Radiation image acquisition device

Patent metadata

Field	Value
Publication number	US-2016103231-A1
Application number	US-201514974975-A
Country	US
Kind code	A1
Filing date	Dec 18, 2015
Priority date	Jan 25, 2011
Publication date	Apr 14, 2016
Grant date	—

Abstract

A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.

First claim

1 - 8 . (canceled)

9 . An apparatus for capturing a radiation image, the apparatus comprising:
a radiation source configured to emit radiation; a wavelength converter having an entrance plane, wherein the wavelength converter is configured to receive the radiation emitted from the radiation source through the entrance plane after the emitted radiation has been transmitted by an object, to convert the received radiation to scintillation light, and to output the scintillation light from the entrance plane; a first optical system including at least one lens, the first optical system being configured to focus on the entrance plane and to image the output scintillation light, thereby generating a first radiation image of the object; and a first image sensor configured to capture the first radiation image.

10 . The apparatus according to claim 9 ,
wherein an optical axis of the first optical system is inclined with respect to a direction normal to the entrance plane.

11 . The apparatus according to claim 9 ,
wherein an optical axis of the first optical system is perpendicular to the entrance plane.

12 . The apparatus according to claim 9 , further comprising:
a mirror configured to reflect the output scintillation light.

13 . The apparatus according to claim 9 ,
wherein the wavelength converter comprises a scintillator.

14 . The apparatus according to claim 9 , further comprising:
a second optical system including at least one lens, the second optical system being configured to focus on an opposite plane that is opposite to the entrance plane in the wavelength converter and to image scintillation light output from the opposite plane, thereby generating a second radiation image of the object; and a second image sensor configured to capture the second radiation image.

15 . The apparatus according to claim 14 ,
wherein an optical axis of the second optical system is inclined with respect to a direction normal to the opposite plane.

16 . The apparatus according to claim 14 ,
wherein an optical axis of the second optical system is perpendicular to the opposite plane.

17 . The apparatus according to claim 14 , further comprising:
a mirror configured to reflect the scintillation light from the opposite plane.

18 . The apparatus according to claim 14 , further comprising:
an image processor configured to match a size of the first radiation image and a size of the second radiation image.

19 . A method for capturing a radiation image, the method comprising:
emitting radiation from a radiation source; converting the radiation emitted from the radiation source to scintillation light after the emitted radiation has been transmitted by an object, wherein the converting is performed using a wavelength converter having an entrance plane; outputting the scintillation light from the entrance plane; imaging the output scintillation light, thereby generating a first radiation image of the object, using a first optical system that is focused on the entrance plane; and capturing the first radiation image.

20 . The method according to claim 19 ,
wherein the imaging is performed with an optical axis of the first optical system being inclined with respect to a direction normal to the entrance plane.

21 . The method according to claim 19 ,
wherein the imaging is performed with an optical axis of the first optical system being perpendicular to the entrance plane.

22 . The method according to claim 19 ,
wherein the converting is performed with the wavelength converter comprising a scintillator.

23 . The method according to claim 19 , further comprising:
outputting scintillation light from an opposite plane that is opposite to the entrance plane in the wavelength converter; imaging the output scintillation light from the opposite plane, thereby generating a second radiation image of the object, using a second optical system that is focused on the opposite plane; and capturing the second radiation image.

24 . The method according to claim 23 ,
wherein the imaging is performed with an optical axis of the second optical system being inclined with respect to a direction normal to the opposite plane.

25 . The method according to claim 23 ,
wherein the imaging is performed with an optical axis of the second optical system being perpendicular to the opposite plane.

26 . The method according to claim 23 , further comprising:
performing image processing, thereby matching a size of the radiation image and a size of the second radiation image.

Assignees

• Hamamatsu Photonics Kk

Inventors

• SUGIYAMA Mototsugu
• Suyama Toshiyasu

Classifications

• G01T1/2002 Primary

  Optical details, e.g. reflecting or diffusing layers · CPC title

• G01T1/2006

  using a combination of a scintillator and photodetector which measures the means radiation intensity · CPC title

• G01N23/04 Primary

  and forming images of the material · CPC title

• G01T1/20

  with scintillation detectors · CPC title

• G01N2223/611

  patterned objects; electronic devices · CPC title