Chemically amplified positive resist composition and resist pattern forming process
US-12164231-B2 · Dec 10, 2024 · US
US2016202607A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016202607-A1 |
| Application number | US-201414913489-A |
| Country | US |
| Kind code | A1 |
| Filing date | Sep 2, 2014 |
| Priority date | Sep 6, 2013 |
| Publication date | Jul 14, 2016 |
| Grant date | — |
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A radiation-sensitive resin composition containing an alicyclic olefin polymer which has an acidic group (A), a sulfonium salt-based photoacid generator (B) which is represented by the following general formula (1), and a cross-linking agent (C) is provided. (In the above general formula (1), R 1 , R 2 , and R 3 respectively independently are a C 6 to C 30 aryl group, C 4 to C 30 heterocyclic group, C 1 to C 30 alkyl group, C 2 to C 30 alkenyl group, or C 2 to C 30 alkynyl group, the groups being optionally substituted, and “a” is an integer of 1 to 5.)
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1 . A radiation-sensitive resin composition comprising an alicyclic olefin polymer having an acidic group (A), a sulfonium salt-based photoacid generator (B) represented by the following general formula (1), and a cross-linking agent (C), wherein, in the general formula (1), R 1 , R 2 , and R 3 respectively independently are a C 6 to C 30 aryl group, C 4 to C 30 heterocyclic group, C 1 to C 30 alkyl group, C 2 to C 30 alkenyl group, or C 2 to C 30 alkynyl group, the groups being optionally substituted, and “a” is an integer of 1 to 5. 2 . The radiation-sensitive resin composition according to claim 1 , wherein in the general formula (1), R 1 , R 2 , and R 3 are C 6 to C 30 aryl groups. 3 . The radiation-sensitive resin composition according to claim 2 , wherein in the general formula (1), R 1 , R 2 , and R 3 are phenyl groups. 4 . The radiation-sensitive resin composition according to claim 1 , wherein in the general formula (1), “a” is 3. 5 . The radiation-sensitive resin composition according to claim 1 , further comprising an antioxidant (D). 6 . The radiation-sensitive resin composition according to claim 1 , wherein a ratio of content of the sulfonium salt-based photoacid generator (B) is 1 to 15 parts by weight with respect to 100 parts by weight of the alicyclic olefin polymer having an acidic group (A). 7 . The radiation-sensitive resin composition according to claim 1 , wherein the cross-linking agent (C) is a compound having two or more epoxy groups. 8 . The radiation-sensitive resin composition according to claim 1 , wherein the cross-linking agent (C) is a compound having two or more oxetanyl groups. 9 . The radiation-sensitive resin composition according to claim 7 , wherein the cross-linking agent (C) is a combination of a compound having two or more epoxy groups and a compound having two or more oxetanyl groups. 10 . An electronic device which is provided with a resin film comprised of a radiation-sensitive resin composition according to claim 1 .
with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title
with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title
Encapsulations · CPC title
Photosensitive materials (G03F7/12, G03F7/14 take precedence) · CPC title
Macromolecular compounds which are rendered insoluble or differentially wettable (G03F7/075 takes precedence; macromolecular azides G03F7/012; macromolecular diazonium compounds G03F7/021) · CPC title
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