Method and Apparatus for Determining the Aging of an Electronic Interrupter Element, in Particular of a Power Contactor

US2016231381A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016231381-A1
Application numberUS-201415024963-A
CountryUS
Kind codeA1
Filing dateSep 9, 2014
Priority dateSep 25, 2013
Publication dateAug 11, 2016
Grant date

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

The disclosure relates to a method for determining the aging of an electronic interrupter element which is configured to open and close a power circuit. The method according to the disclosure comprises the following steps: a) initializing an aging counter NWear, b) determining the amount I of a current which flows through the electronic interrupter element upon opening the power circuit, c) determining a current-dependent aging value Nwear (I) from the amount I of the current, d) refreshing the aging counter NWear using the current-dependent aging value Nwear (I). The disclosure further relates to a computer program and to an apparatus for determining the aging of an electronic interrupter element and to a battery management system which are in particular configured to carry out the method.

First claim

Opening claim text (preview).

1 . A method for determining an aging of an electronic interruption element that is configured to open and close a circuit, the method comprising: a) initializing an aging counter N wear ; b) determining an absolute value I of a current that flows when the circuit is opened by the electronic interruption element; c) determining an aging value N wear (I) that is dependent on the absolute value I of the current; and d) refreshing the aging counter N wear using the aging value N wear (I). 2 . The method as claimed in claim 1 , wherein the electronic interruption element has a reference number N mech known for it that indicates a number of opening and closing operations for the electronic interruption element, the method further comprising: ascertaining the aging value N wear (I) based on a division of the reference number N mech by a number N break (I), the number N break (I) indicating a current-dependent number of opening and closing operations for the electronic interruption element. 3 . The method as claimed in claim 1 , further comprising: e) determining an absolute value ΔU of a voltage difference across the electronic interruption element when the circuit is closed; f) determining an aging value N wear (ΔU) that is dependent on the absolute value ΔU of the voltage difference; and g) refreshing the aging counter N wear using the aging value N wear (ΔU). 4 . The method as claimed in claim 3 , wherein the electronic interruption element has a reference number N mech known for it that indicates a number of opening and/or closing operations for the electronic interruption element, the method further comprising: determining the aging value N wear (ΔU) based on a division of the reference number N mech by a number N make (ΔU), the number N make (ΔU) indicating a voltage-dependent number of opening and closing operations for the electronic interruption element. 5 . The method as claimed in claim 4 , further comprising: ascertaining the number N make (ΔU) taking into account a capacitance of a capacitor and a resistance of a resistor. 6 . The method as claimed in claim 1 , further comprising: ascertaining a life limit for the electronic interruption element. 7 . The method as claimed in claim 6 , further comprising: initiating an action at a moment at which the aging counter N wear at least one of reaches and [[or]] exceeds the life limit of the electronic interruption element. 8 . The method as claimed in claim 1 , wherein the electronic interruption element is a power contactor for a battery in at least one of an electric vehicle and hybrid electric vehicle. 9 . A computer program for determining an aging of an electronic interruption element that is configured to open and close a circuit, the computer program being stored on a non-transitory storage medium and configured to, when the computer program is executed on a programmable computer device: a) initialize an aging counter N wear ; b) determine an absolute value I of a current that flows when the circuit is opened by the electronic interruption element; c) determine an aging value N wear (I) that is dependent on the absolute value I of the current; and d) refresh the aging counter N wear using the aging value N wear (I). 10 . A device for determining an aging of an electronic interruption element that is configured to open and close a circuit, the device comprising: a first device configured to ascertain an the absolute value I of a current that flows when the circuit is opened by the electronic interruption element; a second device configured to determine an aging value N wear (I) that is dependent on from the absolute value I of the current that flows when the circuit is opened by the electronic interruption element; and a third device configured to accumulate the determined aging values N wear (I). 11 . The device as claimed in claim 10 , further comprising: a device configured to ascertain a voltage of a voltage source, wherein the second device is configured to ascertain the absolute value I of the current that flows when the circuit is opened by the electronic interruption element from the voltage of the voltage source and an internal resistance of the voltage source. 12 . The device as claimed in claim 10 , wherein in the device is part of a battery management system.

Assignees

Inventors

Classifications

  • Control strategies for responding to system failures, e.g. for fault diagnosis, failsafe operation or limp mode · CPC title

  • Cutting off the power supply under fault conditions (protective devices and circuit arrangements in general H01H; H02H) · CPC title

  • G01R31/327Primary

    Testing of circuit interrupters, switches or circuit-breakers · CPC title

  • Registering or indicating the condition or the working of machines or other apparatus, other than vehicles · CPC title

  • Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL] (preventive maintenance, i.e. planning maintenance according to the available resources without monitoring the system G06Q10/06) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US2016231381A1 cover?
The disclosure relates to a method for determining the aging of an electronic interrupter element which is configured to open and close a power circuit. The method according to the disclosure comprises the following steps: a) initializing an aging counter NWear, b) determining the amount I of a current which flows through the electronic interrupter element upon opening the power circuit, c) det…
Who is the assignee on this patent?
Bosch Gmbh Robert, Samsung Sdi Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01R31/327. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Aug 11 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).