Vertical cmos structure and method

US2016240533A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016240533-A1
Application numberUS-201514640295-A
CountryUS
Kind codeA1
Filing dateMar 6, 2015
Priority dateFeb 13, 2015
Publication dateAug 18, 2016
Grant date

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A method for forming stacked, complementary transistors is disclosed. Selective deposition techniques are used to form a column having a lower portion that includes one type of semiconductor (e.g. germanium) and an upper portion of another type of semiconductor (e.g. indium arsenide. The lower portion of the column provides a channel region for a transistor of one type, while the upper column provides a channel region for a transistor of another type. This provides a complementary pair that occupies a minimum of integrated circuit surface area. The complementary transistors can be utilized in a variety of circuit configurations. Described are complementary transistors where the lower transistor is p-type and the upper transistor is n-type.

First claim

Opening claim text (preview).

1 . A complementary transistor structure comprising: a lower portion of a column comprising a second semiconductive material formed on a substrate comprising a first semiconductor material; a first gate surrounding and insulated from the lower portion of the column; an upper portion of the column comprising a third semiconductive material; a second gate surrounding and insulated from the lower portion of the column; a first electrical contact to the upper portion of the column above the second gate; and a second electrical contact to the upper portion and lower portion of the column between the first and second gates. 2 .- 6 . (canceled) 7 . The complementary transistor structure as in claim 1 wherein the second semiconductive material is germanium. 8 . The complementary transistor structure as in claim 1 wherein the third semiconductive material is indium arsenide. 9 . A complementary transistor structure comprising: a lower portion of a column comprising crystalline germanium formed on a silicon substrate; a first gate surrounding and insulated from the lower portion of the column; an upper portion of the column formed on top of the lower portion of the column comprising indium arsenide; a second gate surrounding and insulated from the lower portion of the column; a first electrical contact to the upper portion of the column above the second gate; and a second electrical contact to the upper portion and lower portion of the column between the first and second gates. 10 . The complementary transistor structure as in claim 9 wherein the lower portion of the column provides a channel region for a p-type field effect transistor and the upper portion of the column provides a channel region for an n-type field effect transistor. 11 . The complementary transistor structure as in claim 9 wherein the lower portion of the column provides a channel region for an n-type field effect transistor and the upper portion of the column provides a channel region for an p-type field effect transistor. 12 . The complementary transistor structure as in claim 9 wherein the first gate is insulated from the lower portion of the column by a high-k dielectric. 13 . The complementary transistor structure as in claim 9 wherein the second gate is insulated from the upper portion of the column by a high-k dielectric. 14 .- 20 . (canceled) 21 . The complementary transistor structure as in claim 1 wherein the second semiconductive material contacts the third semiconductive material. 22 . The complementary transistor structure as in claim 1 wherein the second semiconductive material is separated from the third semiconductive material. 23 . The complementary transistor structure as in claim 1 wherein the second semiconductive material and the third semiconductive material are opposite conductivity types. 24 . The complementary transistor structure as in claim 1 wherein the first gate is electrically coupled to the second gate. 25 . The complementary transistor structure as in claim 1 wherein the substrate immediately below the lower portion is electrically coupled to ground. 26 . A complementary transistor structure comprising: a first vertical nanowire extending from a substrate, the first vertical nanowire being a first semiconductor material; a second vertical nanowire extending from the first vertical nanowire, the first vertical nanowire being disposed between the second vertical nanowire and the substrate, the second vertical nanowire being a second semiconductor material different than the first semiconductor material; a first gate adjacent a first channel region of the first vertical nanowire; and a second gate adjacent a second channel region of the second vertical nanowire, a common source/drain region being interposed between the first gate and the second gate. 27 . The complementary transistor structure of claim 26 , further comprising a gate contact electrically coupled to the first gate and the second gate. 28 . The complementary transistor structure of claim 26 , further comprising an electrical contact electrically coupled to the common source/drain region. 29 . The complementary transistor structure of claim 28 , wherein the electrical contact contacts the second vertical nanowire. 30 . The complementary transistor structure of claim 26 , wherein the first gate and the first vertical nanowire form a first transistor of a first conductivity type, the second gate and the second vertical nanowire form a second transistor of a second conductivity type, the first conductivity type being different than the second conductivity type. 31 . The complementary transistor structure of claim 26 , wherein the first semiconductor material directly contacts the second semiconductor material. 32 . The complementary transistor structure of claim 26 , further comprising a high-k dielectric material interposed between the first gate and the first vertical nanowire and interposed between the second gate and the second vertical nanowire.

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What does patent US2016240533A1 cover?
A method for forming stacked, complementary transistors is disclosed. Selective deposition techniques are used to form a column having a lower portion that includes one type of semiconductor (e.g. germanium) and an upper portion of another type of semiconductor (e.g. indium arsenide. The lower portion of the column provides a channel region for a transistor of one type, while the upper column p…
Who is the assignee on this patent?
Taiwan Semiconductor Mfg Co Ltd
What technology area does this patent fall under?
Primary CPC classification H10D84/0195. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Aug 18 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).