Method and apparatus for detecting shared risk link groups

Patent metadata

Field	Value
Publication number	US-2016241333-A1
Application number	US-201615014833-A
Country	US
Kind code	A1
Filing date	Feb 3, 2016
Priority date	Feb 16, 2015
Publication date	Aug 18, 2016
Grant date	—

Abstract

A method and device for detecting shared risk link groups is disclosed. The method comprises injecting a probe beam, respectively, into a first test link and a second test link. The method further includes recording, respectively, a first curve of a time-varying first power corresponding to the first backlight and a second curve of a time-varying second power corresponding to the second backlight; calculating a resemblance value for the first curve and the second curve; and judging, based on the resemblance value, whether the first test link and the second test link are located in the same shared risk link group. The method and device for detecting shared risk link groups provided by embodiments of the present invention detect by testing a power characteristic of backlight of a probe beam in test links and, based on that one-dimensional power characteristic, judge whether the test links are in the same shared risk link group, which are simpler in application than those in the prior art.

First claim

What is claimed is:

1 . A method of detecting shared risk link groups, the method comprising:
injecting probe beams into a first test link and a second test link, respectively; receiving, respectively, a first backlight and a second backlight of the probe beam back from the first test link and the second test link; recording, respectively, a first response of a time-varying first power corresponding to the first backlight and a second response of a time-varying second power corresponding to the second backlight; and calculating a resemblance value for the first response and the second response; and determining, based on the resemblance value, whether the first test link and the second test link are located in a same shared risk link group.

2 . The method of claim 1 , further comprising before the recording of the first response of the time-varying first power corresponding to the first backlight and the second power corresponding to the second backlight, mapping, respectively, a polarization characteristic of the first backlight as the first power and mapping a polarization characteristic of the second backlight as the second power.

3 . The method of claim 2 , wherein the mapping the polarization characteristic of the first backlight as the first power and the polarization characteristic of the second backlight as the second power comprises:
utilizing a polarization analyzer to map the polarization characteristic of the first backlight as the first power and to map the polarization characteristic of the second backlight as the second power.

4 . The method of claim 2 , wherein the backlight of the probe beams comprises Rayleigh backscattered light and Fresnel back-reflected light.

5 . The method of claim 2 , wherein the first response and the second response are obtained by an optical time domain reflectometer.

6 . The method of claim 2 , wherein the calculating the resemblance value for the first curve and the second curve, and the determining, based on the resemblance value, whether the first test link and the second test link are located in the same shared risk link group, further comprises:
mapping the first response and the second response as a first function and a second function, respectively; calculating a resemblance value for the first function and the second function; and determining that the first test link and the second test link are located in the same shared risk link group when the resemblance value for the first function and the second function exceeds a predetermined threshold.

7 . The method of claim 6 , wherein the mapping the first response and the second response as the first function and the second function further comprises:
mapping, using a discrete timeline method, the first response and the second response as the first function and the second function, respectively.

8 . The method of claim 2 , wherein the calculating the resemblance value for the first response and the second response, and the determining, based on the resemblance value, whether the first test link and the second test link are located in the same shared risk link group, further comprises:
detecting wave crests and troughs of the first and second responses to obtain a first eigenvector group of the first response and a second eigenvector group of the second response; extracting identical eigenvectors from the first eigenvector group and the second eigenvector group and calculating a first proportion of the identical eigenvectors in the first eigenvector group and a second proportion of the identical eigenvectors in the second eigenvector group; and determining that the first test link and the second test link are located in the same shared risk link group when both the first proportion and the second proportion exceed a predetermined threshold.

9 . The method of claim 2 , further comprising, prior to the calculating the resemblance value for the first and second responses, and the determining, based on the resemblance value, whether the first test link and the second test link are located in the same shared risk link group,
performing a delay calibration on the first response and the second response to obtain a first revised response and a second revised response.

10 . An apparatus for detecting shared risk link groups, the apparatus comprising:
a light source unit; a transmit/receive unit; an information recording unit; and an information processing unit, and wherein: the light source unit is configured for generating a light beam and for injecting the light beam into the transmit/receive unit; the transmit/receive unit is configured for receiving the light beam generated by the light source unit and for injecting the light beam into a first test link and a second test link, respectively, and further for receiving a first backlight of the light beam returned by the first test link and a second backlight of the light beam returned by the second test link; the information recording unit is configured for recording a first curve of a time-varying first power corresponding to the first backlight and a second curve of a time-varying second power corresponding to the second backlight; and the information processing unit is configured for calculating a resemblance value for the first curve and the second curve, and for determining, based on the resemblance value, if the first test link and the second test link are located in the same shared risk link group.

11 . The apparatus of claim 10 , further comprising:
a mapping unit configured for mapping a polarization characteristic of the first backlight received by the transmit/receive unit as a first power and a polarization characteristic of the second backlight received by the transmit/receive unit as a second power.

12 . The apparatus of claim 11 , wherein the mapping unit comprises a polarization analyzer.

13 . The apparatus of claim 10 , wherein the light source unit comprises a laser.

14 . The apparatus of claim 10 , wherein the transmit/receive unit comprises a circulator.

15 . The apparatus of claim 10 , wherein the first and second backlight of the light beam comprise Rayleigh backscattered light and Fresnel back-reflected light.

16 . The apparatus of claim 10 , wherein the information processing unit further comprises:
a first function mapping module configured for mapping the first curve as a first function; a second function mapping module configured for mapping the second curve as a second function; a resemblance value calculating module configured for calculating a resemblance value for the first function and the second function; and a determination module configured for determining, based on the resemblance, if the first test link and the second test link are located in the same shared risk link group.

17 . The apparatus of claim 16 , wherein the first function mapping module further comprises:
a first timeline discretization module configured for mapping, according to a discrete timeline method, the first curve as the first function; and wherein further, the second function mapping module comprises: a second timeline discretization module configured for mapping, according to the discrete timeline method, the second curve as the second function.

18 . The apparatus of claim 10 , wherein the information processing unit further comprises:
a first eigenvector group module configured for detecting wave crests and troughs of the first curve to obtain a first eigenvector group of the first curve; a second eigenvector group module configured

Assignees

• Alibaba Group Holding Ltd

Inventors

• Chen Xiuzhong
• Xie Chongjin
• Pang Junying

Classifications

• G01M11/00

  Testing of optical apparatus; Testing structures by optical methods not otherwise provided for · CPC title

• H04B10/07955

  Monitoring or measuring power · CPC title

• H04B10/0731 Primary

  Testing or characterisation of optical devices, e.g. amplifiers · CPC title

• H04B10/0775 Primary

  Performance monitoring and measurement of transmission parameters · CPC title

• G01N21/21

  Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title