Systems and methods for signal processing in molecular imaging
US-2024013454-A1 · Jan 11, 2024 · US
US2016206255A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016206255-A1 |
| Application number | US-201514599141-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 16, 2015 |
| Priority date | Jan 16, 2015 |
| Publication date | Jul 21, 2016 |
| Grant date | — |
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A photon-counting detector apparatus is configured to receive X-rays transmitted from an X-ray source. The photon-counting detector apparatus includes a first photon-counting detector having a first detecting material configured to detect photons using a first set of energy bins. The photon-counting detector apparatus also includes a second photon-counting detector arranged above the first photon-counting detector relative to an incidence direction of the X-rays transmitted from the X-ray source. The second photon-counting detector has a second detecting material configured to detect photons using a second set of energy bins. The first set of energy bins differs from the second set of energy bins.
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1 . A photon-counting detector apparatus configured to receive X-rays transmitted from an X-ray source, the photon-counting detector apparatus comprising: a first photon-counting detector having a first detecting material configured to detect photons using a first set of energy bins; and a second photon-counting detector arranged above the first photon-counting detector relative to an incidence direction of the X-rays transmitted from the X-ray source, the second photon-counting detector having a second detecting material configured to detect photons using a second set of energy bins, wherein the first set of energy bins differs from the second set of energy bins. 2 . The photon-counting detector apparatus of claim 1 , wherein a thickness of the first detecting material differs from a thickness of the second detecting material. 3 . The photon-counting detector apparatus of claim 1 , wherein the first detecting material and the second detecting material are semiconductor compounds. 4 . The photon-counting detector apparatus of claim 3 , further comprising a cathode adjacent to a first surface of the first detecting material and a first surface of the second detecting material, and an anode adjacent to a second surface of the first detecting material and a second surface of the second detecting material. 5 . The photon-counting detector apparatus of claim 3 , further comprising a shared cathode between the first and the second photon-counting detectors of the photon-counting detector apparatus. 6 . The photon-counting detector apparatus of claim 1 , further comprising a third photon-counting detector arranged above the second photon-counting detector relative to the X-rays transmitted from the X-ray source, and configured to receive and count photons using a third set of energy bins. 7 . The photon-counting detector apparatus of claim 1 , wherein the first and the second photon-counting detectors have circuitry configured to determine an energy of each received photon. 8 . The photon-counting detector apparatus of claim 1 , further comprising one or more comparators configured to count a number of received photons at each photon energy. 9 . The photon-counting detector apparatus of claim 1 , wherein the first detecting material and the second detecting material are a same material. 10 . The photon-counting detector apparatus of claim 1 , wherein the first detecting material and the second detecting material are different materials. 11 . A computed tomography (CT) scanner apparatus, comprising: an X-ray source mounted on a gantry of the CT scanner; and a plurality of photon-counting detectors configured to receive X-rays transmitted from the X-ray source, each of the plurality of photon-counting detectors including a first photon-counting detector having a first detecting material configured to detect photons using a first set of energy bins; and a second photon-counting detector arranged above the first photon-counting detector relative to an incidence direction of the X-rays transmitted from the X-ray source, the second photon-counting detector having a second detecting material configured to detect photons using a second set of energy bins, wherein the first set of energy bins differs from the second set of energy bins. 12 . The CT scanner apparatus of claim 11 , further comprising circuitry configured to determine an energy of each received photon. 13 . The CT scanner apparatus of claim 11 , further comprising one or more comparators configured to count a number of received photons at each photon energy. 14 . The CT scanner apparatus of claim 11 , wherein the X-ray source is configured to rotate about a patient table; the plurality of photon-counting detectors are stationary; and the CT scanner apparatus further comprises a detector array including a plurality of X-ray detectors configured to rotate about the patient table in synchronization with the rotating X-ray source. 15 . A dual-stacked photon-counting detector, comprising: a first photon-counting detector having a first detecting material configured to detect photons using a first set of energy bins; a second photon-counting detector arranged above the first photon-counting detector relative to an incidence direction of X-rays transmitted from an X-ray source, the second photon-counting detector having a second detecting material configured to detect photons using a second set of energy bins, wherein the first set of energy bins differs from the second set of energy bins; and circuitry configured to dynamically select, based on a measured count rate, between a first detection mode of photon counting with energy information from the first and second photon-counting detectors, and a second detection mode of photon counting without energy information. 16 . The dual-stacked photon-counting detector of claim 15 , wherein the circuitry is configured to select the first detection mode when a flux rate is high. 17 . The dual-stacked photon-counting detector of claim 15 , wherein the circuitry is configured to retrieve energy information using both layers of the dual-stacked photon-counting detector in the second detection mode. 18 . The dual-stacked photon-counting detector of claim 15 , wherein the circuitry is further configured to dynamically select between the first and second detector modes based on at least one count rate threshold, and is configured to alter an integration time of energy discriminating detectors.
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation (G01T3/00, G01T5/00 take precedence) · CPC title
using energy resolving detectors, e.g. photon counting · CPC title
characterised by using a plurality of detector units (A61B6/4014 takes precedence) · CPC title
Transmission computed tomography [CT] · CPC title
using a detector unit almost surrounding the patient, e.g. more than 180° · CPC title
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