Method of using a field-effect transistor as a current sensing device

US2016178705A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016178705-A1
Application numberUS-201514705600-A
CountryUS
Kind codeA1
Filing dateMay 6, 2015
Priority dateDec 23, 2014
Publication dateJun 23, 2016
Grant date

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  1. Title

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  2. Abstract

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  5. First independent claim

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  7. Citations and related patents

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Abstract

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An apparatus may include one or more registers configured to store a plurality of values, and an analog-to-digital converter (ADC). Each value of the plurality of values may correspond to a characteristic of a transistor at a respective temperature value. The ADC may be configured to generate a digital value corresponding to a difference in voltage levels between a first terminal and a second terminal of the transistor. The apparatus may further include a sensor configured to measure a temperature, and control logic configured to generate a first voltage level at a control terminal of the transistor and receive the digital value from the ADC. The control logic may be further configured to determine, during a first operational mode, a current passing through the transistor dependent upon the digital value, at least one value of the plurality of values, and the temperature.

First claim

Opening claim text (preview).

What is claimed is: 1 . An apparatus comprising: one or more registers configured to store a plurality of values, wherein each value of the plurality of values corresponds to a characteristic of a transistor at a respective one of a plurality of temperature values; an analog-to-digital converter (ADC) configured to generate a first digital value corresponding to a difference in voltage levels between a first terminal and a second terminal of the transistor; a sensor configured to measure a temperature; and control logic configured to: generate a control voltage level at a control terminal of the transistor; receive the first digital value from the ADC; and determine, during a first operational mode, a current passing through the transistor dependent upon the first digital value, at least one value of the plurality of values, and the temperature. 2 . The apparatus of claim 1 , wherein the control logic is further configured to: determine, during a second operational mode, that the temperature is at a higher temperature value than each of the plurality of values stored in the one or more registers; determine, during the second operational mode, a new value for the characteristic of the transistor; and replace, in the one or more registers, at least one value of the plurality of values with the new value. 3 . The apparatus of claim 1 , wherein the control logic is further configured to: determine, during a second operational mode, that the temperature is at a lower temperature value than each of the plurality of values stored in the one or more registers; determine, during the second operational mode, a new value for the characteristic of the transistor; and replace, in the one or more registers, at least one value of the plurality of values with the new value. 4 . The apparatus of claim 3 , wherein the second operational mode corresponds to a battery charging mode. 5 . The apparatus of claim 4 , wherein to determine a new value for the characteristic of the transistor, the control logic is further configured to receive a value of a charging current from a charger circuit. 6 . The apparatus of claim 1 , wherein to generate the control voltage level at the control terminal of the transistor, the control logic is further configured to enable a charge pump. 7 . The apparatus of claim 6 , wherein the charge pump is further configured to adjust the first voltage level at the control terminal of the transistor dependent upon a voltage level of an output of the charge pump. 8 . A method, comprising: generating a first voltage level at a first terminal of a transistor during a first operational mode; measuring a difference between a second voltage level of a second terminal of the transistor and a third voltage level of a third terminal of the transistor; measuring a temperature; retrieving, from one or more registers, at least one value of a plurality of values, wherein each value of the plurality of values corresponds to a characteristic of the transistor at a respective one of a plurality of temperature values; and determining a current passing through the transistor dependent upon the difference between the second voltage level and the third voltage level, the temperature, and the at least one value. 9 . The method of claim 8 , further comprising: determining, during a second operational mode, that the temperature is at a lower temperature value than each of the plurality of values stored in the one or more registers; determining, during the second operational mode, a new value for the characteristic of the transistor; and replacing, in the one or more registers, at least one value of the plurality of values with the new value. 10 . The method of claim 8 , further comprising: determining, during a second operational mode, that the temperature is at a higher temperature value than each of the plurality of values stored in the one or more registers; determining, during the second operational mode, a new value for the characteristic of the transistor; and replacing, in the one or more registers, at least one value of the plurality of values with the new value. 11 . The method of claim 10 , wherein the second operational mode corresponds to a battery charging mode. 12 . The method of claim 8 , wherein generating the first voltage level at the first terminal of the transistor further comprises enabling a charge pump. 13 . The method of claim 12 , further comprising adjusting the first voltage level dependent upon a measurement of the first voltage level. 14 . The method of claim 8 , wherein the characteristic of the transistor corresponds to a resistance between the second terminal of the transistor and the third terminal of the transistor. 15 . A system comprising: a transistor, wherein a first terminal of the transistor is coupled to a power supply unit and a second terminal of the transistor is coupled to a power supply terminal of a circuit; and a power management circuit coupled to the transistor, wherein the power management circuit is configured to: store, in one or more registers, a plurality of values wherein each value of the plurality of values corresponds to a characteristic of the transistor at a respective one of a plurality of temperature values; generate a first voltage level at a third terminal of the transistor; measure a temperature; measure a difference between a second voltage level at the first terminal and a third voltage level at the second terminal; and determine, during a first operational mode, a current flowing through the transistor dependent upon the difference, the temperature, and at least one value of the plurality of values. 16 . The system of claim 15 , wherein the power management circuit is further configured to adjust the first voltage level dependent upon a measured value of the first voltage level. 17 . The system of claim 15 , wherein the power supply unit includes at least one battery. 18 . The system of claim 15 , wherein the power management circuit is further configured to: determine, during a second operational mode, that the temperature has been determined at a lower temperature value than each of the plurality of values stored in the one or more registers; determine, during the second operational mode, a new value for the characteristic of the transistor, wherein a predetermined current passes through the transistor in the second operational mode; and replace at least one value of the plurality of values with the new value. 19 . The system of claim 15 , wherein the power management circuit is further configured to: determine, during a second operational mode, that the temperature has been determined at a higher temperature value than each of the plurality of values stored in the one or more registers; determine, during the second operational mode, a new value for the characteristic of the transistor, wherein a predetermined current passes through the transistor in the second operational mode; and replace at least one value of the plurality of values with the new value. 20 . The system of claim 15 , wherein the transistor comprises a metal-oxide semiconductor field-effect transistor.

Assignees

Inventors

Classifications

  • Battery or charger load switching, e.g. concurrent charging and load supply (H02J7/50 takes precedence) · CPC title

  • Interface arrangements · CPC title

  • with means for correcting the measurement for temperature or ageing · CPC title

  • Charging or discharging characterised by the power electronics converter · CPC title

  • using a clocked protocol · CPC title

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What does patent US2016178705A1 cover?
An apparatus may include one or more registers configured to store a plurality of values, and an analog-to-digital converter (ADC). Each value of the plurality of values may correspond to a characteristic of a transistor at a respective temperature value. The ADC may be configured to generate a digital value corresponding to a difference in voltage levels between a first terminal and a second t…
Who is the assignee on this patent?
Apple Inc
What technology area does this patent fall under?
Primary CPC classification H03K19/017509. Mapped technology areas include Electricity.
When was this patent published?
Publication date Thu Jun 23 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).