Ionization apparatus

Patent metadata

Field	Value
Publication number	US-2016247669-A1
Application number	US-201615049366-A
Country	US
Kind code	A1
Filing date	Feb 22, 2016
Priority date	Feb 23, 2015
Publication date	Aug 25, 2016
Grant date	—

Abstract

In an ion source 3 in which a repeller electrode 32 for forming a repelling electric field that repels ions toward an ion emission port 311 is provided inside of an ionization chamber 31, ion focusing electrodes 36 and 37 are respectively arranged between an electron introduction port 312 and a filament 34 and between an electron discharge port 313 and a counter filament 35. An electric field formed by applying a predetermined voltage to each of the ion focusing electrodes 36 and 37 intrudes into the ionization chamber 31 through the electron introduction port 312 and the electron discharge port 313, and becomes a focusing electric field that pushes the ions in an ion optical axis C direction. Ions at positions off a central part of the ionization chamber 31 receive the combined force of the force of the repelling electric field and the force of the focusing electric field, and move toward the ion emission port 311 while approaching the ion optical axis C. Accordingly, the amount of ions sent out from the ion emission port increases. Further, even if a charge-up phenomenon occurs, the ion trajectories less easily change, and the stability of the sensitivity can be enhanced.

First claim

1 . An ionization apparatus for ionizing predetermined sample molecules or atoms, the ionization apparatus comprising:
a) an ionization chamber having: an electron introduction port for introducing thermal electrons to an internal space of the ionization chamber; an electron discharge port for discharging thermal electrons that have passed through the internal space; and an ion emission port for emitting sample-derived ions produced in the internal space to an outside; b) a thermal electron source for producing the thermal electrons, the thermal electron source being arranged on an outer side of the electron introduction port; c) an electron trapping unit for trapping the thermal electrons discharged through the electron discharge port, the electron trapping unit being arranged on an outer side of the electron discharge port; d) a repeller electrode for forming, in the ionization chamber, a repelling electric field that repels the sample-derived ions produced in the ionization chamber toward the ion emission port, the repeller electrode being arranged inside of the ionization chamber so as to be opposed to the ion emission port; and e) an ion focusing electrode for forming, in the ionization chamber, a focusing electric field that focuses the sample-derived ions produced in the ionization chamber around a central axis of an ion flow formed by repelling the sample-derived ions by the repelling electric field, the ion focusing electrode being arranged any one or both of between the thermal electron source and the electron introduction port and between the electron discharge port and the electron trapping unit.

2 . The ionization apparatus according to claim 1 , wherein
the ion emission port is provided to the ionization chamber such that the ions are emitted in a direction substantially orthogonal to a direction in which the thermal electrons are introduced into the ionization chamber through the electron introduction port.

3 . The ionization apparatus according to claim 1 , further comprising a voltage applying unit for applying a DC voltage Vr having a same polarity as that of the sample-derived ions, to the repeller electrode and for applying a DC voltage Vs having a same polarity as that of the sample-derived ions, to the ion focusing electrode, wherein
the DC voltage Vr is 1 and 20 [V], and the DC voltage Vs is 5 and 50 [V].

4 . The ionization apparatus according to claim 2 , further comprising a voltage applying unit for applying a DC voltage Vr having a same polarity as that of the sample-derived ions, to the repeller electrode and for applying a DC voltage Vs having a same polarity as that of the sample-derived ions, to the ion focusing electrode, wherein
the DC voltage Vr is 1 and 20 [V], and the DC voltage Vs is 5 and 50 [V].

Assignees

• Shimadzu Corp

Inventors

• Tateishi Yusuke
• Takahashi Kazuteru
• Sato Hideki

Classifications

• H01J49/147 Primary

  with electrons, e.g. electron impact ionisation, electron attachment (H01J49/145 takes precedence) · CPC title

• H01J49/10 Primary

  Ion sources; Ion guns · CPC title

• H01J27/024

  Extraction optics, e.g. grids · CPC title

• H01J49/067

  Ion lenses, apertures, skimmers · CPC title

• H01J27/205

  with electrons, e.g. electron impact ionisation, electron attachment · CPC title