Terahertz Wave Measuring Device, Measuring Method, and Measuring Rig

Patent metadata

Field	Value
Publication number	US-2016169735-A1
Application number	US-201514965972-A
Country	US
Kind code	A1
Filing date	Dec 11, 2015
Priority date	Dec 16, 2014
Publication date	Jun 16, 2016
Grant date	—

Abstract

There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.

First claim

What is claimed is:

1 . A terahertz wave measuring device comprising:
a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size; a structural body through which the terahertz wave is transmitted; and a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.

2 . The terahertz wave measuring device of claim 1 , wherein the predetermined size of the beam diameter of the excitation light is shorter than the width of the sample holder.

3 . The terahertz wave measuring device of claim 1 , further comprising:
a moving section that moves a light path of the excitation light, or moves the structural body, such that an incident position of the excitation light is moved in one dimension or in two dimensions with respect to the terahertz wave generation element, wherein the detector detects the intensity of the terahertz wave according to the incident position of the excitation light with respect to the terahertz wave generation element.

4 . The terahertz wave measuring device of claim 1 , wherein the terahertz wave generation element is a non-linear optical crystal that achieves phase matching in difference frequency generation.

5 . The terahertz wave measuring device of claim 4 , wherein the non-linear optical crystal is an organic non-linear optical crystal that is a DAST crystal, a DASC crystal, or an OH1 crystal.

6 . A terahertz wave measuring method comprising:
condensing excitation light including light of a plurality of different wavelength components so as to have a beam diameter of a predetermined size; having the condensed excitation light be incident to a terahertz wave generation element so as to generate a terahertz wave by difference frequency generation based on the condensed excitation light; transmitting the terahertz wave through a structural body that includes a sample holder of a predetermined width that holds a sample, the structural body being in close contact with or being joined to the terahertz wave generation element; and detecting an intensity of the terahertz wave that has been transmitted through the structural body.

7 . The terahertz wave measurement method of claim 6 , further comprising:
comparing an intensity of the terahertz wave detected for a sample to be measured against an intensity of the terahertz wave detected in advance for a known sample of known concentration; and measuring the concentration of the sample to be measured.

8 . The terahertz wave measurement method of claim 6 , further comprising:
comparing an intensity of the terahertz wave detected for a sample to be measured against respective intensities of terahertz waves detected in advance for known samples; and identifying the sample to be measured.

9 . A terahertz wave measuring rig comprising:
a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light, including light of a plurality of different wavelength components that is condensed so as to have a beam diameter of a predetermined size, being incident to the terahertz wave generation element; and a structural body through which the terahertz wave is transmitted, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.

Assignees

• Arkray Inc

Inventors

• Uchida Hirohisa

Classifications

• G01N2021/058

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• G01N21/03 Primary

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