Scanning coherent diffractive imaging method and system for actinic mask inspection for euv lithography

Patent metadata

Field	Value
Publication number	US-2016154301-A1
Application number	US-201414899235-A
Country	US
Kind code	A1
Filing date	May 26, 2014
Priority date	Jun 17, 2013
Publication date	Jun 2, 2016
Grant date	—

Abstract

Reflective and scanning CDI for identifying errors in mask patterns and defects on mask blanks. Providing a set-up for scanning the mask in reflection mode with low and/or high NA. Illuminating the mask pattern with EUV light at 2 to 35°. Detecting the diffracted light beam with a position sensitive detector. Analyzing the detected intensities using ptychographic algorithms and thereby obtaining a high resolution image of the sample of arbitrary patterns. Analyzing the detected intensities for intensity variations deviating from the normal intensity distribution caused by the periodic mask pattern in order to detect defects on the mask. This novel technique may be referred to as differential CDI. For periodically structured masks, a fast inspection can be executed by steps of multiples of period, which should give the same diffraction pattern. The investigation for only the deviation from the normal diffraction pattern allows rapid identification of periodic mask pattern defects.

First claim

1 - 2 . (canceled)

3 . A method for reflective and scanning coherent diffractive imaging for identifying errors in mask patterns and defects on mask blanks, the method comprising:
a) providing a set-up for scanning a mask in reflection mode with low and high numerical aperture; b) illuminating the mask pattern with a extreme ultraviolet lithography light beam at an angle of 2 to 35°; c) detecting a diffracted light beam with a position-sensitive detector; d) analyzing intensities detected in the detecting step using ptychographic algorithms and thereby obtaining a high resolution image of the sample of arbitrary patterns; and e) analyzing the detected intensities for intensity variations deviating from a normal intensity distribution caused by a periodic mask pattern in order to detect defects on the mask.

4 . A system for differential coherent diffractive imaging for identifying errors in periodic mask patterns, comprising:
a) a ptychographic set-up for scanning the mask in reflection mode with low and/or high numerical aperture; b) an extreme ultraviolet lithography light beam for illuminating the mask pattern at an angle of between 2 and 35°; c) a position-sensitive detector for detecting a diffracted light beam; and d) means for analyzing the detected intensities using ptychographic algorithms and thereby obtaining a high resolution image of the sample of arbitrary patterns; and e) means for analyzing the detected intensities for intensity variations that deviate from a normal intensity distribution caused by the periodic mask pattern in order to detect defects on the mask.

Assignees

• Scherrer Inst Paul

Inventors

• Ekinci Yasin

Classifications

• G03F1/84 Primary

  Inspecting · CPC title

• G03F1/24

  Reflection masks; Preparation thereof · CPC title