Multi-layer ceramic capacitor and method of manufacturing the same
US-2015070817-A1 · Mar 12, 2015 · US
US2016284473A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016284473-A1 |
| Application number | US-201615082814-A |
| Country | US |
| Kind code | A1 |
| Filing date | Mar 28, 2016 |
| Priority date | Mar 27, 2015 |
| Publication date | Sep 29, 2016 |
| Grant date | — |
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A multilayer ceramic electronic device comprising: a ceramic element body, in which a plurality of dielectric layers and a plurality of internal electrode layers are alternately stacked, and at least a pair of external electrodes which are connected to the internal electrode layers on surfaces of the ceramic element body; a thickness of the dielectric layers is 0.4 μm or less, a width (W 0 ) of the ceramic element body along a width-direction is 0.59 mm or less, a gap (Wgap) between an outer face of the ceramic element body and an end of the internal electrode layers along width-direction of the ceramic element body is 0.010 to 0.025 mm, and a ratio (Wgap/W 0 ) of the gap with respect to the width is 0.025 or more.
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What is claimed is: 1 . A multilayer ceramic electronic device comprising: a ceramic element body, in which a plurality of dielectric layers and a plurality of internal electrode layers are alternately stacked, and at least a pair of external electrodes which are connected to the internal electrode layers on surfaces of the ceramic element body, wherein a thickness of the dielectric layers is 0.4 μm or less, a width (W 0 ) of the ceramic element body along a width-direction is 0.59 mm or less, a gap (Wgap) between an outer face of the ceramic element body and an end of the internal electrode layers along width-direction of the ceramic element body is 0.010 to 0.025 mm, and a ratio (Wgap/W 0 ) of the gap with respect to the width is 0.025 or more. 2 . The multilayer ceramic electronic device as set forth in claim 1 , wherein a ratio (te/td) of a thickness (td) of the internal electrode layers with respect to a thickness (te) of the dielectric layers is preferably 1.05 or less. 3 . The multilayer ceramic electronic device as set forth in claim 1 , wherein Dg/Di≧1 is satisfied, in case that an average grain size of the first dielectric grains constituting the dielectric layer placed between the internal electrode layers along the laminating direction is Di and an average grain size of the second dielectric grains in an exterior area placed outside of the laminating direction of an interior area, in which the internal electrode layers are laminated interposing the dielectric layers along the laminating direction, is Dg. 4 . The multilayer ceramic electronic device as set forth in claim 2 , wherein Dg/Di≧1 is satisfied, in case that an average grain size of the first dielectric grains constituting the dielectric layer placed between the internal electrode layers along the laminating direction is Di and an average grain size of the second dielectric grains in an exterior area placed outside of the laminating direction of an interior area, in which the internal electrode layers are laminated interposing the dielectric layers along the laminating direction, is Dg. 5 . The multilayer ceramic electronic device as set forth in claim 1 , wherein Dh/Di≧1 is satisfied, in case that the average grain size of the first dielectric grains constituting the dielectric layers placed between the internal electrode layers along the laminating direction is Di, and an average grain size of the third dielectric grains constituting a lead-out area placed between the lead-out parts of the internal electrode layers connected to either one of the external electrodes is Dh. 6 . The multilayer ceramic electronic device as set forth in claim 2 , wherein Dh/Di≧1 is satisfied, in case that the average grain size of the first dielectric grains constituting the dielectric layers placed between the internal electrode layers along the laminating direction is Di, and an average grain size of the third dielectric grains constituting a lead-out area placed between the lead-out parts of the internal electrode layers connected to either one of the external electrodes is Dh. 7 . The multilayer ceramic electronic device as set forth in claim 3 , wherein Dh/Di≧1 is satisfied, in case that the average grain size of the first dielectric grains constituting the dielectric layers placed between the internal electrode layers along the laminating direction is Di, and an average grain size of the third dielectric grains constituting a lead-out area placed between the lead-out parts of the internal electrode layers connected to either one of the external electrodes is Dh. 8 . The multilayer ceramic electronic device as set forth in claim 4 , wherein Dh/Di≧1 is satisfied, in case that the average grain size of the first dielectric grains constituting the dielectric layers placed between the internal electrode layers along the laminating direction is Di, and an average grain size of the third dielectric grains constituting a lead-out area placed between the lead-out parts of the internal electrode layers connected to either one of the external electrodes is Dh.
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