Test case crash recovery

Patent metadata

Field	Value
Publication number	US-2016239376-A1
Application number	US-201615137560-A
Country	US
Kind code	A1
Filing date	Apr 25, 2016
Priority date	Aug 13, 2012
Publication date	Aug 18, 2016
Grant date	—

Abstract

A safe operating region of a complex integrated circuit may be determined by selecting an operating point for the integrated circuit (IC) at a first voltage and first frequency. A test program is executed by a central processing unit (CPU) comprised within the IC to test a portion of the IC. Communication activity between the IC and a host system is recorded to form a data log while the test program is being executed. A crash is detected by storing and examining the data log periodically, and assuming that the test program has crashed when any one of a predetermined set of crash conditions is detected during examination of the data log. The operating point may be iteratively changed and execution of the test program repeated while continuing to check for a crash until a crash is detected.

First claim

What is claimed is:

1 . A process of operating an integrated circuit test system, the test system including a host computer and a test platform coupled to the host computer, the test platform including a voltage source, a clock source, and a socket for coupling an integrated circuit to the host computer, the voltage source, and the clock source, the process comprising:
(a) coupling an integrated circuit having clock domains in the socket; (b) selecting in the host computer a clock domain in the integrated circuit to be tested; (c) downloading from the host computer to the test platform settings for the voltage source and the clock source; (d) downloading from the host computer to the integrated circuit a test program; (e) executing in the integrated circuit the test program, the executing including sending status information to a log file in the host computer; (f) waiting a sleep time period for the integrated circuit to execute the test program; (g) scanning the length of status information in the log file by the host computer; (h) initiated a crash recovery process if the length of status information in the log file is greater than an empty log value and returning to the sleep time period if the length of status information in the log file is less than the empty log file; (i) initiating a crash recovery process if the length of status information in the log file is equal to or greater than a limit value; (j) initiating a crash recovery process if the status information in the log file contains a specific word; and (k) initiating a crash recovery process if the length of status information in the log file exceeds a maximum freeze value and returning to the sleep time period if the length of status information in the log file is less than the maximum freeze value.

2 . The process of claim 1 including iteratively changing the settings for the voltage source and the clock source until initiating a crash recovery process.

3 . The process of claim 1 including iteratively changing the clock domain in the integrated circuit to be tested until initiating a crash recovery process.

4 . The process of claim 1 including recording in the host computer the length of status information in the log file as safe settings for the voltage source and the clock source.

5 . The process of claim 1 in which the initiating a crash recovery process includes rebooting the integrated circuit each time a crash is detected prior to executing a test program.

6 . A test system comprising:
(a) a test platform having a socket for an integrated circuit with clock domains, a voltage source coupled to the socket, and a clock source coupled to the socket; (b) a communications channel coupled to the socket, the voltage source, and the clock source; (c) a host computer having a system monitor coupled to the communications channel, test programs coupled to the system monitor, and a log file coupled to the system monitor, the test programs operating the test system by: (i) selecting in the host computer a clock domain in the integrated circuit to be tested; (ii) downloading from the host computer to the test platform settings for the voltage source and the clock source; (iii) downloading from the host computer to the integrated circuit a test program; (iv) executing in the integrated circuit the test program, the executing including sending status information to a log file in the host computer; (v) waiting a sleep time period for the integrated circuit to execute the test program; (vi) scanning the length of status information in the log file by the host computer; (vii) initiated a crash recovery process if the length of status information in the log file is greater than an empty log value and returning to the sleep time period if the length of status information in the log file is less than the empty log file; (viii) initiating a crash recovery process if the length of status information in the log file is equal to or greater than a limit value; (ix) initiating a crash recovery process if the status information in the log file contains a specific word; and (x) initiating a crash recovery process if the length of status information in the log file exceeds a maximum freeze value and returning to the sleep time period if the length of status information in the log file is less than the maximum freeze value.

7 . The system of claim 6 in which the test programs operate the system by iteratively changing the settings for the voltage source and the clock source until initiating a crash recovery process.

8 . The system of claim 6 in which the test programs operate by iteratively changing the clock domain in the integrated circuit to be tested until initiating a crash recovery process.

9 . The system of claim 6 in which the test programs operate by recording in the host monitor the length of status information in the log file as safe settings for the voltage source and the clock source.

10 . The system of claim 6 in which the test programs operate by initiating a crash recovery process by rebooting the integrated circuit each time a crash is detected prior to executing a test program.

Assignees

• Texas Instruments Inc

Inventors

• Demay Jerome

Classifications

• G06F11/079

  Root cause analysis, i.e. error or fault diagnosis (in a hardware test environment G06F11/22; in a software test environment G06F11/36) · CPC title

• G01R31/2851

  Testing of integrated circuits [IC] (G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801) · CPC title

• G06F11/0757

  by exceeding a time limit, i.e. time-out, e.g. watchdogs · CPC title

• G01R31/3004

  Current or voltage test · CPC title

• G06F11/0793 Primary

  Remedial or corrective actions (recovery from an exception in an instruction pipeline G06F9/3861; by retry G06F11/1402; for recovering from a failure of a protocol instance or entity H04L69/40) · CPC title