System and method for making concentration measurements within a sample material using orbital angular momentum

Patent metadata

Field	Value
Publication number	US-2016169799-A1
Application number	US-201615049594-A
Country	US
Kind code	A1
Filing date	Feb 22, 2016
Priority date	Mar 12, 2014
Publication date	Jun 16, 2016
Grant date	—

Abstract

An apparatus that measures a concentration of a material within a sample includes signal generation circuitry that generates a first signal having at least one orthogonal function applied thereto and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and determines the concentration of the material within the sample based on a detected orthogonal function within the first signal received from the sample.

First claim

What is claimed is:

1 . An apparatus that measures a concentration of a material within a sample, comprising:
signal generation circuitry that generates a first signal having at least one orthogonal function applied thereto and applying the first signal to the sample; a detector that receives the first signal after the first signal passes through the sample and that determines the concentration of the material within the sample based on a detected orthogonal function within the first signal received from the sample.

2 . The apparatus of claim 1 , wherein the signal generation circuitry further comprises:
an emitting source that emits the first signal comprising a plurality of plane waves; orthogonal function generation circuitry that receives the first signal and that applies the at least one orthogonal function to the plane waves of the first signal.

3 . The apparatus of claim 2 , wherein the orthogonal function generation circuitry comprises a fixed orthogonal function generation circuitry that applies a fixed orthogonal function to the first signal.

4 . The apparatus of claim 2 , wherein the orthogonal function generation circuitry further includes a hologram that applies the at least one orthogonal function to the plane waves of the first signal.

5 . The apparatus of claim 4 , wherein the hologram comprise a pair of superimposed holograms comprising a composite vortex grid.

6 . The apparatus of claim 2 , wherein the orthogonal function generation circuitry comprises a tunable orthogonal function generation circuitry that applies a selected orthogonal function to the first signal responsive to at least one tuning parameter provided to the tunable orthogonal function generation circuitry.

7 . The apparatus of claim 2 , wherein the orthogonal function generation circuitry comprises:
at least one pi/2 mode converter that converts the first signal from Hermite-Gaussian modes to Laguerre-Gaussian modes; a converter that converts the first signal in the Laguerre-Gaussian modes to reversed Laguerre-Gaussian modes.

8 . The apparatus of claim 1 further including amplifying circuitry that receives the first signal after the first signal passes through the sample and that amplifies a first portion of the first signal having the detected orthogonal function associated therewith.

9 . The apparatus of claim 8 , wherein the amplifying circuitry further includes a hologram that amplifies orthogonal function associated with the concentration of the material in the sample.

10 . The apparatus of claim 1 , wherein the detector further comprises:
an orthogonal function detector that determines the detected orthogonal function within the first signal from the sample; and a processor that determines the concentration of the material within the sample responsive to the detected orthogonal function.

11 . The apparatus of claim 10 further including a user interface associated with the processor comprising:
a set of computer instructions that configures the processor to determine the concentration of the material within the sample responsive to the detected orthogonal function;
a database that stores concentration data from concentrations determined by the processor.

12 . The apparatus of claim 11 , wherein the user interface further includes a wireless interface that communicates the concentration data to a remote location.

13 . The apparatus of claim 1 , wherein differing orthogonal functions indicate different concentrations of the material within the sample.

14 . The apparatus of claim 1 , wherein the first signal comprises a light beam.

15 . An apparatus that measures a concentration of a material within a sample, comprising:
an emitting source that emits a first light beam comprising a plurality of plane waves; orthogonal function generation circuitry that receives the first light beam and that applies at least one orthogonal function to the plurality of plane waves of the first light beam; amplifying circuitry that receives the first light beam after the first light beam passes through the sample and that amplifies a first portion of the first light beam having a predetermined orthogonal function associated therewith; a detector that receives the first light beam after the first light beam passes through the sample and that determines the concentration of the material within the sample based on a detected orthogonal function within the amplified portion of the light beam having the predetermined orthogonal function associated therewith.

16 . The apparatus of claim 15 , wherein the orthogonal function generation circuitry comprises a fixed orbital angular momentum generation circuitry that applies a fixed orthogonal function to the first light beam.

17 . The apparatus of claim 15 , wherein the orthogonal function generation circuitry further includes a hologram for applying the at least one orthogonal function to the plurality of plane waves of the first light beam.

18 . The apparatus of claim 17 , wherein the hologram comprises a pair of superimposed holograms comprising a composite vortex grid.

19 . The apparatus of claim 15 , wherein the orthogonal function generation circuitry comprises a tunable orthogonal function generation circuitry that applies a selected orthogonal function to the first light beam responsive to at least one tuning parameter provided to the tunable orthogonal function generation circuitry.

20 . The apparatus of claim 15 , wherein the orthogonal function generation circuitry comprises:
at least one pi/2 mode converter for converting the first light beam from Hermite-Gaussian modes to Laguerre-Gaussian modes; a converter for converting the first light beam in the Laguerre-Gaussian modes to reversed Laguerre-Gaussian modes.

21 . The apparatus of claim 15 further comprising a processor that determines the concentration of the material within the sample responsive to the detected orthogonal function.

22 . The apparatus of claim 21 further including a user interface associated with the processor comprising:
a set of computer instructions that configures the processor to determine the concentration of the material within the sample responsive to the detected orthogonal function;
a database that stores concentration data from concentrations determined by the processor.

23 . The apparatus of claim 22 , wherein the user interface further includes a wireless interface that communicates the concentration data to a remote location.

24 . The apparatus of claim 15 , wherein differing orthogonal functions indicate different concentrations of the material within the sample.

25 . A method for measuring a concentration of a material within a sample, comprising:
generating a first signal having at least one orthogonal function applied thereto; applying the first signal to the sample; receiving the first signal after the first signal passes through the sample; detecting an orthogonal function within the received first signal; and determining the concentration of the material within the sample based on the detected orthogonal function within the first signal received from the sample.

26 . The method of claim 25 , wherein the step of generating further comprises:
emitting the first signal comprising a plurality of plane waves; receiving the first signal; and applying the at least one orthogonal function to the plane waves

Assignees

• Nxgen Partners Ip Llc

Inventors

• Ashrafi Solyman
• Linquist Roger
• Ashrafi Nima

Classifications

• G01N21/59 Primary

  Transmissivity (G01N21/25 takes precedence) · CPC title

• G01N33/483

  Physical analysis of biological material · CPC title

• G01N21/21

  Polarisation-affecting properties (G01N21/19 takes precedence) · CPC title

• G01N21/17

  Systems in which incident light is modified in accordance with the properties of the material investigated (where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63) · CPC title

• G01N33/50

  Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing (measuring or testing processes involving enzymes or microorganisms, compositions or test papers therefor; processes for forming such compositions, condition responsive control in microbiological or enzymological processes C12Q) · CPC title