Apparatus for chemical concentration determination using microwave spectroscopy
US-2016116422-A1 · Apr 28, 2016 · US
US2016195608A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016195608-A1 |
| Application number | US-201614987870-A |
| Country | US |
| Kind code | A1 |
| Filing date | Jan 5, 2016 |
| Priority date | Jan 5, 2015 |
| Publication date | Jul 7, 2016 |
| Grant date | — |
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A device and a method for ascertaining a property of an object includes: emitting a first electromagnetic wave having a first frequency within a first frequency range for the at least partial reflection at the object as a first reflected electromagnetic wave; emitting a second electromagnetic wave having a second frequency within a second frequency range for the at least partial reflection at the object as a second reflected electromagnetic wave, the first and the second frequency range being disjunct; generating a first measurement signal based on the received first reflected electromagnetic wave; generating a second measurement signal based on a received second reflected electromagnetic wave; and analyzing the first measurement signal and the second measurement signal to ascertain the property of the object.
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What is claimed is: 1 . A device for ascertaining a property of an object, comprising a transmitter device, by which a first electromagnetic wave having a first frequency spectrum within a first frequency range is emittable for the at least partial reflection at the object as a first reflected electromagnetic wave, and by which a second electromagnetic wave having a second frequency spectrum within a second frequency range is emittable for the at least partial reflection at the object as a second reflected electromagnetic wave, the first and the second frequency range being disjunct; a receiver device, by which the first and second reflected electromagnetic waves are receivable and by which a first measurement signal is generatable based on a received first reflected electromagnetic wave, and a second measurement signal is generatable based on a received second reflected electromagnetic wave; and an evaluation device to ascertain a property of the object based on the first measurement signal and the second measurement signal. 2 . The device of claim 1 , wherein the first measurement signal indicates a first spectroscopic property of the received first reflected electromagnetic wave, and the second measurement signal indicates a second spectroscopic property of the received second reflected electromagnetic wave, wherein the evaluation device is configured to compare the first spectroscopic property having the first frequency spectrum or a frequency spectrum derived from the first frequency spectrum in a first comparison, and to compare the second spectroscopic property having the second frequency spectrum or a frequency spectrum derived from the second frequency spectrum in a second comparison, and wherein the evaluation device is configured to ascertain the property of the object based on the result of the first and second comparisons. 3 . The device of claim 2 , wherein the evaluation device is configured to compare the result of the first comparison with the result of the second comparison in a third comparison, and for ascertaining the property of the object based on the result of the third comparison. 4 . The device of claim 1 , wherein the first frequency range or the second frequency range ranges from 300 gigahertz to 3 terahertz. 5 . The device of claim 1 , wherein the first frequency range or the second frequency range ranges from 500 megahertz to 100 gigahertz. 6 . The device of claim 1 , wherein the first electromagnetic wave and the second electromagnetic wave are emittable at the same time. 7 . A method for ascertaining a property of an object, the method comprising: emitting a first electromagnetic wave having a first frequency within a first frequency range for the at least partial reflection at the object as a first reflected electromagnetic wave; emitting a second electromagnetic wave having a second frequency within a second frequency range for the at least partial reflection at the object as a second reflected electromagnetic wave, the first and the second frequency range being disjunct; generating a first measurement signal based on a received first reflected electromagnetic wave; generating a second measurement signal based on a received second reflected electromagnetic wave; and evaluating the first measurement signal and the second measurement signal to ascertain the property of the object. 8 . The method of claim 7 , wherein the first measurement signal indicates a first spectroscopic property of the received first reflected electromagnetic wave, and the second measurement signal indicates a second spectroscopic property of the received second reflected electromagnetic wave, and wherein the evaluation of the first measurement signal and the second measurement signal include the following: comparing, in a first comparison, the first spectroscopic property having the first frequency spectrum or a frequency spectrum derived from the first frequency spectrum; and comparing, in a second comparison, the second spectroscopic property having the second frequency spectrum or a frequency spectrum derived from the second frequency spectrum, the property of the object being ascertained based on the result of the first comparison and the second comparison. 9 . The method of claim 8 , wherein the evaluation of the first measurement signal and the second measurement signal includes the following: comparing, in a third comparison, the result of the first comparison to the result of the second comparison; wherein the property of the object is ascertained based on the result of the third comparison. 10 . The method of claim 7 , wherein the first electromagnetic wave and the second electromagnetic wave are emitted at the same time.
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