Systems and methods for aligning an aperture

Patent metadata

Field	Value
Publication number	US-2016209339-A1
Application number	US-201514601277-A
Country	US
Kind code	A1
Filing date	Jan 21, 2015
Priority date	Jan 21, 2015
Publication date	Jul 21, 2016
Grant date	—

Abstract

An alignment system for aligning apertures in an X-ray backscatter system is provided. Additionally, a method for aligning apertures in an X-ray backscatter system is provided. Further, a computer-readable storage device including computer-executable instructions for aligning apertures in an X-ray backscatter system is provided.

First claim

What is claimed is:

1 . An alignment system for aligning apertures in an X-ray backscatter system, said alignment system comprising:
an X-ray detector; a pair of motors; and a radiation flux analyzer device coupled to the X-ray detector and the pair of motors, said flux analyzer device is configured to: operate the pair of motors to move an aperture to a plurality of different positions; receive signals from the X-ray detector at each of the plurality of positions; identify which aperture position exhibits the largest flux intensity based on the received signals; and operate the pair of motors to position the aperture at the identified position.

2 . The alignment system of claim 1 , wherein the X-ray detector comprises an X-ray transmission detector.

3 . The alignment system of claim 1 , wherein the X-ray backscatter system further includes a plurality of apertures, and said flux analyzer device is further configured to determine a respective peak flux intensity and a respective peak flux position for each of the plurality of apertures.

4 . The alignment system of claim 3 , wherein said flux analyzer device is further configured to:
determine an average peak flux intensity by averaging together the peak flux intensities associated with each of the plurality of apertures; and determine an acceptable intensity range by: determining an upper intensity threshold that is a predefined percentage greater than the average peak flux intensity; and determining a lower intensity threshold that is the predefined percentage less than the average peak flux intensity.

5 . The alignment system of claim 4 , wherein said flux analyzer device is further configured to:
determine that at least one of the plurality of a apertures has a peak flux intensity that is greater than the upper intensity threshold; and position the at least one of said plurality of apertures to one of the plurality of positions that is associated with one of the plurality of flux intensities that is within the acceptable intensity range.

6 . The alignment system of claim 4 , wherein said flux analyzer device is coupled to an output device, said flux analyzer device is further configured to:
determine that at least one of the plurality of apertures has a peak flux intensity that is less than the lower intensity threshold; and transmit an output signal to said output device to display a message indicating that the at least one aperture having a peak flux intensity less than the lower intensity threshold should be replaced or re-machined.

7 . The alignment system of claim 1 , further comprising a third motor coupled to the aperture, wherein the third motor is configured to position the first aperture on a Z-axis that is perpendicular to an X-axis and a Y-axis.

8 . The alignment system of claim 1 , wherein the X-ray backscatter system further includes a wheel and a wheel motor coupled to the wheel, wherein the wheel includes at least the aperture and a second aperture, and wherein said flux analyzer device is further configured to transmit an orientation signal to the wheel motor to rotate the wheel from a first orientation to a second orientation, wherein the second aperture emits X-rays onto said X-ray detector.

9 . A method for aligning apertures in an X-ray backscatter system, said method is performed using an alignment system that includes an X-ray detector, a pair of motors, and a radiation flux analyzer device coupled to the X-ray detector and the pair of motors, said method comprising:
operating the pair of motors to move an aperture to a plurality of different positions; receiving signals from the X-ray detector at each of the plurality of positions; identifying which aperture position exhibits the largest flux intensity based on the received signals; and operating the pair of motors to position the aperture at the identified position.

10 . The method of claim 9 , wherein the X-ray backscatter system further includes a plurality of apertures, said method further comprising determining, by the flux analyzer device, a respective peak flux intensity and a respective peak flux position for each of the plurality of apertures.

11 . The method of claim 10 , further comprising:
determining, by the flux analyzer device, an average peak flux intensity by averaging together the peak flux intensities associated with each of the plurality of apertures; and determining an acceptable intensity range by: determining an upper intensity threshold that is a predefined percentage greater than the average peak flux intensity; and determining a lower intensity threshold that is the predefined percentage less than the average peak flux intensity.

12 . The method of claim 11 , further comprising:
determining, by the flux analyzer device, that at least one of the plurality of a apertures has a peak flux intensity that is greater than the upper intensity threshold; and positioning the at least one of the plurality of apertures to one of the plurality of positions that is associated with one of the plurality of flux intensities that is within the acceptable intensity range.

13 . The method of claim 11 , wherein the flux analyzer device is coupled to an output device, said method further comprising:
determining, by the flux analyzer device, that at least one of the plurality of apertures has a peak flux intensity that is less than the lower intensity threshold; and transmitting an output signal to the output device to display a message indicating that the at least one aperture having a peak flux intensity less than the lower intensity threshold should be replaced or re-machined.

14 . The method of claim 9 , wherein the alignment system further includes a third motor coupled to the aperture, said method further comprising positioning the aperture on a Z-axis that is perpendicular to an X-axis and a Y-axis, using the third motor.

15 . The method of claim 9 , wherein the X-ray backscatter system further includes a wheel, and the aperture is one of a plurality of apertures positioned around the wheel, said method further comprising:
after determining a peak flux intensity and a peak flux position of the aperture, rotating the wheel such that at least a second aperture of the plurality of apertures emits X-rays onto the X-ray detector; and determining a respective peak flux intensity and a respective peak flux position for the second aperture.

16 . A computer-readable storage device comprising computer-executable instructions for aligning apertures in an X-ray backscatter system, wherein, when executed by a flux analyzer device included in an alignment system that includes an X-ray detector, a pair of motors, and the flux analyzer device coupled to the X-ray detector and the pair of motors, said computer-executable instructions cause the flux analyzer device to:
operate the pair of motors to move an aperture to a plurality of different positions; receive signals from the X-ray detector at each of the plurality of positions; identify which aperture position exhibits the largest flux intensity based on the received signals; and operate the pair of motors to position the aperture at the identified position.

17 . The computer-readable storage device of claim 16 , wherein the X-ray backscatter system further includes a plurality of apertures, said computer-executable instructions further cause the flux analyzer device to determine a respective peak flux intensity and a respective peak flux position for each of the plurality of apertures.

18 . The computer-r

Assignees

• Boeing Co

Inventors

• Safai Morteza
• Georgeson Gary E

Classifications

• G01N2223/053

  back scatter · CPC title

• G01N23/203 Primary

  Measuring back scattering · CPC title