Silica for cmp, aqueous dispersion, and process for producing silica for cmp

US2016177155A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016177155-A1
Application numberUS-201414904565-A
CountryUS
Kind codeA1
Filing dateJul 10, 2014
Priority dateJul 24, 2013
Publication dateJun 23, 2016
Grant date

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  1. Title

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  2. Abstract

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Abstract

Official abstract text for this publication.

To reduce scratches during polishing while ensuring an appropriately high polishing rate, provided are a silica for CMP satisfying the following (A) to (C), an aqueous dispersion using a silica for CMP, and a method of producing a silica for CMP: (A) a BET specific surface area of 40 m 2 /g or more and 180 m 2 /g or less; (B) a particle density measured by a He-gas pycnometer method of 2.24 g/cm 3 or more; and (C) a coefficient of variation in primary particle diameter calculated by TEM/image analysis of 0.40 or less.

First claim

Opening claim text (preview).

1 . A silica for CMP, which satisfies the following (A) to (C): (A) a BET specific surface area of 40 m 2 /g or more and 180 m 2 /g or less; (B) a particle density measured by a He-gas pycnometer method of 2.24 g/cm 3 or more; and (C) a coefficient of variation in primary particle diameter calculated by TEM/image analysis of 0.40 or less. 2 . A silica for CMP according to claim 1 , wherein the silica for CMP has a fractal shape parameter αmax value within a particle diameter range of from 3 nm to 70 nm of 2.9 or more. 3 . A silica for CMP according to claim 1 , wherein the silica for CMP has a content of Fe of 0.4 ppm or less in terms of Fe 2 O 3 . 4 . A silica for CMP according to claim 1 , wherein the silica for CMP has a content of Al of 0.3 ppm or less in terms of Al 2 O 3 , a content of Ni of 0.1 ppm or less, a content of Cr of 0.1 ppm or less, a content of boron of 1.3 ppm or less, and a content of phosphorus of 0.5 ppm or less. 5 . A silica for CMP, comprising fumed silica produced by a flame hydrolysis reaction of a silane compound. 6 . An aqueous dispersion, comprising a silica for CMP satisfying the following (A) to (C): (A) a BET specific surface area of 40 m 2 /g or more and 180 m 2 /g or less; (B) a particle density measured by a He-gas pycnometer method of 2.24 g/cm 3 or more; and (C) a coefficient of variation in primary particle diameter calculated by TEM/image analysis of 0.40 or less. 7 . A method of producing a silica for CMP for producing a silica for CMP by subjecting a silane compound to hydrolysis in flame formed in a reaction vessel, the method comprising producing, under a production condition of an adiabatic flame temperature of 1,800° C. or more and a pressure in the reaction vessel of 10 kPaG or more, a silica for CMP satisfying the following (A) to (C): (A) a BET specific surface area of 40 m 2 /g or more and 180 m 2 /g or less; (B) a particle density measured by a He-gas pycnometer method of 2.24 g/cm 3 or more; and (C) a coefficient of variation in primary particle diameter calculated by TEM/image analysis of 0.40 or less. 8 . A method of producing a silica for CMP according to claim 7 , wherein the flame is formed by a multi-tube burner, wherein the silane compound is supplied to the flame by being supplied to a center tube of the multi-tube burner, and wherein a gas flow rate in the center tube of the multi-tube burner is from 50 m/sec to 100 m/sec in terms of a standard state.

Assignees

Inventors

Classifications

  • of conductive or resistive materials · CPC title

  • C09K3/1463Primary

    Aqueous liquid suspensions · CPC title

  • Abrasive particles per se (preparation of diamond C01B32/25) · CPC title

  • by oxidation or hydrolysis in the vapour phase of silicon compounds such as halides, trichlorosilane, monosilane · CPC title

  • containing abrasives or grinding agents {(abrasives as such C09K3/14; polishing of semi-conductors H10P52/40)} · CPC title

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What does patent US2016177155A1 cover?
To reduce scratches during polishing while ensuring an appropriately high polishing rate, provided are a silica for CMP satisfying the following (A) to (C), an aqueous dispersion using a silica for CMP, and a method of producing a silica for CMP: (A) a BET specific surface area of 40 m 2 /g or more and 180 m 2 /g or less; (B) a particle density measured by a He-gas pycnometer method of 2.24 g/c…
Who is the assignee on this patent?
Tokuyama Corp
What technology area does this patent fall under?
Primary CPC classification C09K3/1463. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Thu Jun 23 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).