Dither mask generation method and device

US2016167376A1 · US · A1

Patent metadata
FieldValue
Publication numberUS-2016167376-A1
Application numberUS-201514958376-A
CountryUS
Kind codeA1
Filing dateDec 3, 2015
Priority dateDec 10, 2014
Publication dateJun 16, 2016
Grant date

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Abstract

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The dither mask generation method includes: a nozzle ejection rate determination process of determining a nozzle ejection rate of each nozzle in a recording head; a corresponding nozzle specifying process of specifying the nozzle corresponding to individual pixels of a dither mask by making at least one nozzle in charge of recording at each pixel position correspond to the individual pixels of the dither mask; a nozzle ejection rate reflecting processing process of performing processing of reflecting the nozzle ejection rate on an evaluation index when individual thresholds of the dither mask are set; and a threshold setting process of setting the thresholds to the individual pixels of the dither mask on the basis of the evaluation index.

First claim

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What is claimed is: 1 . A dither mask generation method that generates a dither mask used in halftone processing, the method comprising: a nozzle ejection rate determination process of determining a nozzle ejection rate of each nozzle, that is information indicating a ratio of recording pixels for which each nozzle ejects ink to record a dot, in recording attending pixels allocated to each nozzle as pixels for which each of a plurality of nozzles in a recording head having the plurality of nozzles that eject ink is in charge of recording; a corresponding nozzle specifying process of specifying the nozzle corresponding to the individual pixels of the dither mask by making at least one nozzle in charge of recording at each pixel position correspond to the individual pixels of the dither mask; a nozzle ejection rate reflecting processing process of performing processing of reflecting the nozzle ejection rate on an evaluation index when individual thresholds of the dither mask are set; and a threshold setting process of setting the thresholds to the individual pixels of the dither mask on the basis of the evaluation index. 2 . The dither mask generation method according to claim 1 , comprising a gradation conversion process of converting gradation values of the individual pixels, reflecting the nozzle ejection rates of the nozzles corresponding to the individual pixels, which are specified by the corresponding nozzle specifying process, on the gradation values of the individual pixels in an input value uniform image, wherein an input image reflecting the nozzle ejection rate is generated by the gradation conversion process. 3 . The dither mask generation method according to claim 2 , comprising a correction process of correcting the nozzle ejection rate, wherein in the correction process, a correction is performed to the value of the nozzle ejection rate that makes an average gradation value per unit area be invariable before and after reflecting the nozzle ejection rate in the gradation conversion process. 4 . The dither mask generation method according to claim 2 , comprising a first low-pass filter processing process of generating a second image by convoluting a first low-pass filter to a first image that is an input image reflecting the nozzle ejection rate, generated by the gradation conversion process. 5 . The dither mask generation method according to claim 4 , wherein the first low-pass filter is a filter of a function indicating a human visual characteristic, or a filter of a Gaussian function. 6 . The dither mask generation method according to claim 4 , comprising: a first dot arrangement generation process of generating a first dot arrangement corresponding to the first image; and a second low-pass filter processing process of generating a third image by convoluting a second low-pass filter to the first dot arrangement. 7 . The dither mask generation method according to claim 6 , wherein the second low-pass filter is a filter of a function indicating a human visual characteristic, or a filter of a Gaussian function. 8 . The dither mask generation method according to claim 6 , comprising: a process of temporarily setting a target pixel to threshold non-set pixels to which the threshold is not set among the pixels of the dither mask, and temporarily placing or temporarily removing a dot for the target pixel in the first dot arrangement; and a process of temporarily correcting the third image accompanying the temporary placement or temporary removal of the dot, wherein an error between the second image and the third image is calculated as the evaluation index. 9 . The dither mask generation method according to claim 6 , comprising: a fourth image generation process of generating a fourth image indicating a difference between the second image and the third image; and the threshold setting process of determining the pixels that improve uniformity of a gradation distribution of the fourth image in the case of correcting the third image and the fourth image accompanying execution of dot installation or removal, among the individual pixels in the first dot arrangement corresponding to the individual pixels by comparing values of the individual pixels of the fourth image, and setting the thresholds to the determined pixels. 10 . The dither mask generation method according to claim 9 , wherein, in the fourth image generation process, the fourth image indicating a difference between the second image and the third image by subtraction of pixel values of the pixels corresponding to each other between the images of the second image and the third image is generated. 11 . The dither mask generation method according to claim 9 , wherein, in the fourth image generation process, the fourth image indicating a ratio between the second image and the third image by division of pixel values of the pixels corresponding to each other between the images of the second image and the third image is generated. 12 . The dither mask generation method according to claim 1 , wherein the plurality of nozzles corresponding to the individual pixels of the dither mask are present. 13 . The dither mask generation method according to claim 1 , wherein the recording head has a nozzle array formed by arraying the nozzles in a sub scanning direction that is parallel to a conveying direction of a recording medium, and is a serial type recording head that records an image on the recording medium while moving in a main scanning direction that is a width direction of the recording medium which intersects with the sub scanning direction. 14 . The dither mask generation method according to claim 13 , wherein, in the nozzle ejection rate determination process, the nozzle ejection rate of the nozzle arranged at an end of the nozzle array is made lower than the nozzle ejection rate of the nozzle arranged at a center part of the nozzle array. 15 . The dither mask generation method according to claim 1 , configured such that the nozzle ejection rate of each nozzle is controlled by the dither mask, and the dither mask is position-shifted in a sub scanning direction and arranged, to image data, when the dither mask is applied to the image data, in the halftone processing, wherein, in the case that m is an integer equal to or larger than 2 and p is an integer equal to or larger than 1 and is smaller than m, a size in the sub scanning direction of the dither mask is m, and a shift amount in the sub scanning direction of the dither mask is p, and wherein p and m−p are different from a nozzle pitch in the sub scanning direction and a divisor of the nozzle pitch. 16 . A dither mask generation device that generates a dither mask used in halftone processing, the device comprising: a nozzle ejection rate determination unit that determines a nozzle ejection rate of each nozzle, that is information indicating a ratio of recording pixels for which each nozzle ejects ink to record a dot, in recording attending pixels allocated to each nozzle as pixels for which each of a plurality of nozzles in a recording head having the plurality of nozzles that eject ink is in charge of recording; a corresponding nozzle specifying unit that specifies the nozzle corresponding to the individual pixels of the dither mask by making at least one nozzle in charge of recording at each pixel position correspond to the individual pixels of the dither mask; a nozzle ejection rate reflecting processing unit that performs processing of reflecting the nozzle ejection rate on an evaluation index when individual

Assignees

Inventors

Classifications

  • G06K15/107Primary

    Mask selection · CPC title

  • controlling heads of a type not covered by groups B41J2/04575 - B41J2/04585, or of an undefined type · CPC title

  • detecting presence or properties of a dot on paper · CPC title

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What does patent US2016167376A1 cover?
The dither mask generation method includes: a nozzle ejection rate determination process of determining a nozzle ejection rate of each nozzle in a recording head; a corresponding nozzle specifying process of specifying the nozzle corresponding to individual pixels of a dither mask by making at least one nozzle in charge of recording at each pixel position correspond to the individual pixels of …
Who is the assignee on this patent?
Fujifilm Corp
What technology area does this patent fall under?
Primary CPC classification G06K15/107. Mapped technology areas include Physics.
When was this patent published?
Publication date Thu Jun 16 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).