Determining the signal quality of an electrical interconnect

Patent metadata

Field	Value
Publication number	US-2016182124-A1
Application number	US-201514887116-A
Country	US
Kind code	A1
Filing date	Oct 19, 2015
Priority date	Mar 12, 2012
Publication date	Jun 23, 2016
Grant date	—

Abstract

One embodiment provides a network device that includes PHY circuitry comprising transmit circuitry (Tx) and receive circuitry (Rx), wherein the Tx and Rx circuitry are configured to be coupled to a respective channel to communicate with an external device via the channels, wherein the network device configured to communicate with the external device using an Ethernet communications protocol; and test circuitry. The test circuitry is configured to: designate a through channel and at least one crosstalk channel from among the channels; determine, in the time domain, an approximate available signal voltage of a first response signal, wherein the first response signal is in response to a test signal applied to the through channel; determine a first noise profile of the first response signal in response to the test signal applied on the through channel; determine a second noise profile of a second response signal, wherein the second response signal is in response to the test signal applied on a crosstalk channel and measured on the through channel; and determine a signal-to-noise ratio of the through channel based on, at least in part, the approximate available signal voltage and the first and second noise profiles.

First claim

What is claimed is:

1 - 24 . (canceled)

25 . A test apparatus to test channel quality, comprising:
interface circuitry to couple to a plurality of channels; and test circuitry to:
generate a test signal;
determine a first function that corresponds to noise generated by the test signal on a through channel;
determine one or more second functions representative of noise generated by the test signal on at least one of one or more crosstalk channels;
combine the first function with at least one of the one or more second functions; and
generate a channel quality parameter determined, at least in part, by combining the first function and at least one of the one or more second functions.

26 . The test apparatus of claim 25 :
wherein the first function comprises a first probability density function (1 st PDF); and wherein at least one of the one or more second functions comprises a second probability density function (2 nd PDF).

27 . The test apparatus of claim 26 wherein the test circuitry to combine the first function with at least one of the one or more second functions comprises:
test circuitry to perform a time-domain convolution between the first probability density function and at least one of the one or more second probability density functions.

28 . The test apparatus of claim 27 wherein the test circuitry to generate a channel quality parameter comprises:
test circuitry to generate a Signal to Noise and Distortion Ratio (SNDR) determined, at least in part, by combining the first probability density function with at least one of the one or more second probability density functions.

29 . The test apparatus of claim 25 wherein the test circuitry applies at least one filter to generate the test signal.

30 . The test apparatus of claim 25 wherein, in operation, the test circuitry:
includes a plurality of filters to provide a corresponding plurality of test signals; and
determines the one or more second functions, the one or more second functions representative of noise generated by at least one of the plurality of test signals on at least one of the one or more crosstalk channels.

31 . The test apparatus of claim 25 wherein the plurality of channels includes one of: a plurality of physical channels or a plurality of virtual channels.

32 . The test apparatus of claim 25 , the test circuitry to further:
designate the through channel and the one or more crosstalk channels from among the plurality of channels.

33 . One or more storage mediums having instructions stored thereon that when executed by test circuitry, cause the test circuitry to:
generate a test signal; determine a first function that corresponds to noise generated by the test signal on a through channel; determine one or more second functions representative of noise generated by the test signal on at least one of one or more crosstalk channels; combine the first function with at least one of the one or more second functions; and generate a channel quality parameter determined, at least in part by combining the first function with at least one of the one or more second functions.

34 . The storage mediums of claim 33 :
wherein the instructions that cause the test circuitry to determine a first function further cause the test circuitry to determine a first probability density function (1 st PDF) that corresponds to noise generated by the test signal on the through channel: and wherein the machine-readable instructions that cause the test circuitry to determine one or more second functions further cause the test circuitry to determine one or more second probability density functions (2 nd PDF) representative of noise generated by the test signal on at least one of one or more crosstalk channels.

35 . The storage mediums of claim 34 wherein the machine-readable instructions that combine the first function with at least one of the one or more second functions, further cause the test circuitry to:
perform a time-domain convolution between the first probability density function and at least one of the one or more second probability density functions.

36 . The storage mediums of claim 35 wherein the machine-readable instructions that cause the test circuitry to generate a channel quality parameter further cause the test circuitry to:
generate a Signal to Noise and Distortion Ratio (SNDR) determined, at least in part, by combining the first probability density function with the at least one of the one or more second probability density functions.

37 . The storage mediums of claim 33 wherein the machine-readable instructions further cause the test circuitry to:
designate the through channel and the one or more crosstalk channels from among a plurality of channels included in communicably coupled interface circuitry.

38 . The storage mediums of claim 33 wherein the machine-readable instructions further cause the test circuitry to:
designate the through channel and the one or more crosstalk channels from one of: a plurality of physical channels or a plurality of virtual channels.

39 . The storage mediums of claim 33 wherein the instructions further cause the test circuitry to apply at least one filter to the test signal.

40 . The storage mediums of claim 33 wherein the machine-readable instructions further cause the test circuitry to:
apply a plurality of filters to the test signal to generate a corresponding plurality of test signals; and
wherein the machine-readable instructions that combine the first function with at least one of the one or more second functions, further cause the test circuitry to:
determine one or more second functions representative of noise generated by at least one of the plurality of test signals on at least one of the one or more crosstalk channels.

41 . A test method, comprising:
generating, by test circuitry, a test signal; determining, by the test circuitry, a first function representative of noise generated by the test signal on a through channel; determining, by the test circuitry, one or more second functions representative of noise generated by the test signal on at least one of one or more of crosstalk channels; combining, by the test circuitry, the first function with at least one of the one or more second functions; and generating, by the test circuitry, a channel quality parameter determined, at least in part, by combining the first function with at least one of the one or more second functions.

42 . The method of claim 41 , further comprising:
designating, by the test circuitry, the through channel and the one or more crosstalk channels from one of: a plurality of physical channels or a plurality of virtual channels.

43 . The method of claim 48 :
wherein determining a first function comprises determining, by the test circuitry, a first probability density function (1 st PDF) representative of the noise generated by the test signal on the through channel; and wherein determining one or more second functions comprises determining, by the test circuitry, one or more second probability density functions (2 nd PDFs) representative of the noise generated by the test signal on at least one of the one or more crosstalk channels.

44 . The method of claim 43 wherein combining the first function with at least one of the one or more second functions comprises:
performing, by the test circuitry, a time-domain convolution between the first probability density function and at least one of the one or more secon

Assignees

• Intel Corp

Inventors

• Mellitz Richard
• Ran Adee O

Classifications

• H04B3/487 Primary

  Testing crosstalk effects · CPC title

• H04B3/46 Primary

  Monitoring; Testing · CPC title

• H04B17/0087

  using auxiliary channels or channel simulators · CPC title

• H04B17/0085

  using test signal generators · CPC title