Condition Monitoring Apparatus

US2016169771A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016169771-A1
Application numberUS-201314392158-A
CountryUS
Kind codeA1
Filing dateJun 24, 2013
Priority dateJun 24, 2013
Publication dateJun 16, 2016
Grant date

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

The present invention relates to a condition monitoring apparatus for monitoring a machine condition. According to the present invention, the diagnosis accuracy can be improved as reducing dependence on technical knowledge about the machine. The condition monitoring apparatus that diagnosis an abnormal state of a machine based on machine operation data acquired from a plurality of sensors. The condition monitoring apparatus includes a data collection unit configured to collect a plurality pieces of sensor data of the machine, a diagnosing unit configured to acquire a sensor data group at a predetermined time from the sensor data and a data storage unit that stores a diagnostic model that is a requirement to diagnose an abnormal state of the machine, and diagnose the abnormal state of the diagnosed machine based on the diagnostic model, a first distribution creation unit configured to create first distribution that is data frequency of each sensor based on the sensor data group aggregated with the total number of bins or a width which is previously set according to the machine performance, a second distribution creation unit configured to extract sensor data from the sensor data group at a time when the diagnosing unit diagnoses the abnormal state and create second distribution that is frequency of extracted data of each sensor aggregated with the total number of bins or width which is same as that of the first distribution, a display unit configured to display, on a screen, the first distribution and the second distribution of each sensor, an input unit to which a user inputs a new diagnostic model, and an update unit configured to write the new diagnostic model to the data storage unit.

First claim

Opening claim text (preview).

1 . A condition monitoring apparatus that diagnoses an abnormal state of a machine based on operation data of the machine acquired via a plurality of sensors, the condition monitoring apparatus comprising: a data collection unit configured to collect data from the plurality of sensor data of the machine; a diagnosing unit configured to acquire a sensor data group from the sensor data and a diagnostic model from a data storage unit that stores a diagnostic model that is a requirement to diagnose an abnormal state of the machine, and diagnose the abnormal state of the diagnosed machine based on the diagnostic model; a first distribution creation unit configured to create first distribution that is data frequency of each sensor based on the sensor data group aggregated with the total number of bins or a width which is previously set according to the machine performance; a second distribution creation unit configured to extract sensor data from the sensor data group at a time when the diagnosing unit diagnoses the abnormal state and create second distribution that is frequency of extracted data of each sensor aggregated with the total number of bins or width which is same as that of the first distribution; a display unit configured to display, on a screen, the first distribution and the second distribution of each sensor; an input unit to which a user inputs a new diagnostic model; and an update unit configured to write the new diagnostic model to the data storage unit. 2 . The condition monitoring apparatus according to claim 1 , wherein the diagnostic model includes a sensor group used to diagnoses, an diagnostic algorithm to be used, a condition division requirement including sensor data for extracting a condition of the diagnostic target machine and a threshold value requirement of the sensor data, and a determination requirement that is a threshold value as an index to express an abnormal state level calculated by the diagnostic algorithm. 3 . The condition monitoring apparatus according to claim 2 , further comprising a preprocessing unit for display configured to calculate a degree of difference between the first distribution and the second distribution for each sensor and set priority orders of the sensors in descending order of the degree of difference, wherein the display unit displays sensor names or the first distribution and the second distribution in order of the priority. 4 . The condition monitoring apparatus according to claim 3 , wherein The preprocessing unit for display calculates a difference between the first distribution and the second distribution of each bin and calculates accumulated error rates in ascending order or descending order of the value corresponding to the bin, and the display unit displays the accumulated error rates with the first distribution and the second distribution. 5 . The condition monitoring apparatus according to claim 3 , wherein the preprocessing unit for display calculates a difference between the first distribution and the second distribution of each bin, calculates accumulated error rates in ascending order or descending order of the value corresponding to the bin, compares the accumulated error rates with a requirement which is previously set according to sensor performance, sets the condition division requirement of the new diagnostic model based on the value corresponding to the bin corresponding to the requirement, and displays, on the display unit, the condition division requirement. 6 . The condition monitoring apparatus according to claim 5 , wherein the display unit displays the time-series data of the sensors and highlights a part corresponding to the condition division requirement calculated by the preprocessing unit for display. 7 . The condition monitoring apparatus according to claim 5 , wherein the display unit displays a diagnosis by the diagnosing unit where the condition division requirement calculated by the preprocessing unit for display is applied as the new diagnostic model. 8 . The condition monitoring apparatus according to claim 2 , wherein the display unit displays time-series data of the sensors and highlights a part corresponding to the condition division requirement of the new diagnostic model which is input by the input unit. 9 . The condition monitoring apparatus according to claim 2 , wherein the display unit displays the diagnosis by the diagnosing unit where the new diagnostic model input by the input unit is applied.

Assignees

Inventors

Classifications

  • G01M99/005Primary

    Testing of complete machines, e.g. washing-machines or mobile phones (testing of machine parts G01M13/00; testing of electric apparatus or components G01R31/50) · CPC title

  • Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL] (preventive maintenance, i.e. planning maintenance according to the available resources without monitoring the system G06Q10/06) · CPC title

  • Testing gas-turbine engines or jet-propulsion engines · CPC title

  • model based detection method, e.g. first-principles knowledge model · CPC title

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What does patent US2016169771A1 cover?
The present invention relates to a condition monitoring apparatus for monitoring a machine condition. According to the present invention, the diagnosis accuracy can be improved as reducing dependence on technical knowledge about the machine. The condition monitoring apparatus that diagnosis an abnormal state of a machine based on machine operation data acquired from a plurality of sensors. The …
Who is the assignee on this patent?
Hitachi Ltd
What technology area does this patent fall under?
Primary CPC classification G01M99/005. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Jun 16 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).