Background Calibration of Time-Interleaved Analog-to-Digital Converters

Patent metadata

Field	Value
Publication number	US-2016149582-A1
Application number	US-201414554790-A
Country	US
Kind code	A1
Filing date	Nov 26, 2014
Priority date	Nov 26, 2014
Publication date	May 26, 2016
Grant date	—

Abstract

A robust and fast background calibration technique for correction of time-interleaved ADC offset, gain, bandwidth, and timing mismatches is proposed. The technique combines the use of a calibration signal and a reference ADC. The calibration signal enhances robustness and makes the technique independent of the input signal's statistics. The reference ADC speeds up convergence and enables the use of a small amplitude calibration signal that does not significantly reduce the input signal dynamic range. The calibration signal can be subtracted or filtered from the ADC output and is therefore invisible to the ADC user.

First claim

1 . A time interleaved analog-to-digital converter (ADC) comprising:
a reference ADC coupled to receive an analog input signal combined with a calibration signal; a plurality of sub-ADCs coupled to receive the analog input signal combined with the calibration signal, the sub-ADCs configured to sample the analog input signal combined with the calibration signal using respective sample clock signals; and a plurality of calibration circuits coupled to the reference ADC and respective ones of the sub-ADCs, each of the calibration circuits being configured to determine respective timing errors between the reference ADC and the sub-ADCs and to provide respective timing mismatch estimates; and wherein each of the calibration circuits are further configured to adjust a gain of an associated sub-ADC to match a gain of the reference ADC.

2 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 further comprising a plurality of clock deskew circuits for respective sub-ADCs, coupled to receive respective ones of the timing mismatch estimates to adjust a sampling timing of the respective sub-ADCs in the analog domain to match timing of the reference ADC.

3 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 wherein the determined timing errors reflect clock skew between a reference ADC sample clock used to sample the analog input signal combined with the calibration signal and respective sub-ADC sample clocks.

4 . (canceled)

5 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 wherein the calibration circuits are further configured-to correct DC offset errors between the reference ADC and the respective sub-ADCs.

6 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 further comprising for each of the sub-ADCs:
an DC offset control loop to reduce offset error between a sub-ADC and the reference ADC;
a gain control loop to reduce gain error between the sub-ADC and the reference ADC; and
a timing control loop to reduce timing error between the sub-ADC and the reference ADC.

7 . The time interleaved analog-to-digital converter (ADC) as recited in claim 6 wherein the offset control loop, the gain control loop, and the timing control loop are controlled independently for each of the sub-ADCs.

8 . The time interleaved analog-to-digital converter (ADC) as recited in claim 6 wherein the offset control loop, the gain control loop and timing control loop are least mean squares (LMS) adaptive control loops.

9 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 wherein the calibration signal is a sine wave, a triangle wave, or a trapezoidal signal.

10 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 wherein the analog input signal has a first bandwidth of interest and a frequency of the calibration signal is below the first bandwidth.

11 . The time interleaved analog-to-digital converter (ADC) as recited in claim 1 wherein the analog input signal has a first bandwidth of interest and a frequency of the calibration signal is above the first bandwidth.

12 . A method of calibrating an interleaved analog-to-digital converter (ADC) comprising:
combining an input analog signal and a calibration signal; sampling the combined analog signal and calibration signal in a plurality of sub-ADCs using respective sample clock signals and generating sub-ADC digital signals corresponding to the sampled combined analog input signal and calibration signal; sampling the combined analog input signal and the calibration signal in a reference ADC using a reference ADC sample clock signal and generating a reference ADC digital signal; supplying the sub-ADC digital signals and the reference ADC digital signal to respective calibration circuits; determining calibration signals in the respective calibration circuits used to reduce timing error, DC offset error, and gain error between the reference ADC and respective sub-ADCs; and reducing the gain error by matching adjusting the gain of the sub-ADCs to match the gain of the reference ADC.

13 . The method as recited in claim 12 wherein determining calibration signals further comprises, for each of the respective sub-ADCs:
determining in a timing control loop a difference between a sub-ADC digital signal and the reference ADC digital signal and supplying an estimate of a timing mismatch signal based on the difference to an analog deskew circuit to reduce timing error between the sub-ADC and the reference ADC.

14 . The method as recited in claim 13 further comprising:
chopping the difference between the sub-ADC digital signal and the reference ADC digital signal;
multiplying the chopped difference with a gain constant;
accumulating the multiplied chopped difference and supplying an accumulator output, and
supplying the accumulated output signal as the estimate of the timing mismatch signal to adjust the analog deskew circuit.

15 . The method as recited in claim 13 further comprising for each of the respective sub-ADCs:
determining an offset mismatch estimate based on the difference between the sub-ADC digital signal and the reference ADC digital signal in an offset control loop and subtracting the offset mismatch estimate in determining the sub-ADC digital signal.

16 . The method as recited in claim 15 further comprising for each of the respective sub-ADCs in a gain control loop:
comparing output signal power of the reference ADC to output signal power of the sub-ADC to determine a gain error;
generating a gain mismatch estimate based on the gain error; and
adjusting a variable gain circuit based on the gain mismatch estimate to match the gain of each sub-ADC to the gain of the reference ADC.

17 . The method as recited in claim 16 further controlling the offset control loop, the gain control loop, and the timing control loop independently.

18 . The method as recited in claim 12 further comprising supplying as the calibration signal a sine wave, a triangle wave, or a trapezoidal wave.

19 . The method as recited in claim 12 wherein the analog signal has a first bandwidth and a frequency of the calibration signal is above or below the first bandwidth.

20 . The method as recited in claim 12 wherein a frequency of the calibration signal is (0.5K/(M+1))fs, where K is a positive odd integer, M is a number of sub-ADCs and is odd, and fs is a sampling frequency of the interleaved ADC.

21 . The method as recited in claim 12 wherein a frequency of the calibration signal is (K/(M+1))fs, where K is a positive integer, M is a number of sub-ADCs, and fs is a frequency of the interleaved ADC; and the method further comprising chopping the calibration signal to alternate the positive and negative edges of the calibration signal.

22 . The method as recited in claim 12 further comprising performing the calibrating as background calibration.

23 . The method as recited in claim 12 further comprising:
removing an estimate of the calibration signal from a digital signal of the interleaved ADC.

24 . A time interleaved analog-to-digital converter (ADC) comprising:
a reference ADC coupled to receive an analog input signal combined with a calibration signal and sample the combined analog input signal and calibration signal using a reference clock signal and supply a reference digital signal; a sub-ADC coupled to receive the analo

Assignees

• Silicon Lab Inc

Inventors

• Ragab Kareem A
• Khoury John

Classifications

• H03M1/1023 Primary

  Offset correction (H03M1/1019 takes precedence; removal of offset already present on the analogue input signal H03M1/1295) · CPC title

• H03M1/124

  Sampling or signal conditioning arrangements specially adapted for A/D converters · CPC title

• H03M1/121

  Interleaved, i.e. using multiple converters or converter parts for one channel · CPC title

• H03M1/0626

  by filtering · CPC title

• H03M1/1215

  using time-division multiplexing · CPC title