Spin transfer torque magnetic memory device
US-9281040-B2 · Mar 8, 2016 · US
US2016284394A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016284394-A1 |
| Application number | US-201415036666-A |
| Country | US |
| Kind code | A1 |
| Filing date | Sep 19, 2014 |
| Priority date | Nov 15, 2013 |
| Publication date | Sep 29, 2016 |
| Grant date | — |
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A spin electronic memory of the present invention includes: a pair of electrodes 1, 2 , recording layers 6 a, 6 b , and 6 c between the electrodes 1 and 2 , the recording layer being formed by laminating first alloy layer 5 and second alloy layer 4 , the first alloy layer 5 being formed to contain any one of SbTe, Sb 2 Te 3 , BiTe, Bi 2 Te 3 , BiSe, and Bi 2 Se 3 as a principal component and to have a thickness of 2 nm to 10 nm, the second alloy layer 4 being formed to contain an alloy expressed by general formula (1) as a principal component; and spin injection layer 7 formed with a magnetic material to inject a spin into the recording layer with the magnetic material being magnetized, M 1-x Te x (1) where M represents an atom selected from atoms of Ge, Al, and Si, and x represents a value of 0.5 or more and less than 1.
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1 . A spin electronic memory comprising: a pair of electrodes; a recording layer disposed between the electrodes, the recording layer being formed by laminating a first alloy layer and a second alloy layer, the first alloy layer being formed to contain any one of SbTe, Sb 2 Te 3 , BiTe, Bi 2 Te 3 , BiSe, and Bi 2 Se 3 as a principal component and to have a thickness of 2 nm to 10 nm, the second alloy layer being formed to contain an alloy expressed by a following general formula (1) as a principal component; and a spin injection layer formed with a magnetic material and configured to inject a spin into the recording layer with the magnetic material being magnetized, M 1-x Te x (1) where M represents an atom selected from atoms of Ge, Al, and Si, and x represents a value of 0.5 or more and less than 1. 2 . The spin electronic memory according to claim 1 , wherein at least two or more of the recording layer are laminated and disposed. 3 . The spin electronic memory according to claim 1 , wherein the first alloy layer has a hexagonal crystal structure, and the second alloy layer has a cubic crystal structure, and a c-axis of the first alloy layer is oriented in a laminating direction, and a (111) plane of the second alloy layer is oriented along an adjacent surface adjacent to the first alloy layer. 4 . The spin electronic memory according to claim 1 , wherein the second alloy layer is formed to contain GeTe as a principal component. 5 . The spin electronic memory according to claim 1 , wherein the second alloy layer has a thickness of more than 0 and 4 nm or less. 6 . The spin electronic memory according to claim 1 , further comprising an orientation layer disposed as a base of the second alloy layer to orient a lamination plane of the second alloy layer laminated thereon along a (111) plane. 7 . The spin electronic memory according to claim 6 , wherein the orientation layer has a composition and a crystal structure identical to those of the first alloy layer. 8 . The spin electronic memory according to claim 1 , further comprising a magnetic section configured to form a magnetic field in a direction perpendicular to a plane of the spin injection layer to inject a spin into the recording layer through the spin injection layer. 9 . A method for recording information using a spin electronic memory, the method comprising applying voltage having voltage values staged into n stages to n recording layers laminated, the voltage values being necessary for accumulating a spin in a saturated state in each of the recording layers, where n is an integer of at least 1 or more, wherein the spin electronic memory comprises: a pair of electrodes; a recording layer disposed between the electrodes, the recording layer being formed by laminating a first alloy layer and a second alloy layer, the first alloy layer being formed to contain an one of SbTe, Sb 2 Te 3 , BiTe, Bi 2 Te 3 , BiSe, and Bi 2 Se 3 as a principal component and to have a thickness of 2 nm to 10 nm, the second alloy layer being formed to contain an alloy expressed by a following general formula (1) as a principal component; and a spin injection layer formed with a magnetic material and configured to inject a spin into the recording layer with the magnetic material being magnetized, M 1-x Te x (1) where M represents an atom selected from atoms of Ge, Al, and Si, and x represents a value of 0.5 or more and less than 1. 10 . A method for reproducing information using a spin electronic memory, the method comprising measuring a status value of one of a resistance value and an optical reflectance of n recording layers laminated, and determining, based on the status value, number of the recording layers having information recorded thereon in the recording layers laminated, where n is an integer of at least 1 or more. wherein the spin electronic memory comprises: a pair of electrodes; a recording layer disposed between the electrodes, the recording layer being formed by laminating a first alloy layer and a second alloy layer, the first alloy layer being formed to contain an one of SbTe, Sb 2 Te 3 , BiTe, Bi 2 Te 3 , BiSe, and Bi 2 Se 3 as a principal component and to have a thickness of 2 nm to 10 nm, the second alloy layer being formed to contain an alloy expressed by a following general formula (1) as a principal component; and a spin injection layer formed with a magnetic material and configured to inject a spin into the recording layer with the magnetic material being magnetized, M 1-x Te x (1) where M represents an atom selected from atoms of Ge, Al, and Si, and x represents a value of 0.5 or more and less than 1.
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