at least partially suspended over the substrate layer in the nFET region and made from III-V material; and a second suspended nanowire, at least partially suspended over the substrate layer in the pFET region and made from Germanium-containing material. In some embodiments, the first suspended nanowire and the second suspended nanowire are fabricated by adding appropriate nanowire layers on top of a Germanium-containing release layer, and then removing the Germanium-containing release layers so that the nanowires are suspended.

First claim

Opening claim text (preview).

1 - 18 . (canceled) 19 . A semiconductor device comprising: a substrate layer; a first set of source/drain component(s) defining an nFET (n-type field-effect transistor) region in the substrate layer; a second set of source/drain component(s) defining a pFET (p-type field-effect transistor) region in the substrate layer; a first suspended nanowire, at least partially suspended over the substrate layer in the nFET region, made from III-V material, and electrically connected to act as a gate for the first set of source/drain component(s); and a second suspended nanowire, at least partially suspended over the substrate layer in the pFET region, made from Silicon-Germanium (SiGe), and electrically connected to act as a gate for the second set of source/drain component(s).

Assignees

Inventors

Classifications

  • having one-dimensional [1D] charge carrier gas channels, e.g. quantum wire FETs or transistors having 1D quantum-confined channels · CPC title

  • Manufacturing their channels · CPC title

  • Complementary IGFETs, e.g. CMOS · CPC title

  • using silicon technology, e.g. SiGe · CPC title

  • using combinations of technologies, e.g. using both Si and SiC technologies or using both Si and Group III-V technologies · CPC title

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What does patent US2016284805A1 cover?
A device that includes: a substrate layer; a first set of source/drain component(s) defining an nFET (n-type field-effect transistor) region; a second set of source/drain component(s) defining a pFET (p-type field-effect transistor) region; a first suspended nanowire, at least partially suspended over the substrate layer in the nFET region and made from III-V material; and a second suspended na…
Who is the assignee on this patent?
IBM
What technology area does this patent fall under?
Primary CPC classification H10D84/0167. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Sep 29 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).