Circuit and method to extend a signal comparison voltage range

US2016248407A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016248407-A1
Application numberUS-201615144929-A
CountryUS
Kind codeA1
Filing dateMay 3, 2016
Priority dateMar 12, 2013
Publication dateAug 25, 2016
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A circuit to a extend signal comparison voltage range includes a latching circuit and a comparator responsive to common-mode input signals. The comparator is coupled to the latching circuit and to a dynamic node. The circuit also includes a clocked boost circuit coupled to the dynamic node. The clocked boost circuit is configured to extend a supply voltage range of the comparator via biasing the dynamic node. A method to extend a signal comparison voltage range includes selectively shifting a voltage level of one of a ground reference of a dynamic circuit or a supply reference of the dynamic circuit in response to a clock signal.

First claim

Opening claim text (preview).

What is claimed is: 1 . A circuit to extend signal comparison voltage range, the circuit comprising: a latching circuit; a comparator responsive to a differential pair of input signals, the comparator coupled to the latching circuit and to a node having a dynamic voltage; and a clocked boost circuit coupled to the node and configured to extend a supply voltage range of the comparator via biasing the node, wherein the clocked boost circuit includes: an inverter coupled between a voltage supply and ground, wherein the inverter is responsive to a clock signal and wherein an output of the inverter is coupled to a first terminal of a capacitor; and a switch responsive to an inverted clock signal and configured to selectively couple a second terminal of the capacitor to a reference potential. 2 . The circuit of claim 1 , wherein the node provides a supply reference of the comparator. 3 . The circuit of claim 2 , wherein the comparator comprises: a first transistor coupled to the node and responsive to a first input signal; and a second transistor coupled to the node and responsive to a second input signal, wherein an output of the comparator indicates whether a first charge rate through the first transistor to the supply reference exceeds a second charge rate through the second transistor to the supply reference. 4 . An apparatus to boost a common mode voltage of a differential signal pair, the apparatus comprising: a dynamic latched comparator including: a first transistor coupled to receive a first input signal of the differential signal pair, wherein a source of the first transistor is coupled to a node having a dynamic voltage; and a second transistor coupled to receive a second input signal of the differential signal pair, wherein a source of the second transistor is coupled to the node; and a clocked boost circuit including a capacitor coupled to the node, wherein the capacitor is selectively charged in response to a clock signal, wherein the capacitor selectively biases the node to boost the common mode voltage, and wherein the clocked boost circuit includes: an inverter coupled between a voltage supply and ground, wherein the inverter is responsive to a clock signal and wherein an output of the inverter is coupled to a first terminal of the capacitor; and a switch responsive to an inverted clock signal and configured to selectively couple a second terminal of the capacitor to a reference potential. 5 . The apparatus of claim 4 , wherein the first transistor and the second transistor are p-type metal oxide semiconductor (PMOS) transistors, and wherein boosting the common mode voltage includes biasing the node to a voltage greater than a supply voltage. 6 . The circuit of claim 5 , wherein the clocked boost circuit includes: an inverter coupled between a voltage supply and ground, wherein the inverter is responsive to a clock signal and wherein an output of the inverter is coupled to the first terminal of the capacitor; and a switch responsive to an inverted clock signal and configured to selectively couple a second terminal of the capacitor to the supply voltage.

Assignees

Inventors

Classifications

  • Modifications of generator to improve response time or to decrease power consumption · CPC title

  • with at least one differential stage · CPC title

  • the input circuit having a differential configuration · CPC title

  • using clock signals · CPC title

  • H03K5/00Primary

    Manipulating of pulses not covered by one of the other main groups of this subclass (circuits with regenerative action H03K3/00, H03K4/00; by the use of non-linear magnetic or dielectric devices H03K3/45) · CPC title

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What does patent US2016248407A1 cover?
A circuit to a extend signal comparison voltage range includes a latching circuit and a comparator responsive to common-mode input signals. The comparator is coupled to the latching circuit and to a dynamic node. The circuit also includes a clocked boost circuit coupled to the dynamic node. The clocked boost circuit is configured to extend a supply voltage range of the comparator via biasing th…
Who is the assignee on this patent?
Qualcomm Inc
What technology area does this patent fall under?
Primary CPC classification H03K3/35613. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Aug 25 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).