Memory elements with series volatile and nonvolatile switches
US-9214224-B2 · Dec 15, 2015 · US
US2016197294A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016197294-A1 |
| Application number | US-201615044248-A |
| Country | US |
| Kind code | A1 |
| Filing date | Feb 16, 2016 |
| Priority date | Jan 5, 2015 |
| Publication date | Jul 7, 2016 |
| Grant date | — |
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An apparatus with a programmable response includes a semiconductor device with a junction formed thereon, the junction having a built-in potential, a quantum well element proximate to the junction that provides an energy well within a depletion region of the junction. The energy well comprises one or more donor energy states that support electron trapping, and/or one or more acceptor energy states that support hole trapping; thereby modulating the built-in potential of the junction. The semiconductor device may be a diode, a bipolar diode, a transistor, or the like. A corresponding method is also disclosed herein.
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What is claimed is: 1 . A programmable semiconductor field-effect transistor device, the device comprising: a plurality of electrodes including a source electrode, a drain electrode, and a gate electrode, the gate electrode coupled to a channel region via a gate insulator on a first side of the channel region; a junction, located on a second side of the channel region, the junction having a built-in potential; a quantum well element proximate to the junction that provides an energy well within a depletion region of the junction; the energy well comprising one or more donor energy states that support electron trapping and/or one or more acceptor energy states that support hole trapping; the built-in potential of the junction corresponding to a net polarity of holes and electrons trapped by the one or more donor energy states and/or one or more acceptor energy states; wherein the conductivity of the channel region of the semiconductor field-effect transistor is programmed by applying an electrical signal across at least electrodes of the plurality of electrodes to cause a net polarity of holes and electrons to be trapped by the one or more donor energy states and/or one or more acceptor energy states. 2 . The device of claim 1 , wherein the junction is a hetero-junction. 3 . The device of claim 2 , wherein the hetero-junction comprises an interface between a first organic material and an inorganic material. 4 . The device of claim 3 , wherein the inorganic material comprises silicon and the first organic material comprises pentacene. 5 . The device of claim 4 , further comprising a passivation layer between the first organic material and the inorganic material that saturates dangling bonds of the inorganic material. 6 . The device of claim 5 , wherein the passivation layer comprises a second organic material. 7 . The device of claim 6 , wherein the second organic material is selected from the group consisting of an aromatic organic material, a monolayer of a long-chain alcohol, and a monolayer of a long-chain thiol. 8 . The device of claim 1 , wherein the quantum well element is a metallic nanoparticle. 9 . The device of claim 1 , wherein the quantum well element is an embedded junction having a lower bandgap energy than the junction. 10 . The device of claim 2 , wherein the hetero-junction comprises an interface between two semiconductor materials selected from the group consisting of a IV material, a III material, and a V material. 11 . The device of claim 2 , wherein the hetero-junction comprises an interface between two amorphous, nano-crystalline or micro-crystalline semiconductor materials. 12 . The device of claim 1 , wherein the programmed conductivity characteristics are non-volatile. 13 . The device of claim 1 , wherein the device is an ambipolar transistor. 14 . The device of claim 1 , wherein the gate electrode is electrically connected to the drain electrode. 15 . A method for obtaining a programmable response, the method comprising: providing a semiconductor field-effect transistor with: a plurality of electrodes including a source electrode, a drain electrode, and a gate electrode, the gate electrode coupled to a channel region via a gate insulator on a first side of the channel region, a junction, located on a second side of the channel region, the junction having a built-in potential, a quantum well element proximate to the junction that provides an energy well within a depletion region of the junction, the energy well comprising one or more donor energy states that support electron trapping and/or one or more acceptor energy states that support hole trapping, the built-in potential of the junction corresponding to a net polarity of holes and electrons trapped by the one or more donor energy states and/or one or more acceptor energy states; and applying a programming signal to at least two electrodes of the plurality of electrodes to cause a net polarity of holes and electron to be trapped by the one or more donor energy states and/or one or more acceptor energy states. 16 . The method of claim 15 , wherein the programming signal is a voltage signal. 17 . The method of claim 15 , further comprising applying a read signal to the semiconductor field-effect transistor and detecting a response of the semiconductor field-effect transistor to a read signal. 18 . The method of claim 17 , wherein the read signal is a voltage signal and the response of the semiconductor field-effect transistor is a current signal. 19 . The method of claim 17 , wherein the programming signal and the read signal are voltage signals, and the read signal has a lower amplitude than the programming signal. 20 . The method of claim 17 , wherein the gate electrode is electrically connected to the drain electrode.
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